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A dual-polarization frequency-modulated continuous-wave (FMCW) reflectometer is established on J-TEXT for measuring density profile. The frequency of reflectometer covers both Q band and V band. In order to measure wider density range, ordinary mode polarization and extraordinary mode polarization are utilized at the same time. For the FMCW reflectometer, temporal resolution depends on sweeping rate of the microwave source. Benefited from HTO (hyperabrupt varactortuned oscillator) source, a full frequency sweep period of the reflectometer could be less than 40 μs. Electron density profile from 0-6.0×1019 m-3 can be detected, which covers the whole low field side in J-TEXT. To reconstruct the full density profile, the position of the zero density should be confirmed first, which is determined from where the intermediate frequencies change transiently. Meanwhile, we observe the propagation of left-hand extraordinary wave from data in X-mode reflectometer.
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Keywords:
- reflectometer /
- electron density profile /
- dual-polarization /
- tokamak
[1] Roberts D R, Bravenec R V, Bengtson R D, et al. 1996 Plasma Phys. Control. Fusion 38 1117
[2] Zhuang G, Pan Y, Hu X W, et al. 2011 Nucl. Fusion 51 094020
[3] Laviron C, Donné A J H, Manso M E, Sanchez J 1996 Plasma Phys. Control. Fusion 38 905
[4] Simonet F 1985 Rev. Sci. Instrum. 56 664
[5] Xiao W W, Liu Z T, Ding X T, Shi Z B 2006 Plasma Sci. Technol. 8 133
[6] Xu Q, Shan J F, Zhao J Y 2009 Acta Phys. Sin. 58 8448 (in Chinese) [徐强, 单家方, 赵君煜 2009 58 8448]
[7] Li W, Chen C Y, Jiao Y M 2008 Acta Phys. Sin. 57 4159 (in Chinese) [李伟, 陈程远, 焦一鸣 2008 57 4159]
[8] Ling B L, Wan B N, Shi Y J 2001 Chin. Phys. B 10 134
[9] Doyle E J, Lehecka T, Luhmann N C, Peebles W A 1990 Rev. Sci. Instrum. 61 2896
[10] Mazzucato E 1998 Rev. Sci. Instrum. 69 2201
[11] Sips A C C, Kramert G J 1993 Plasma Phys. Control. Fusion 35 743
[12] Silva A, Cupido L, Manso M, Serra F, Nunes I, Santos J, Varela P, Vergamota S, Meneses L, Grossman V, Silva F, Loureiro C, Nunes F 1999 Rev. Sci. Instrum. 70 1072
[13] Kim K W, Doyle E J, Rhodes T L, Peebles W A, Rettig C L 1997 Rev. Sci. Instrum. 68 466
[14] Clairet F, Bottereau C, Chareau J M, Paume M, Sabot R 2001 Plasma Phys. Control. Fusion 43 429
[15] Kubota S, Peebles W A, Nguyen X V, Crocker N A, Roquemore A L 2006 Rev. Sci. Instrum. 77 10E926
[16] Wang G, Doyle E J, Peebles W A, Zeng L, Rhodes T L, Kubota S, Nguyen X, Crocker N A 2004 Rev. Sci. Instrum. 75 3800
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[1] Roberts D R, Bravenec R V, Bengtson R D, et al. 1996 Plasma Phys. Control. Fusion 38 1117
[2] Zhuang G, Pan Y, Hu X W, et al. 2011 Nucl. Fusion 51 094020
[3] Laviron C, Donné A J H, Manso M E, Sanchez J 1996 Plasma Phys. Control. Fusion 38 905
[4] Simonet F 1985 Rev. Sci. Instrum. 56 664
[5] Xiao W W, Liu Z T, Ding X T, Shi Z B 2006 Plasma Sci. Technol. 8 133
[6] Xu Q, Shan J F, Zhao J Y 2009 Acta Phys. Sin. 58 8448 (in Chinese) [徐强, 单家方, 赵君煜 2009 58 8448]
[7] Li W, Chen C Y, Jiao Y M 2008 Acta Phys. Sin. 57 4159 (in Chinese) [李伟, 陈程远, 焦一鸣 2008 57 4159]
[8] Ling B L, Wan B N, Shi Y J 2001 Chin. Phys. B 10 134
[9] Doyle E J, Lehecka T, Luhmann N C, Peebles W A 1990 Rev. Sci. Instrum. 61 2896
[10] Mazzucato E 1998 Rev. Sci. Instrum. 69 2201
[11] Sips A C C, Kramert G J 1993 Plasma Phys. Control. Fusion 35 743
[12] Silva A, Cupido L, Manso M, Serra F, Nunes I, Santos J, Varela P, Vergamota S, Meneses L, Grossman V, Silva F, Loureiro C, Nunes F 1999 Rev. Sci. Instrum. 70 1072
[13] Kim K W, Doyle E J, Rhodes T L, Peebles W A, Rettig C L 1997 Rev. Sci. Instrum. 68 466
[14] Clairet F, Bottereau C, Chareau J M, Paume M, Sabot R 2001 Plasma Phys. Control. Fusion 43 429
[15] Kubota S, Peebles W A, Nguyen X V, Crocker N A, Roquemore A L 2006 Rev. Sci. Instrum. 77 10E926
[16] Wang G, Doyle E J, Peebles W A, Zeng L, Rhodes T L, Kubota S, Nguyen X, Crocker N A 2004 Rev. Sci. Instrum. 75 3800
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