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CONVERGENT-BEAM ELECTRON DIFFRACTION STUDY OF TRANSVERSE BASAL STACKING FAULTS IN LAYER STRUCTURES

FENG GUO-GUANG

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CONVERGENT-BEAM ELECTRON DIFFRACTION STUDY OF TRANSVERSE BASAL STACKING FAULTS IN LAYER STRUCTURES

FENG GUO-GUANG
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(PLEASE TRANSLATE TO ENGLISH

BY GOOGLE TRANSLATE IF NEEDED.)

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  • Abstract views:  7770
  • PDF Downloads:  472
  • Cited By: 0
Publishing process
  • Received Date:  30 January 1985
  • Published Online:  05 January 1986

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