可见光域多波长叠层衍射成像的实验研究

王东; 马迎军; 刘泉; 史祎诗

doi:10.7498/aps.64.084203

摘要

运用模拟实验和光学实验研究了叠层衍射成像中波长数量和噪声对复原结果的影响. 模拟结果表明, 在多波长叠层衍射成像中, 复原质量随波长数量的增加而不断提高并最终达到一定极限. 光学实验以不同样品进行实验验证, 进一步研究了增加波长与随之引入噪声及系统复杂度间的制约关系. 研究发现, 并非波长越多成像效果越好, 而可能存在一个最优的成像条件. 利用所建实验装置, 在双波长照明条件下取得了相对最优的成像效果. 本结论对提高叠层衍射成像的质量具有现实意义.

关键词:

Abstract

We perform a series of computer simulations and optical experiments for multiple-wavelength ptychographic imaging to analyze the relationship between the imaging quality and the magnitude of wavelength. Two kinds of samples including the grating-like and the biological sample are tested. Our experimental results are highly consistent with simulations, demonstrating the feasibility and effectiveness of the multiple-wavelength ptychography. Compared with the single-wavelength ptychographic imaging, it can achieve very good imaging quality with a fast speed of iterative convergence and a high robustness to the noises in the case of multiple-wavelengh ptychography. In addition, optical experiments also reveal that with the magnitude of wavelength increasing, the complexity of the ptychographic system is grown up within increased noises and errors, which causes the imaging quality to keep no enhancement or even to get worse. For our concrete configuration in this paper, with a simple digital procedure for noise depressing, the best results may be obtained for the case of dual-wavelength. Furthermore, it implies that there is an optimized condition for multiple-wavelength ptychography. We find that it requires mainly analyzing the balance between the multiple-wavelength-benefited noise-resistance and the systematic complexity for the optimized condition, which may be really important and meaningful for the practical utilizing of multiple-wavelength ptychography.

Keywords:

作者及机构信息

1.
中国科学院长春光学精密机械与物理研究所, 长春 130033;

2.
中国科学院大学, 北京 100049;

3.
中国科学院信息工程研究所, 信息安全国家重点实验室, 北京 100093

基金项目: 国家自然科学基金(批准号: 61350014, 61307018)、中国科学院优秀博士论文启动基金、中国科学院大学校长基金、中国科学院“科教结合”教育创新项目、王宽诚教育基金会和中国科学院光电研究院“雏鹰”计划资助的课题.

Authors and contacts

1.
Changchun Institute of Optics, Fine Mechanics and Physics, Chinese Academy of Sciences, Changchun 130033, China;

2.
University of Chinese Academy of Sciences, Beijing 100049, China;

3.
State Key Laboratory of Information Security, Institute of Information Engineering, Chinese Academy of Sciences, Beijing 100093, China

Funds: Project supported by the National Natural Science Foundation of China (Grand Nos. 61350014, 61307018), the Starting Foundation for Excellent Doctoral Dissertation of Chinese Academy of Sciences, the President Foundation of University of Chinese Academy of Sciences, the Fusion Foundation of Research and Education of Chinese Academy of Sciences, the K. C. Wong Education Foundation, and the “Young Eagles” Program of Academy of Opto-Electronics, Chinese Academy of Sciences.

参考文献

[1]	Thibault P, Dierolf M, Bunk O, Menzel A, Pfeiffer F 2009 Ultramicroscopy 109 338
[2]	Rodenburg J M 2008 Adv. Imag. Electron Phys. 150 87
[3]	Rodenburg J M, Hurst A C, Cullis A G 2007 Ultramicroscopy 107 227
[4]	Humphry M J, Kraus B, Hurst A C, Maiden A M, Rodenburg J M 2012 Nat. Commun. 3 1733
[5]	Shi Y S, Li T, Wang Y L, Gao Q K, Zhang S G, Li H S 2013 Opt. Lett. 38 1425
[6]	Wang Z H, Wang Y L, Li T, Shi Y S 2014 Acta Phys. Sin. 63 164204 (in Chinese) [王治昊, 王雅丽, 李拓, 史祎诗 2014 63 164204]
[7]	Maiden A M, Humphry M J, Zhang F, Rodenburg J M 2011 J. Opt. Soc. Am. A 28 604
[8]	Gazit S, Szameit A, Eldar Y C, Segev M 2009 Opt. Express 17 23920
[9]	Rodenburg J M 1989 Ultramicroscopy 27 413
[10]	Hoppe W 1969 Acta Cryst. A 25 495
[11]	Rodenburg J M, Faulkner H M L 2004 Appl. Phys. Lett. 85 4795
[12]	Faulkner H M L, Rodenburg J M 2004 Phys. Rev. Lett. 93 023903
[13]	Maiden A M, Rodenburg J M 2009 Ultramicroscopy 109 1256
[14]	Claus D, Robinson D J, Chetwynd D G, Shuo Y, Pike W T, José J D J, Rodenburg J M 2013 J. Opt. 15 035702
[15]	Wang Y L, Shi Y S, Li T, Gao Q K, Xiao J, Zhang S G 2013 Acta Phys. Sin. 62 064206 (in Chinese) [王雅丽, 史祎诗, 李拓, 高乾坤, 肖俊, 张三国 2013 62 064206]
[16]	Pan X C, Liu C, Lin Q, Zhu J Q 2013 Opt. Express 21 6162
[17]	Shi Y S, Situ G H, Zhang J J 2008 Opt. Lett. 33 542
[18]	Gao Q K, Wang Y L, Li T, Shi Y S 2014 Appl. Opt. 53 4700

施引文献

[1]	Thibault P, Dierolf M, Bunk O, Menzel A, Pfeiffer F 2009 Ultramicroscopy 109 338
[2]	Rodenburg J M 2008 Adv. Imag. Electron Phys. 150 87
[3]	Rodenburg J M, Hurst A C, Cullis A G 2007 Ultramicroscopy 107 227
[4]	Humphry M J, Kraus B, Hurst A C, Maiden A M, Rodenburg J M 2012 Nat. Commun. 3 1733
[5]	Shi Y S, Li T, Wang Y L, Gao Q K, Zhang S G, Li H S 2013 Opt. Lett. 38 1425
[6]	Wang Z H, Wang Y L, Li T, Shi Y S 2014 Acta Phys. Sin. 63 164204 (in Chinese) [王治昊, 王雅丽, 李拓, 史祎诗 2014 63 164204]
[7]	Maiden A M, Humphry M J, Zhang F, Rodenburg J M 2011 J. Opt. Soc. Am. A 28 604
[8]	Gazit S, Szameit A, Eldar Y C, Segev M 2009 Opt. Express 17 23920
[9]	Rodenburg J M 1989 Ultramicroscopy 27 413
[10]	Hoppe W 1969 Acta Cryst. A 25 495
[11]	Rodenburg J M, Faulkner H M L 2004 Appl. Phys. Lett. 85 4795
[12]	Faulkner H M L, Rodenburg J M 2004 Phys. Rev. Lett. 93 023903
[13]	Maiden A M, Rodenburg J M 2009 Ultramicroscopy 109 1256
[14]	Claus D, Robinson D J, Chetwynd D G, Shuo Y, Pike W T, José J D J, Rodenburg J M 2013 J. Opt. 15 035702
[15]	Wang Y L, Shi Y S, Li T, Gao Q K, Xiao J, Zhang S G 2013 Acta Phys. Sin. 62 064206 (in Chinese) [王雅丽, 史祎诗, 李拓, 高乾坤, 肖俊, 张三国 2013 62 064206]
[16]	Pan X C, Liu C, Lin Q, Zhu J Q 2013 Opt. Express 21 6162
[17]	Shi Y S, Situ G H, Zhang J J 2008 Opt. Lett. 33 542
[18]	Gao Q K, Wang Y L, Li T, Shi Y S 2014 Appl. Opt. 53 4700

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