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菲涅耳波带板应用于聚变靶的高分辨X射线成像分析

王晓方 王晶宇

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菲涅耳波带板应用于聚变靶的高分辨X射线成像分析

王晓方, 王晶宇

Analysis of high-resolution X-ray imaging of an inertial-confinement-fusion target by using a Fresnel zone plate

Wang Xiao-Fang, Wang Jing-Yu
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  • 在惯性约束核聚变研究中,为了实现1μm高空间分辨keV-X射线成像,文中发展了菲涅耳波带板(FZP)直接成像的分析方法,并通过数值计算研究了FZP的成像特性.针对钛Kα线(光子能量4.51 keV,波长0.275 nm),提出了FZP参数,对制作技术的要求较低.研究了靶尺度的影响.FZP的有效视场使它能够对数毫米大尺度靶实现高分辨成像.还研究了入射光的光谱带宽对成像的影响.FZP的色差有助于单色成像,但是带宽超过限度会导致像的反衬度降低.这些结果表明FZP应用于聚变点火靶的高空间分辨X射线成像的能力,也为应用提出了要求.
    Aiming at 1μm high resolution in imaging an inertial confinement fusion (ICF) target, a method is developed for analyzing the direct imaging by a Fresnel zone plate (FZP), and numerical calculations are carried out to study the FZP imaging characteristics in thekeV X-ray range. For the Ti K α line (photon energy 4.51keV, wavelength 0.275nm), the FZP parameters are suggested, for which the technical requirement of fabricating the outmost zone is relatively low. The influence of the target size on the imaging is studied for the first time. It is shown that the FZP has a large effective field of view and the image quality can be guaranteed even for a target of several millimeters. The influence of the spectral bandwidth of a polychromatic incident light on the imaging is also studied. Monochromatic imaging can be obtained due to the achromatic property of the FZP. However, if the bandwidth is larger than a certain limit, the image contrast will be degraded. These results indicate the feasibility of applying an FZP in high-resolution X-ray imaging of an ICF ignition target and put forward the requirements as well.
    • 基金项目: 国家高技术研究发展计划 (批准号: 2008AA8041206)和中国科学院知识创新工程(批准号: KJCXZ-YW-N28, KJCX2-YW-N36)资助的课题.
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    [2]

    Xiang Z L, Yu C X 1982 High Temperature Plasma Diagnostics (vol.2) (Shanghai: Shanghai Science and Technology Press) pp206—207 (in Chinese) [项志遴、 俞昌旋 1982 高温等离子体诊断技术(下册) (上海:上海科学技术出版社) 第206—207页]

    [3]

    Marshall F J, Bennett G R 1999 Rev. Sci. Instrum. 70 617

    [4]

    Aglitskiy Y, Lehecka T, Obenschein S, Bodner S, Pawley C, Gerber K, Sethian J, Brown C M, Seely J, Feldman U, Holland G 1998 Appl. Opt. 37 5253

    [5]

    Koch J A, Aglitskiy Y, Brown C, Cowan T, Freeman R, Hatchett S, Holland G, Key M, MacKinnon A, Seely J, Snavely R, Stephens R 2003 Rev. Sci. Instrum. 74 2130

    [6]

    Chao W, Harteneck B D, Liddle J A, Anderson E H, Attwood D T 2005 Nature 435 1210

    [7]

    Tian Y C, Li W, Chen J, Liu L, Liu G, Tkachuk A, Tian J, Xiong Y, Gelb J, Hsu G, Yun W 2008 Rev. Sci. Instrum. 79 103708

    [8]

    Azechi H, Tamari Y, Shiraga H 2003 Institute of Laser Engineering Annual Reports (Osaka: Osaka University) p100

    [9]

    Dong J J, Cao L F, Chen M, Xie C Q, Du H B 2008 Acta Phys. Sin. 57 3044 (in Chinese) [董建军、 曹磊峰、 陈 铭、 谢常青、 杜华冰 2008 57 3044]

    [10]

    Stigliani D J, Mittra R, Semonin R G 1967 J. Opt. Soc. Am. 57 610

    [11]

    Kirz J 1974 J. Opt. Soc. Am. 64 301

    [12]

    DaSilva L B, Trebes J E, Mrowka S, Barbee T W, Brase J, Koch J A, London R A, MacGowan B J, Matthews D L, Minyard D, Stone G, Yorkey T, Anderson E, Attwood D T, Kern D 1992 Opt. Lett. 17 754

    [13]

    Born M, Wolf E 2001 Principles of Optics (7th edition) (Cambridge: Cambridge University Press) pp421—491

    [14]

    Henke B L, Gullikson E M, Davis J C 1993 At. Data Nucl. Data Tables 54 181

    [15]

    Chen J, Liu L H, Liu G, Tian Y C 2007 Opt. Prec. Engin. 15 1894 (in Chinese) [陈 洁、 柳龙华、 刘 刚、 田扬超 2007 光学精密工程 15 1894]

    [16]

    Attwood D (Translated by Zhang J) 2003 Soft X-Rays and Extreme Ultraviolet Radiation: Principles and Applications (Beijing: Science Press) p352 (in Chinese) [阿特伍德D. 著 张 杰译 2003软X射线与极紫外辐射的原理和应用 (北京:科学出版社)第352页]

  • [1]

    Lindl J D, Amendt P, Berger R L, Glendinning S G, Glenzer S H, Haan S W, Kauffman R L, Landen O L, Sute L J 2004 Phys. Plasmas 11 339

    [2]

    Xiang Z L, Yu C X 1982 High Temperature Plasma Diagnostics (vol.2) (Shanghai: Shanghai Science and Technology Press) pp206—207 (in Chinese) [项志遴、 俞昌旋 1982 高温等离子体诊断技术(下册) (上海:上海科学技术出版社) 第206—207页]

    [3]

    Marshall F J, Bennett G R 1999 Rev. Sci. Instrum. 70 617

    [4]

    Aglitskiy Y, Lehecka T, Obenschein S, Bodner S, Pawley C, Gerber K, Sethian J, Brown C M, Seely J, Feldman U, Holland G 1998 Appl. Opt. 37 5253

    [5]

    Koch J A, Aglitskiy Y, Brown C, Cowan T, Freeman R, Hatchett S, Holland G, Key M, MacKinnon A, Seely J, Snavely R, Stephens R 2003 Rev. Sci. Instrum. 74 2130

    [6]

    Chao W, Harteneck B D, Liddle J A, Anderson E H, Attwood D T 2005 Nature 435 1210

    [7]

    Tian Y C, Li W, Chen J, Liu L, Liu G, Tkachuk A, Tian J, Xiong Y, Gelb J, Hsu G, Yun W 2008 Rev. Sci. Instrum. 79 103708

    [8]

    Azechi H, Tamari Y, Shiraga H 2003 Institute of Laser Engineering Annual Reports (Osaka: Osaka University) p100

    [9]

    Dong J J, Cao L F, Chen M, Xie C Q, Du H B 2008 Acta Phys. Sin. 57 3044 (in Chinese) [董建军、 曹磊峰、 陈 铭、 谢常青、 杜华冰 2008 57 3044]

    [10]

    Stigliani D J, Mittra R, Semonin R G 1967 J. Opt. Soc. Am. 57 610

    [11]

    Kirz J 1974 J. Opt. Soc. Am. 64 301

    [12]

    DaSilva L B, Trebes J E, Mrowka S, Barbee T W, Brase J, Koch J A, London R A, MacGowan B J, Matthews D L, Minyard D, Stone G, Yorkey T, Anderson E, Attwood D T, Kern D 1992 Opt. Lett. 17 754

    [13]

    Born M, Wolf E 2001 Principles of Optics (7th edition) (Cambridge: Cambridge University Press) pp421—491

    [14]

    Henke B L, Gullikson E M, Davis J C 1993 At. Data Nucl. Data Tables 54 181

    [15]

    Chen J, Liu L H, Liu G, Tian Y C 2007 Opt. Prec. Engin. 15 1894 (in Chinese) [陈 洁、 柳龙华、 刘 刚、 田扬超 2007 光学精密工程 15 1894]

    [16]

    Attwood D (Translated by Zhang J) 2003 Soft X-Rays and Extreme Ultraviolet Radiation: Principles and Applications (Beijing: Science Press) p352 (in Chinese) [阿特伍德D. 著 张 杰译 2003软X射线与极紫外辐射的原理和应用 (北京:科学出版社)第352页]

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出版历程
  • 收稿日期:  2010-01-12
  • 修回日期:  2010-03-29
  • 刊出日期:  2011-01-05

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