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Polycrystalline cesium iodide (CsI) thin films were prepared on glass substrates by thermal evaporation. The Influences of air exposure on the structure, resistivity and infrared transmittance of CsI film were investigated by scanning electron microscopy, X-ray diffraction (XRD), high resistance meter and infrared spectrophotometer (IR). It is found that the coalescence of grains occurs and the average grain size increases from 0.36 μm to 1.25 μm. The mechanism of grain growth is attributed to the diffusion of water molecules along grain boundaries and the migration of grain boundaries driven by minimization of total free energy. XRD results indicate the formation of (110/220) texture when exposed to ambient air and the relaxation of tensile stress during recrystallization. The average crystallite sizes obtained from Debye-Scherrer's formula are 25.6 nm, 28.4 nm and 45.1 nm respectively. The resistivity of the film decreases from the order of 1010 Ω·cm to 108 Ω· cm. The IR absorption bands in the ranges of 3675-3750 cm-1 and 3560-3640 cm-1 closely resemble that of free water rather than liquid water. The observed split bands are assigned to the non-hydrogen-bonded OH associated with ion-dipole bonds and dangling OH at air-water interface respectively.
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Keywords:
- CsI films /
- grain boundary diffusion /
- structural analysis /
- IR vibration
[1] Breskin A 1996 Nucl. Instrum. Methods Phys. Res. Sect. A 371 116
[2] Zeng P, Yuan Z, Deng B, Yuan Y T, Li Z C, Liu S Y, Zhao Y D, Hong C H, Zheng L, Cui M Q 2012 Acta Phys. Sin. 61 155209 (in Chinese) [曾鹏, 袁铮, 邓博, 袁永腾, 李志超, 刘慎业, 赵屹东, 洪才浩, 郑雷, 崔明启 2012 61 155209]
[3] Hu H J, Zhao B S, Sheng L Z, Yan Q R 2011 Acta Phys. Sin. 60 029701 (in Chinese) [胡慧君, 赵宝升, 盛立志, 鄢秋荣 2011 60 029701]
[4] Hu X, Jiang S E, Cui Y L, Huang Y X, Ding Y K, Liu Z L, Yi R Q, Li C G, Zhang J H, Zhang Q H 2007 Acta Phys. Sin. 56 1447 (in Chinese) [胡昕, 江少恩, 崔延莉, 黄翼翔, 丁永坤, 刘忠礼, 易荣清, 李朝光, 张景和, 张华全 2007 56 1447]
[5] Li M, Ni Q L, Chen B 2009 Acta Phys. Sin. 58 6894 (in Chinese) [李敏, 尼启良, 陈波 2009 58 6894]
[6] Molnar L 2008 Nucl. Instrum. Methods Phys. Res. Sect. A 595 27
[7] Halvorson C, Houck T, Macphee A, Opachich Y P, Lahowe D, Copsey B 2010 Rev. Sci. Instrum. 81 10E309
[8] Feng J, Shin H J, Nasiatka J R, Wan W, Young A T, Huang G, Comin A, Byrd J, Padmore H A 2007 Appl. Phys. Lett. 91 134102
[9] Xie Y G, Zhang A W, Liu Y B, Liu H B, Hu T, Zhou L, Cai X, Fang J, Yu B X, Ge Y S, L Q W, Sun X L, Sun L J, Xue Z, Xie Y G, Zheng Y H, L J G 2012 Nucl. Instrum. Methods Phys. Res. Sect. A 689 79
[10] Nitti M A, Cioffi N, Nappi E, Singh B K, Valentini A 2002 Nucl. Instrum. Methods Phys. Res. Sect. A 493 16
[11] Triloki, Dutta B, Singh B K 2012 Nucl. Instrum. Methods Phys. Res. Sect. A 695 279
[12] Nitti M A, Senesi G S, Liotino A, Nappi E, Valentini A, Singh B K 2004 Nucl. Instrum. Methods Phys. Res. Sect. A 523 323
[13] Hoedlmoser H, Braem A, de Cataldo G, Davenport M, Di Mauro A, Franco A, Gallas A, Martinengo P, Nappi E, Piuz F, Schyns E 2007 Nucl. Instrum. Methods Phys. Res. Sect. A 574 28
[14] Razin V I, Gotovcev Y N, Kurepin A B, Reshetin A I 1998 Nucl. Instrum. Methods Phys. Res. Sect. A 419 621
[15] Boutboul T, Breskin A, Chechik R, Klein E, Braem A, Lion G, Miné P 1999 Nucl. Instrum. Methods Phys. Res. Sect. A 438 409
[16] Nitti M A, Nappi E, Valentini A, Bénédic F, Bruno P, Cicala G 2005 Nucl. Instrum. Methods Phys. Res. Sect. A 553 157
[17] Almeida J, Braem A, Breskin A, Buzulutskov A, Chechik R, Cohen S, Coluzza C, Conforto E, Margaritondo G, Nappi E, Paic G, Piuz F, Dell'Orto T, Scognetti T, Sgobba S, Tonner B P 1995 Nucl. Instrum. Methods Phys. Res. Sect. A 367 337
[18] Singh B K, Nitti M A, Valentini A, Nappi E, Coluzza C, Di Santo G, Zanoni R 2007 Nucl. Instrum. Methods Phys. Res. Sect. A 581 651
[19] Xie X W, Guo M l 1999 Fundamentals of Materials Science (Beijing: Beihang University Press) p134 (in Chinese) [谢希文, 过梅丽 1999 材料科学基础 (北京: 北京航空航天大学出版社) 第134页]
[20] Hui Z Z, Wang E X, Wan L X 1993 Physics of Surfaces and Interfaces (Chengdu: University of Electronic Science and Technology of China Press) p66 (in Chinese) [恽正中, 王恩信, 完利祥 1993 表面与界面物理 (成都: 电子科技大学出版社) 第66页]
[21] Cui G W 1990 Defect, Diffsion and Sintering (Beijing: Tsinghua University Press) p156 (in Chinese) [崔国文 1990 缺陷, 扩散与烧结 (北京: 清华大学出版社) 第156页]
[22] Lu B, Laughlin D E 2001 The Physics of Ultrahigh-Density Magnetic Recording Chapter 2: Microstructure of Longitudinal Media (Berlin: Springer-Verlag) p12
[23] Zhang L D, Mu J M 2001 Nanomaterials and Nanostucture (Beijing: Sicence Press) p148 (in Chinese) [张立德 牟季美 2001 纳米材料和纳米结构 (北京: 科学出版社) 第148页]
[24] Klug H P, Alexander L E 1974 X-ray Diffraction Procedures: For Polycrystalline and Amorphous Materials (New York: John Wiley & Sons) p662, 656
[25] Garg P, Rai R, Singh B K 2014 Nucl. Instrum. Methods Phys. Res. Sect. A 736 128
[26] Nix W D, Clemens B M 1999 J. Mater. Res. 14 3467
[27] Foster M C, Ewing G E 2000 J. Chem. Phys. 112 6817
[28] Smart R S C, Sheppard N 1976 J. Chem. Soc. Faraday Trans. 2: Molecular and Chhemical Physics 72 707
[29] Peters S J, Ewing G E 1997 J. Phys. Chem. B 101 10880
-
[1] Breskin A 1996 Nucl. Instrum. Methods Phys. Res. Sect. A 371 116
[2] Zeng P, Yuan Z, Deng B, Yuan Y T, Li Z C, Liu S Y, Zhao Y D, Hong C H, Zheng L, Cui M Q 2012 Acta Phys. Sin. 61 155209 (in Chinese) [曾鹏, 袁铮, 邓博, 袁永腾, 李志超, 刘慎业, 赵屹东, 洪才浩, 郑雷, 崔明启 2012 61 155209]
[3] Hu H J, Zhao B S, Sheng L Z, Yan Q R 2011 Acta Phys. Sin. 60 029701 (in Chinese) [胡慧君, 赵宝升, 盛立志, 鄢秋荣 2011 60 029701]
[4] Hu X, Jiang S E, Cui Y L, Huang Y X, Ding Y K, Liu Z L, Yi R Q, Li C G, Zhang J H, Zhang Q H 2007 Acta Phys. Sin. 56 1447 (in Chinese) [胡昕, 江少恩, 崔延莉, 黄翼翔, 丁永坤, 刘忠礼, 易荣清, 李朝光, 张景和, 张华全 2007 56 1447]
[5] Li M, Ni Q L, Chen B 2009 Acta Phys. Sin. 58 6894 (in Chinese) [李敏, 尼启良, 陈波 2009 58 6894]
[6] Molnar L 2008 Nucl. Instrum. Methods Phys. Res. Sect. A 595 27
[7] Halvorson C, Houck T, Macphee A, Opachich Y P, Lahowe D, Copsey B 2010 Rev. Sci. Instrum. 81 10E309
[8] Feng J, Shin H J, Nasiatka J R, Wan W, Young A T, Huang G, Comin A, Byrd J, Padmore H A 2007 Appl. Phys. Lett. 91 134102
[9] Xie Y G, Zhang A W, Liu Y B, Liu H B, Hu T, Zhou L, Cai X, Fang J, Yu B X, Ge Y S, L Q W, Sun X L, Sun L J, Xue Z, Xie Y G, Zheng Y H, L J G 2012 Nucl. Instrum. Methods Phys. Res. Sect. A 689 79
[10] Nitti M A, Cioffi N, Nappi E, Singh B K, Valentini A 2002 Nucl. Instrum. Methods Phys. Res. Sect. A 493 16
[11] Triloki, Dutta B, Singh B K 2012 Nucl. Instrum. Methods Phys. Res. Sect. A 695 279
[12] Nitti M A, Senesi G S, Liotino A, Nappi E, Valentini A, Singh B K 2004 Nucl. Instrum. Methods Phys. Res. Sect. A 523 323
[13] Hoedlmoser H, Braem A, de Cataldo G, Davenport M, Di Mauro A, Franco A, Gallas A, Martinengo P, Nappi E, Piuz F, Schyns E 2007 Nucl. Instrum. Methods Phys. Res. Sect. A 574 28
[14] Razin V I, Gotovcev Y N, Kurepin A B, Reshetin A I 1998 Nucl. Instrum. Methods Phys. Res. Sect. A 419 621
[15] Boutboul T, Breskin A, Chechik R, Klein E, Braem A, Lion G, Miné P 1999 Nucl. Instrum. Methods Phys. Res. Sect. A 438 409
[16] Nitti M A, Nappi E, Valentini A, Bénédic F, Bruno P, Cicala G 2005 Nucl. Instrum. Methods Phys. Res. Sect. A 553 157
[17] Almeida J, Braem A, Breskin A, Buzulutskov A, Chechik R, Cohen S, Coluzza C, Conforto E, Margaritondo G, Nappi E, Paic G, Piuz F, Dell'Orto T, Scognetti T, Sgobba S, Tonner B P 1995 Nucl. Instrum. Methods Phys. Res. Sect. A 367 337
[18] Singh B K, Nitti M A, Valentini A, Nappi E, Coluzza C, Di Santo G, Zanoni R 2007 Nucl. Instrum. Methods Phys. Res. Sect. A 581 651
[19] Xie X W, Guo M l 1999 Fundamentals of Materials Science (Beijing: Beihang University Press) p134 (in Chinese) [谢希文, 过梅丽 1999 材料科学基础 (北京: 北京航空航天大学出版社) 第134页]
[20] Hui Z Z, Wang E X, Wan L X 1993 Physics of Surfaces and Interfaces (Chengdu: University of Electronic Science and Technology of China Press) p66 (in Chinese) [恽正中, 王恩信, 完利祥 1993 表面与界面物理 (成都: 电子科技大学出版社) 第66页]
[21] Cui G W 1990 Defect, Diffsion and Sintering (Beijing: Tsinghua University Press) p156 (in Chinese) [崔国文 1990 缺陷, 扩散与烧结 (北京: 清华大学出版社) 第156页]
[22] Lu B, Laughlin D E 2001 The Physics of Ultrahigh-Density Magnetic Recording Chapter 2: Microstructure of Longitudinal Media (Berlin: Springer-Verlag) p12
[23] Zhang L D, Mu J M 2001 Nanomaterials and Nanostucture (Beijing: Sicence Press) p148 (in Chinese) [张立德 牟季美 2001 纳米材料和纳米结构 (北京: 科学出版社) 第148页]
[24] Klug H P, Alexander L E 1974 X-ray Diffraction Procedures: For Polycrystalline and Amorphous Materials (New York: John Wiley & Sons) p662, 656
[25] Garg P, Rai R, Singh B K 2014 Nucl. Instrum. Methods Phys. Res. Sect. A 736 128
[26] Nix W D, Clemens B M 1999 J. Mater. Res. 14 3467
[27] Foster M C, Ewing G E 2000 J. Chem. Phys. 112 6817
[28] Smart R S C, Sheppard N 1976 J. Chem. Soc. Faraday Trans. 2: Molecular and Chhemical Physics 72 707
[29] Peters S J, Ewing G E 1997 J. Phys. Chem. B 101 10880
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