Search

Article

x

留言板

尊敬的读者、作者、审稿人, 关于本刊的投稿、审稿、编辑和出版的任何问题, 您可以本页添加留言。我们将尽快给您答复。谢谢您的支持!

姓名
邮箱
手机号码
标题
留言内容
验证码

Investigation of stable high-index silicon surfacesby means of LEED pattern analysis

Jiang Jin-Long Li Wen-Jie Zhou Li Zhao Ru-Guang Yang Wei-Sheng

Citation:

Investigation of stable high-index silicon surfacesby means of LEED pattern analysis

Jiang Jin-Long, Li Wen-Jie, Zhou Li, Zhao Ru-Guang, Yang Wei-Sheng
PDF
Get Citation

(PLEASE TRANSLATE TO ENGLISH

BY GOOGLE TRANSLATE IF NEEDED.)

Metrics
  • Abstract views:  9158
  • PDF Downloads:  571
  • Cited By: 0
Publishing process
  • Received Date:  13 May 2002
  • Accepted Date:  12 June 2002
  • Published Online:  03 April 2005

/

返回文章
返回
Baidu
map