Wang Xue-Tao, Guan Qing-Feng, Qiu Dong-Hua, Cheng Xiu-Wei, Li Yan, Peng Dong-Jin, Gu Qian-Qian. Defect microstructures in polycrystalline pure copper induced by high-current pulsed electron beam——the vacancy defect clusters and surface microporesJ. Acta Physica Sinica, 2010, 59(10): 7252-7257. DOI: 10.7498/aps.59.7252
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Citation:
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Wang Xue-Tao, Guan Qing-Feng, Qiu Dong-Hua, Cheng Xiu-Wei, Li Yan, Peng Dong-Jin, Gu Qian-Qian. Defect microstructures in polycrystalline pure copper induced by high-current pulsed electron beam——the vacancy defect clusters and surface microporesJ. Acta Physica Sinica, 2010, 59(10): 7252-7257. DOI: 10.7498/aps.59.7252
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Wang Xue-Tao, Guan Qing-Feng, Qiu Dong-Hua, Cheng Xiu-Wei, Li Yan, Peng Dong-Jin, Gu Qian-Qian. Defect microstructures in polycrystalline pure copper induced by high-current pulsed electron beam——the vacancy defect clusters and surface microporesJ. Acta Physica Sinica, 2010, 59(10): 7252-7257. DOI: 10.7498/aps.59.7252
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Citation:
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Wang Xue-Tao, Guan Qing-Feng, Qiu Dong-Hua, Cheng Xiu-Wei, Li Yan, Peng Dong-Jin, Gu Qian-Qian. Defect microstructures in polycrystalline pure copper induced by high-current pulsed electron beam——the vacancy defect clusters and surface microporesJ. Acta Physica Sinica, 2010, 59(10): 7252-7257. DOI: 10.7498/aps.59.7252
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