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Inorganic nano-composite polyimide (PI) films were prepared with the method of sol-gel. The interfacial situation and the fractal characteristics of PI films were investigated by small angle X-ray scattering (SAXS) using synchrotron radiation as X-ray source. SAXS results indicated that the scattering curves in the high-angle region have a negative slope, i.e., a negative deviation from Porod's law, which suggests that there are obvious interface layers between the organic phase and the inorganic phase in the PI films. The thicknesses of interface layers are 0.54—1.48 nm. The interaction of the organic phase and inorganic phase becomes stronger and the thickness of interfacial layer increases with the increase of inorganic nano-components. Nano-particles have mass fractal, simultaneously have surface fractal structure, and their distribution and assemblage are nonlinear dynamic processes. With the inorganic nano-components increasing, the surface fractal dimension increases and mass fractal dimension decreases, which shows that the nano-particles structure becomes looser and mass distribution becomes more uneven. The anchoring action of polymer chains is enhanced and the number of anchored point increased respectively, the surface of the hybrid PI films becomes rougher. Finally, according to the interface characteristics of hybrid PI films, the relationship of the breakdown field strength with component is analyzed by percolation theory and polarization theory.
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Keywords:
- SASX /
- nano-hybrid /
- polyimide /
- interface
[1] Nelson J K , Fothergill J C 2004 Nanotechnology 15 586
[2] Irwin P C ,Cao Y ,bansal A,Schadler L S 2003 Conf. Electr. Insul. Dielectr Phenomena(CEIDP) 120 12
[3] Fabiani D, Montanari G C, Cavallini A 2004 IEEE Transactions on Dielectrics and Electrical Insulation 11 393
[4] Kioul A, Mascia L 1994 J. Non-Cryst. Solids 175 2
[5] Agag T, Koga T, Takeichi T 2001 Polymet 42 3399
[6] Rong L X, Wei L H, Dong B Z, Hong X G, Li F M, Li Z C 2003 Chin. Phys. Soc. 12 0771
[7] Liu W, Johnson W L, Schneider S,Geyer U, Thiyagarajan P 1999 Phys. Rev. B 59 11755
[8] Giovanna M, Eder JK, Jackson DS, Arthur T, Tiago DV, Sérgio RT, Dimitrios S 2009 Eur. Polym. J 45 700
[9] Wang W, Chen X, Cai Q,Mo G, Jiang L S, Zhang K, Chen Z J, Wu Z H, Pan W 2008 Eur. Polym. J. B 65 57
[10] Reinhold B, Geue T, Huber P, Sant T, Pietsch U, Sztucki M 2009 Langmuir 25 814
[11] Miyasaka K, Neimark A V, Terasaki O, 2009 J. Phys. Chem. C 113 791
[12] Chen Z J, Wang W, Wu D, Cai Q, Chen X, Wu Z H 2008 Acta Phys. Sin. 57 5793 (in Chinese) [陈中军、 王 维、 蔡 泉、陈 兴、 吴忠华 2008 57 5793]
[13] Tu D M 2005 Transactions of China Electrotechnical Society 20 8[屠德民 2005 电工技术学报 20 8]
[14] Meng Z F 1996 Theory and Applicaion of Small Angle X-ray Scattering 55 (Chinese: Jilin Science and Technical Press). [孟昭富 1996小角 X 射线散射理论及应用, 55 (吉林科学技术出版社)]
[15] Li Z H, Gong Y J, Wu D, Sun Y H, Dong B Z 2001 Acta Phys. Sin. 50 1128 (in Chinese) [李志宏、巩雁军、吴 东、孙予罕、董宝中 2001 50 1128]
[16] Lewis T J 2004 IEEE T. Dielect. EI. In.11 739
[17] Lewis T J 2005 Phys. D: Appl. Phys. 38 202
[18] Porod G, Kolloid Z Z 1951 Polym. 124 83
[19] Brumberger H 1993 Mordern Aspects of Small-Angle Scattering (London:Kluwer Academic)
[20] McMahon P J, Moss SD 1999 J. Appl. Crystallogr 32 956
[21] Gaboriaud F, Chaumont D,Nonat A,Craievich A 2000 J. Appl. Crystallogr 33 597
[22] Schmidt P W 1992 J. Appl. Crystallog. 15 567
[23] Sareni B, Brosseau C 1996 J. Appl. Phys. 80 1688
[24] Konski O, 1960 J. Phys. Chem. 64 605
[25] Chew W C, Sen P N 1982 J.Chem.Phys. 77 4683
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[1] Nelson J K , Fothergill J C 2004 Nanotechnology 15 586
[2] Irwin P C ,Cao Y ,bansal A,Schadler L S 2003 Conf. Electr. Insul. Dielectr Phenomena(CEIDP) 120 12
[3] Fabiani D, Montanari G C, Cavallini A 2004 IEEE Transactions on Dielectrics and Electrical Insulation 11 393
[4] Kioul A, Mascia L 1994 J. Non-Cryst. Solids 175 2
[5] Agag T, Koga T, Takeichi T 2001 Polymet 42 3399
[6] Rong L X, Wei L H, Dong B Z, Hong X G, Li F M, Li Z C 2003 Chin. Phys. Soc. 12 0771
[7] Liu W, Johnson W L, Schneider S,Geyer U, Thiyagarajan P 1999 Phys. Rev. B 59 11755
[8] Giovanna M, Eder JK, Jackson DS, Arthur T, Tiago DV, Sérgio RT, Dimitrios S 2009 Eur. Polym. J 45 700
[9] Wang W, Chen X, Cai Q,Mo G, Jiang L S, Zhang K, Chen Z J, Wu Z H, Pan W 2008 Eur. Polym. J. B 65 57
[10] Reinhold B, Geue T, Huber P, Sant T, Pietsch U, Sztucki M 2009 Langmuir 25 814
[11] Miyasaka K, Neimark A V, Terasaki O, 2009 J. Phys. Chem. C 113 791
[12] Chen Z J, Wang W, Wu D, Cai Q, Chen X, Wu Z H 2008 Acta Phys. Sin. 57 5793 (in Chinese) [陈中军、 王 维、 蔡 泉、陈 兴、 吴忠华 2008 57 5793]
[13] Tu D M 2005 Transactions of China Electrotechnical Society 20 8[屠德民 2005 电工技术学报 20 8]
[14] Meng Z F 1996 Theory and Applicaion of Small Angle X-ray Scattering 55 (Chinese: Jilin Science and Technical Press). [孟昭富 1996小角 X 射线散射理论及应用, 55 (吉林科学技术出版社)]
[15] Li Z H, Gong Y J, Wu D, Sun Y H, Dong B Z 2001 Acta Phys. Sin. 50 1128 (in Chinese) [李志宏、巩雁军、吴 东、孙予罕、董宝中 2001 50 1128]
[16] Lewis T J 2004 IEEE T. Dielect. EI. In.11 739
[17] Lewis T J 2005 Phys. D: Appl. Phys. 38 202
[18] Porod G, Kolloid Z Z 1951 Polym. 124 83
[19] Brumberger H 1993 Mordern Aspects of Small-Angle Scattering (London:Kluwer Academic)
[20] McMahon P J, Moss SD 1999 J. Appl. Crystallogr 32 956
[21] Gaboriaud F, Chaumont D,Nonat A,Craievich A 2000 J. Appl. Crystallogr 33 597
[22] Schmidt P W 1992 J. Appl. Crystallog. 15 567
[23] Sareni B, Brosseau C 1996 J. Appl. Phys. 80 1688
[24] Konski O, 1960 J. Phys. Chem. 64 605
[25] Chew W C, Sen P N 1982 J.Chem.Phys. 77 4683
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