-
This paper studies the effect of measuring angle error in X-ray powder diffractometer, which is caused by diffractometer inherent angle scale error resulting from mechanical manufacture, on the precision of calculated lattice parameter. It represents the theoretical limit of the consistency of the lattice parameters obtained by different diffractometers and laboratories. We use the calculated polysilicon diffraction patterns with random angle error to simulate the results measured by many sets of diffractometers of some manufacturing precision, then calculate and analyze the lattice parameters by three methods.
-
Keywords:
- X-ray diffractometer /
- inherent scale error /
- lattice parameter /
- precision
[1] FEWSTER P F 1999 J. Mater. Sci.-Mater. Electron. 10 175
[2] [3] Liang J K Crystal structure determination by X-ray powder diffraction (Vol. 2) (Beijing: Science Press) p486 (in Chinese) [梁敬魁. 粉末衍射法测定晶体结构(下) (北京: 科学出版社) p486]
[4] [5] Chen X C, Zhou J P, Wang H Y, Xu P S, Pan G Q 2011 Chin. Phys. B 20 096102
[6] [7] Li G N, Rao G H, Huang Q Z, Gao Q Q, Luo J, Liu G Y, Li J B, Liang J K 2014 Chin. Phys. B 23 036401
[8] Wang Z C, He L H, Cuevas F, Latroche M, Shen J, Wang F W 2011 Chin. Phys. B 20 067502
[9] [10] Parrish W 1960 Acta Cryst. 13 838
[11] [12] [13] Hubbard C R, Swanson H E, Mauer F A 1975 J. Appl. Cryst. 8 45
[14] Block S, Hubbard C R 1980 Proceedings of Symposium on Accuracy in Powder Diffraction Maryland June 11-15, 1979
[15] [16] Lu X S 1980 Acta Phys. Sin. 29 273 (in Chinese) [陆学善 1980 29 273]
[17] [18] Guo C L, Ma L T 1982 Chin. Sci. Bull. 8 467 (in Chinese) [郭常霖, 马利泰 1982 科学通报 8 467]
[19] [20] [21] Guo C L, Huang Y H 1981 Acta Phys. Sin. 30 124 (in Chinese) [郭常霖, 黄月鸿 1981 30 124]
[22] [23] Guo C L, Huang Y H 1986 J. Chin. Ceram. Soci. 14 129 (in Chinese)[郭常霖, 黄月鸿 1986 硅酸盐学报 14 129]
[24] [25] Xu X M, Miao W, Tao K 2011 Acta Phys. Sin. 60 086101 (in Chinese)[徐晓明, 苗伟, 陶琨 2011 60 086101]
-
[1] FEWSTER P F 1999 J. Mater. Sci.-Mater. Electron. 10 175
[2] [3] Liang J K Crystal structure determination by X-ray powder diffraction (Vol. 2) (Beijing: Science Press) p486 (in Chinese) [梁敬魁. 粉末衍射法测定晶体结构(下) (北京: 科学出版社) p486]
[4] [5] Chen X C, Zhou J P, Wang H Y, Xu P S, Pan G Q 2011 Chin. Phys. B 20 096102
[6] [7] Li G N, Rao G H, Huang Q Z, Gao Q Q, Luo J, Liu G Y, Li J B, Liang J K 2014 Chin. Phys. B 23 036401
[8] Wang Z C, He L H, Cuevas F, Latroche M, Shen J, Wang F W 2011 Chin. Phys. B 20 067502
[9] [10] Parrish W 1960 Acta Cryst. 13 838
[11] [12] [13] Hubbard C R, Swanson H E, Mauer F A 1975 J. Appl. Cryst. 8 45
[14] Block S, Hubbard C R 1980 Proceedings of Symposium on Accuracy in Powder Diffraction Maryland June 11-15, 1979
[15] [16] Lu X S 1980 Acta Phys. Sin. 29 273 (in Chinese) [陆学善 1980 29 273]
[17] [18] Guo C L, Ma L T 1982 Chin. Sci. Bull. 8 467 (in Chinese) [郭常霖, 马利泰 1982 科学通报 8 467]
[19] [20] [21] Guo C L, Huang Y H 1981 Acta Phys. Sin. 30 124 (in Chinese) [郭常霖, 黄月鸿 1981 30 124]
[22] [23] Guo C L, Huang Y H 1986 J. Chin. Ceram. Soci. 14 129 (in Chinese)[郭常霖, 黄月鸿 1986 硅酸盐学报 14 129]
[24] [25] Xu X M, Miao W, Tao K 2011 Acta Phys. Sin. 60 086101 (in Chinese)[徐晓明, 苗伟, 陶琨 2011 60 086101]
Catalog
Metrics
- Abstract views: 6642
- PDF Downloads: 640
- Cited By: 0
下载:
