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Modulated free carrier absorption characterization of semiconductor wafers by frequency scans at different pump-to-probe separations

Li Wei Li Bin-Cheng

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Modulated free carrier absorption characterization of semiconductor wafers by frequency scans at different pump-to-probe separations

Li Wei, Li Bin-Cheng
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  • Abstract views:  7969
  • PDF Downloads:  972
  • Cited By: 0
Publishing process
  • Received Date:  01 December 2008
  • Accepted Date:  07 January 2009
  • Published Online:  20 September 2009

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