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由于漏磁检测（MFL）具有操作简单、成本低廉、信号稳定等特点，已被广泛应用于铁磁材料的无损检测.在MFL领域，实现缺陷评估的关键是对漏磁信号与缺陷几何特征之间的关系进行准确描述.本文建立了一个任意方向的表面缺陷漏磁场分布的三维数学模型.首先，将表面缺陷近似为一个有限长的矩形槽来进行描述；然后，从理论上分析了不同缺陷方向下槽壁磁荷密度的变化规律；最后，通过矢量合成得到了有向缺陷的漏磁场分布.开展了仿真和实验，对缺陷在不同磁化方向下的漏磁场分布进行了分析.实验结果表明，缺陷的MFL分布与方向性密切相关.随着与磁化方向夹角增大，缺陷漏磁场水平分量亦增加，单峰性也越突出；但垂直分量却随夹角的增大而呈现双峰分布.所建模型能有效地描述缺陷的方向性对漏磁场分布影响，对优化MFL检测器设计和提高缺陷评估质量有实际指导意义.Magnetic flux leakage (MFL) has been widely applied to the nondestructive testing (NDT) of ferromagnetic materials due to its simple operation, low cost, and steady signal. Its defects are evaluated based on the relationship between MFL signal and the geometrical characteristic of defect. In this paper, a three-dimensional (3D) mathematical model is developed for the magnetic leakage field of surface-breaking defects that are arbitrarily oriented inside ferromagnetic material. Firstly, a finite-length rectangular slot is used as a simplified and convenient representation of a surface-breaking defect. Then, the magnetic charge densities of slot walls in different surface-breaking orientations are analyzed theoretically. The distribution of the magnetic leakage field can ultimately be derived by vector synthesis. Both simulations and experiments are conducted to analyze the magnetic leakage field distributions in different magnetization orientations. The results show that with increasing the angle between the defect orientation and the magnetic field, the horizontal component of the leakage magnetic field increases as demonstrated by increasing the prominence of its single peak. At the same time, however, the vertical component shows a bimodal distribution. The proposed model can effectively describe the influence of defect orientation on MFL signals, which can offer practical guidelines for optimizing MFL detectors and improving defect assessment.
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Keywords:
- magnetic flux leakage /
- magnetic dipole /
- crack /
- surface-breaking orientation
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[3] Wu J, Sun Y, Kang Y, Yang Y 2015 MAG IEEE Trans. Mechatron. 51 1
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[14] Xu Z S, Xu Y, Wang J B 2005 Quantitative Detection Principle and Application of Crack in MFL Method (Vol. 1) (Beijing:National Defend Industry Press) p124 (in Chinese)[徐章遂, 徐英, 王建斌 2005 裂纹漏磁定量检测原理与应用(上卷)(北京:国防工业 出版社) 第124页]
[15] Edwards C, Palmer S B 1986 J. Phys. D:Appl. Phys. 19 657
[16] Liu J J, Sun J J, Hu H Y, Xing X S 2005 Acta Phys. Sin. 54 2414 (in Chinese)[刘晶晶, 孙俊君, 胡海云, 邢修三 2005 54 2414]
[17] Wu D H, Liu Z L, Zhang Z Y, Xia X H 2013 J. Basic Sci. Eng. 21 1188 (in Chinese)[吴德会, 柳振凉, 张忠远, 夏晓昊 2013 应用基础与工程科学学报 21 1188]
[18] He Y Z 2013 Acta Phys. Sin. 62 084105 (in Chinese)[何永周 2013 62 084105]
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[1] Wu D H, Huang S L, Zhao W, Xin J J 2009 Acta Petrol Sin. 30 136 (in Chinese)[吴德会, 黄松岭, 赵伟, 辛君君 2009 石油学报 30 136]
[2] Zatsepin N N, Shcherbinin V E 1966 Defektoskopiya5 50
[3] Wu J, Sun Y, Kang Y, Yang Y 2015 MAG IEEE Trans. Mechatron. 51 1
[4] Wang C X, Zhang W M, Song J G, Li W C, Chen K 2007 J. Beijing Inst. Technol. 27 395 (in Chinese)[王朝霞, 张卫民, 宋金刚, 李文春, 陈克 2007 北京理工 大学学报 27 395]
[5] Wang B B, Liao C R, Han L, Xie Y S, Shi X C 2011 Chin. J. Sens. Actuat. 24 238 (in Chinese)[汪滨波, 廖昌荣, 韩亮, 谢 云山, 石祥聪 2011 传感器技术学报 24 238]
[6] Yong L, Wilson J, Gui Y T 2007 NDT & E Int. 40 357
[7] Wu B, Wang Y J, Liu X C, C F He 2015 Smart. Mater. Struct. 24 075007
[8] Liu B Y, Qi Y G 2010 J. Shenyang Univ. Technol. 32 187 (in Chinese)[刘保余, 綦耀光 2010 沈阳工业大学学报 32 187]
[9] Du Z Y, Ruan J J, Yu S F, Liu B 2007 Proc. Chin. Soc. Electr. Eng. 27 108 (in Chinese)[杜志叶, 阮江军, 余世峰, 刘兵 2007 中国电机工程学报 27 108]
[10] Zhang Y, Ye Z F, Wang C 2009 NDT & E Int. 42 369
[11] Mandache C, Clapham L 2003 J. Phys. D:Appl. 36 24
[12] Liao C R, Liao Z, Han L, Wang B B, Shi X C, Xie Y S 2012 J. Chongqing Univ. 35 76 (in Chinese)[廖昌荣, 廖峥, 韩亮, 汪滨波, 石祥聪, 谢云山 2012 重庆大学学报 35 76]
[13] Liu M Q, Xu Z S, Wang J B 2005 Chin. Mech. Eng. 16 952 (in Chinese)[刘美全, 徐章遂, 王建斌 2005 中国机械工程 16 952]
[14] Xu Z S, Xu Y, Wang J B 2005 Quantitative Detection Principle and Application of Crack in MFL Method (Vol. 1) (Beijing:National Defend Industry Press) p124 (in Chinese)[徐章遂, 徐英, 王建斌 2005 裂纹漏磁定量检测原理与应用(上卷)(北京:国防工业 出版社) 第124页]
[15] Edwards C, Palmer S B 1986 J. Phys. D:Appl. Phys. 19 657
[16] Liu J J, Sun J J, Hu H Y, Xing X S 2005 Acta Phys. Sin. 54 2414 (in Chinese)[刘晶晶, 孙俊君, 胡海云, 邢修三 2005 54 2414]
[17] Wu D H, Liu Z L, Zhang Z Y, Xia X H 2013 J. Basic Sci. Eng. 21 1188 (in Chinese)[吴德会, 柳振凉, 张忠远, 夏晓昊 2013 应用基础与工程科学学报 21 1188]
[18] He Y Z 2013 Acta Phys. Sin. 62 084105 (in Chinese)[何永周 2013 62 084105]
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