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Multi-spectral compatible stealth materials have become an imperative development trend, especially visible and infrared compatible stealth materials have become the most important in the field of optoelectronic stealth technology. However, infrared stealth and visible stealth have different requirements for spectral response, which makes it difficult to reconcile the design of functional coupling materials. Therefore, it is very important to develop selective control technology of optical characteristics. A visible and infrared compatible stealth superstructure thin film is proposed based on the FTO/Ag/FTO stacked film structure. A collaborative design method for high visible transmission and low infrared radiation is established, and the mechanism of microstructure characteristics affecting visible transmission and infrared reflection spectra is explained. The infrared stealth thin film with high transparency is optimized, and its compatibility stealth performance is tested and characterized by visible light transmission spectrum, infrared reflection spectrum, and thermal imaging characterization technology. It is shown that visible transmission depends on the coupling and matching effect between the semiconductor dielectric layer and the metal layer, while infrared radiation suppression mainly relies on the metal layer. As the thickness of FTO film increases, the visible transmission peak undergoes a red shift, leading the transmission spectrum curve to flatten, the average transmission first increases and then gradually decreases. As the thickness of Ag thin film layer increases, the transmission peak of visible light undergoes a blue shift, causing the transmission spectrum curve to tend to a high-frequency transmission state, narrowing the frequency domain of visible light transmission and gradually reducing the average transmittance decreases gradually. At the same time, the infrared reflectance increases with the Ag film thickness increasing, but the change of amplitude significantly decreasing when the Ag film thickness is greater than 18 nm. When the thickness of the optimized FTO/Ag/FTO film structure is 40/12/40 nm, it has a high level of background perspective reproduction and high ability to suppress high-temperature infrared radiation. The average transmittance of 0.38–0.78 μm visible light band is 82.52%, and the average reflectance of 3–14 μm mid-far infrared band is 81.46%. The radiation temperature of the sample is 49 ℃ lower in the mid infrared range and 75.8 ℃ lower in far infrared range than that of the quartz sheet at 150 ℃, respectively. The new stealth film can be attached to the camouflage coating surface of special vehicle to achieve visible and infrared compatible stealth, and can be used for cockpit windows to ensure thermal insulation, temperature control, and infrared stealth without affecting the field of view. This study can provide a new approach for designing and utilizing the visible and infrared compatible stealth materials.
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Keywords:
- multispectral compatible stealth /
- high transparency /
- infrared low radiation /
- material design
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Google Scholar
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Google Scholar
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Google Scholar
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[7] 韩超 2015 硕士学位论文 (杭州: 浙江理工大学)
Han C 2015 M. S. Thesis (Hangzhou: Zhejiang Sci-Tech University
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Google Scholar
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Wang Z J 2018 Ph. D. Dissertation (Hefei: University of Science and Technology of China
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图 1 DMD膜层结构
Figure 1. DMD film structure.
图 2 半导体介质层对可见光透射光谱的影响 (a)外层; (b)内层
Figure 2. Effect of semiconductor dielectric layer on visible transmission spectrum: (a) Outer layer; (b) inner layer.
图 3 金属层对可见光透射光谱的影响
Figure 3. Effect of metal layer on visible transmission spectrum.
图 4 膜系结构周期数对可见光透射光谱的影响
Figure 4. Effect of the cycle number of film structure on visible transmission spectrum.
图 5 金属层对红外反射光谱的影响
Figure 5. Effect of metal layer on infrared reflection spectrum.
图 6 半导体介质层对红外反射光谱的影响 (a)外层; (b)内层
Figure 6. Effect of semiconductor dielectric layer on infrared reflection spectrum: (a) Outer layer; (b) inner layer.
图 7 膜系结构周期数对红外反射光谱的影响
Figure 7. Effect of the cycle number of film structure on infrared reflection spectrum.
图 8 优化后FTO/Ag/FTO膜层结构的光谱特性 (a)可见光透射; (b)红外反射
Figure 8. Spectral characteristics of optimized FTO/Ag/FTO film structure: (a) Visible light transmission; (b) infrared reflection.
图 9 样件的光学特性 (a)实物透光效果; (b)可见光透射光谱; (c)红外反射光谱
Figure 9. Optical characteristics of sample: (a) Physical transparency effect; (b) visible transmission spectrum; (c) infrared reflectance spectrum.
图 10 FTO/Ag/FTO复合薄膜在不同环境温度下的3—5 μm中红外热像图 (a) 24 ℃; (b) 50 ℃; (c) 90 ℃; (d) 110 ℃; (e) 130 ℃; (f) 150 ℃
Figure 10. 3–5 μm mid-infrared thermal image of FTO/Ag/FTO composite films at different environmental temperatures: (a) 24 ℃; (b) 50 ℃; (c) 90 ℃; (d) 110 ℃; (e) 130 ℃; (f) 150 ℃.
图 11 FTO/Ag/FTO复合薄膜在不同环境温度下的8—14 μm远红外热像图 (a) 24 ℃; (b) 50 ℃; (c) 90 ℃; (d) 110 ℃; (e) 130 ℃; (f) 150 ℃
Figure 11. 8–14 μm far-infrared thermal image of FTO/Ag/FTO composite films at different environmental temperatures: (a) 24 ℃; (b) 50 ℃; (c) 90 ℃; (d) 110 ℃; (e) 130 ℃; (f) 150 ℃.
图 12 样件在中远红外的辐射温度变化
Figure 12. Radiation temperature changes of the sample in the mid-far infrared band.
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[1] 王浩, 姚能智, 王斌, 王学生 2022 71 134703
Google Scholar
Wang H, Yao Ne Z, Wang B, Wang X S 2022 Acta Phys. Sin. 71 134703
Google Scholar
[2] Zhu R C, Wang J F, Xu C L, Feng M D, Sui S, Wang J, Qiu T S, Zhang L, Jia Y X, Zhang Z T, Qu S B 2020 Infrared Phys. Techn. 111 103546
Google Scholar
[3] Huang S N, Fan Q, Xu C L, Wang B K, Wang J F, Yang B Y, Tian C H, Meng Z 2020 Infrared Phys. Techn. 111 103524
Google Scholar
[4] Zhong S M, Wu L J, Liu T J, Huang J F, Jiang W, Ma, Y G 2018 Opt. Express 26 16466
Google Scholar
[5] Ren Z Y, Chen L P, Liu X M, Li G J, Wang K, Wang Q 2020 Infrared Phys. Techn. 111 103472
Google Scholar
[6] 刘凯 2016 硕士学位论文 (南京: 南京航空航天大学)
Liu K 2016 M. S. Thesis (Nanjing: Nanjing University of Aeronautics and Astronautics
[7] 韩超 2015 硕士学位论文 (杭州: 浙江理工大学)
Han C 2015 M. S. Thesis (Hangzhou: Zhejiang Sci-Tech University
[8] 王自荣, 余大斌, 孙晓泉 2000 上海航天 17 24
Google Scholar
Wang Z R, Yu D B, Sun X Q 2000 Aerospace Shanghai 17 24
Google Scholar
[9] 冯奎胜, 李娜, 李桐 2022 71 034101
Google Scholar
Feng K S, Li N, Li T 2022 Acta Phys. Sin. 71 034101
Google Scholar
[10] Liu B, Chen Z S, Li Z G, Shi J M, Wang H 2020 Opt. Eng. 59 127107
Google Scholar
[11] Shim H B, Han K, Song J, Hahn J W 2022 Adv. Opt. Mater. 6 10
Google Scholar
[12] 陈天航, 郑斌, 钱超, 陈红胜 2020 69 154104
Google Scholar
Chen T H, Zheng B, Qian C, Chen H S 2020 Acta Phys. Sin. 69 154104
Google Scholar
[13] Zhao Y C, Fang F 2021 ACS Appl. Electron. Mater. 3 2694
Google Scholar
[14] Qi D, Chen F, Wang X, Luo H, Cheng Y Z, Niu X Y, Gong R Z 2018 Opt. Lett. 43 5323
Google Scholar
[15] Xiong Y, Chen F, Cheng Y Z, Luo H 2022 J. Alloy Compd. 920 166008
Google Scholar
[16] Xiong Y, Chen F, Cheng Y Z, Luo H 2022 Opt. Mater. 132 112745
Google Scholar
[17] 黎思睿, 李佳, 刘科, 黄奕嘉, 李玲, 周晓林 2021 四川大学学报 6 115
Google Scholar
Li S R, Li J, Liu K, Huang Y J, Li L, Zhou X L 2021 J. Sichuan Univ. 6 115
Google Scholar
[18] 牛帅, 杨昌, 常慧聪, 肖林, 郭楠, 曲彦臣, 李国华 2022 红外与毫米波学报 41 745
Google Scholar
Niu S, Yang C, Chang H C, Xiao L, Guo N, Qu Y C, Li G H 2022 J. Infrared Millim. W. 41 745
Google Scholar
[19] 朱桓正 2021 博士学位论文 (杭州: 浙江大学)
Zhu H Z 2021 Ph. D. Dissertation (Hangzhou: Zhejiang University
[20] Leftheriotis G, Yianoulis P, Patrikios D 1997 Thin Solid Films 306 92
Google Scholar
[21] Leng J, Yu Z N, Xue W, Zhang T, Jiang Y R, Zhang J, Zhang D P 2010 J. Appl. Phys. 108 073109
Google Scholar
[22] Wu C C, Chen P S, Peng C H, Wang C C 2013 J. Mater. Sci-Mater. El. 24 2461
Google Scholar
[23] Daeil K 2010 Appl. Surf. Sci. 257 704
Google Scholar
[24] Liu X J, Cai X, Qiao J S, Mao J F, Jiang N 2003 Thin Solid Films 441 200
Google Scholar
[25] Wang L, Wang W H, Wang L Y, Liu G, Ge C Q, Yang N J, Li P 2022 J. Opt. 51 874
Google Scholar
[26] 王子君 2018 博士学位论文 (合肥: 中国科学技术大学)
Wang Z J 2018 Ph. D. Dissertation (Hefei: University of Science and Technology of China
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