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Dong Zheng-Qiong, Zhao Hang, Zhu Jin-Long, Shi Ya-Ting. Influence of incident illumination on optical scattering measurement of typical photoresist nanostructure. Acta Physica Sinica,
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Wang Pan-Pan, Zhang Yu-Zhi, Peng Ming-Dong, Zhang Yun-Long, Wu Ling-Nan, Cao Yun-Zhen, Song Li-Xin. Spectroscopic ellipsometry analysis of vanadium oxide film in Vis-NIR and NIR-MIR. Acta Physica Sinica,
2016, 65(12): 127201.
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Li Jiang, Tang Jing-You, Pei Wang, Wei Xian-Hua, Huang Feng. Accurate determination of thickness values and optical constants of absorbing thin films on opaque substrates with spectroscopic ellipsometry. Acta Physica Sinica,
2015, 64(11): 110702.
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Yu Tian-Yan, Qin Yang, Liu Ding-Quan. Investigation of the crystal and optical properties of ZnS thin films deposited at different temperature. Acta Physica Sinica,
2013, 62(21): 214211.
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2012, 61(4): 048801.
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Dai Yu, Zhang Jian-Xun. Stereoscopic visualization based on splitting of two-way polarized image beams. Acta Physica Sinica,
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2011, 60(3): 034201.
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2010, 59(4): 2356-2363.
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2009, 58(11): 8027-8032.
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2008, 57(12): 7906-7911.
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2007, 56(9): 5508-5512.
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2006, 55(10): 5145-5149.
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2005, 54(1): 439-444.
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2003, 52(7): 1624-1629.
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