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2005, 54(9): 4273-4278.
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WANG YUAN-MING, CHEN JIANG-HUA, HU TIAN-BAO. A NEW DEVELOPMENT IN THE REAL SPACE HIGH RESOLU-TION ELECTRON MICROSCOPE SIMULATION METHOD. Acta Physica Sinica,
1989, 38(9): 1521-1526.
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ZHAO JIAN-GUO, LI FANG-HUA, CHEN WEI, XIE SI-SHEN, CAO NING, ZHENG JIA-QI. HIGH RESOLUTION ELECTRON MICROSCOPY STUDY ON HIGH Tc SUPERCONDUCTOR Nd-Ba-Cu-O. Acta Physica Sinica,
1989, 38(3): 508-510.
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1986, 35(11): 1480-1487.
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FENG GUO-GUANG. CONVERGENT-BEAM ELECTRON DIFFRACTION STUDY OF TRANSVERSE BASAL STACKING FAULTS IN LAYER STRUCTURES. Acta Physica Sinica,
1986, 35(2): 274-278.
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FENG GUO-GUANG. CONVERGENT-BEAM ELECTRON DIFFRACTION STUDY OF DISLOCATIONS. Acta Physica Sinica,
1986, 35(2): 279-282.
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WANG DA-NENG, ArNe OLSEN, YE HENG-QIANG. CONVERGENT BEAM ELECTRON DIFFRACTION STUDY OF C14 TYPE LAVES PHASE IN GH 302 ALLOY. Acta Physica Sinica,
1985, 34(5): 681-684.
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WEN SHU-LIN, FENG JING-WEI. LATTICE DEFECTS IN α-Si3N4 STUDIED BY HREM. Acta Physica Sinica,
1985, 34(7): 951-955.
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LI FANG-HUA, TANG DONG. PSEUDO WEAK PHASE OBJECT APPROXIMATION IN HIGH RESOLUTION ELECTRON MICROSCOPY. Acta Physica Sinica,
1984, 33(8): 1196-1197.
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YANG CUI-YING, ZHOU YU-QING, SHU QI-MAO, XIA HONG-CHANG, CHEN YING-PING, FENG GUO-GUANG. SYMMETRY DETERMINATION OF LiZnTa3O9 AND LiCaTa3O9 CRYSTALS BY CBED. Acta Physica Sinica,
1984, 33(12): 1687-1692.
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FENG GUO-GUANG. A NEW METHOD FOR OBTAINING LARGE-ANGLE CONVERGENT-BEAM ELECTRON DIFFRACTION. Acta Physica Sinica,
1984, 33(9): 1287-1290.
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YANG CUI-YING, FENG GUO-GANG, ZHOU YU-QING, TANG DI-SHENG. SPACE GROUP DETERMINATION OF Li2O·3Nb2O5 BY CONVERGENT BEAM ELECTRON DIFFRACTION. Acta Physica Sinica,
1984, 33(11): 1586-1588.
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KANG ZHEN-CHUAN. THE DIRECT DETERMINATION OF STACKING FAULTS SEQUENCE IN ZnS POLYTYPE BY HIGH RESOLUTION ELECTRON MICROSCOPY. Acta Physica Sinica,
1982, 31(5): 664-667.
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LI FANG-HUA, FAN HAI-FU. IMAGE DECONVOLUTION IN HIGH RESOLUTION ELECTRON MICROSCOPY BY MAKING USE OF SAYRE'S EQUATION. Acta Physica Sinica,
1979, 28(2): 276-278.
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Li Fang-hua. DETERMINATION OF CRYSTAL STRUCTURES BY HIGH RESOLUTION ELECTRON MICROSCOPY. Acta Physica Sinica,
1977, 26(3): 193-198.
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