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Erratum: Three-dimensional numerical simulation of single event upset effect based on 55 nm DICE latch unit[Acta Phys. Sin. 2024, 73(6): 066103]

Zhang Xing Liu Yu-Lin Li Gang Yan Shao-An Xiao Yong-Guang Tang Ming-Hua

Citation:

Erratum: Three-dimensional numerical simulation of single event upset effect based on 55 nm DICE latch unit[Acta Phys. Sin. 2024, 73(6): 066103]

Zhang Xing, Liu Yu-Lin, Li Gang, Yan Shao-An, Xiao Yong-Guang, Tang Ming-Hua
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  • Received Date:  01 April 2024
  • Available Online:  09 April 2024
  • Published Online:  05 April 2024

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