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2016, 65(19): 196202.
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Duan Fang-Li, Wang Ming, Liu Jing. Microstructure changes of amorphous polymer film induced by friction. Acta Physica Sinica,
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Zhu He, Zhang Bing-Po, Wang Miao, Hu Gu-Jin, Dai Ning, Wu Hui-Zhen. Influence of high dose As ion implantation on electrical properties of high resistivity silicon. Acta Physica Sinica,
2014, 63(13): 136803.
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2013, 62(16): 166101.
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Wu Zhen-Yu, Yang Yin-Tang, Chai Chang-Chun, Liu Li, Peng Jie, Wei Jing-Tian. A microstructure-based study on electromigration in Cu interconnects. Acta Physica Sinica,
2012, 61(1): 018501.
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2012, 61(1): 016107.
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2011, 60(8): 086802.
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2009, 58(8): 5693-5699.
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2009, 58(7): 4817-4825.
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Fan Xian-Hong, Chen Bo, Guan Qing-Feng. The influence of proton irradiation on the microstructure of pure Al films. Acta Physica Sinica,
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2007, 56(1): 376-383.
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Yang Hai-Bo, Hu Ming, Zhang Wei, Zhang Xu-Rui, Li De-Jun, Wang Ming-Xia. Nanoindentation investigation of the hardness and Young’s modulus of porous silicon depending on microstructure. Acta Physica Sinica,
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Guan Qing-Feng, An Chun-Xiang, Qin Ying, Zou Jian-Xin, Hao Sheng-Zhi, Zhang Qing-Yu, Dong Chuang, Zou Guang-Tian. Microstructure induced by stress generated by high-current pulsed electron beam. Acta Physica Sinica,
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Feng Wen-Ran, Yan Dian-Ran, He Ji-Ning, Chen Guang-Liang, Gu Wei-Chao, Zhang Gu-Ling, Liu Chi-Zi, Yang Si-Ze. Hardness and microstructure of the nanocrystallined TiN coating by reactive plasma spray. Acta Physica Sinica,
2005, 54(5): 2399-2402.
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Pan Meng-Xiao, Cao Xing-Zhong, Li Yang-Xian, Wang Bao-Yi, Xue De-Sheng, Ma Chuang-Xin, Zhou Chun-Lan, Wei Long. Microstructural features of DC sputtered vanadium oxide thin films. Acta Physica Sinica,
2004, 53(6): 1956-1960.
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2002, 51(10): 2308-2314.
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2001, 50(8): 1574-1579.
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