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Silicone oil droplets with varied sizes (micrometer to millimeter) were sprayed onto a clean glass slide and then Cr films were deposited on the droplets by DC-magnetron sputtering. Self-organized wrinkles induced by thermal stress have been investigated using atomic force microscope. It is found that the Cr films are limited by the droplet edges and thus possess constrained edges, which can well control the wrinkle morphologies: the wrinkles may exhibit radiated strips perpendicular to the edge. The wavelength and amplitude will decrease when approaching to the constrained edge. Morphologies of the wrinkles are closely related to the film thickness and oil drop size. As the film thickness increases, the wrinkles first form near the edge, and then propagate to the central region. The wavelength at the droplet center is almost unchanged for different oil sizes, but the amplitude first increases and then decreases with increasing film thickness. When the film thickness is fixed, the wavelength and amplitude may increase accordingly with increasing droplet size. Further studies show that the top surface of the silicone oil is modified to form a polymer layer during the deposition due to the bombardment from high-energy particles and heat radiation from the sputtering source. Morphologies of the wrinkles and amplitude evolutions are then explained in detail.
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Keywords:
- liquid substrate /
- metal film /
- self-organization /
- constrained edge
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[21] Yu S J, Zhou H, Zhang Y J, Chen M G, Jiao Z W, Si P Z 2012 Thin Solid Films 520 5683
[22] Yu S J, Zhang Y J, Zhou H, Chen M G, Zhang X F, Jiao Z W, Si P Z 2013 Phys. Rev. E 88 042401
[23] Al-Shareef A, Neogi P, Bai B 2013 Chem. Eng. Sci. 99 113
[24] Feng C M, Ge H L, Tong M R, Ye G X, Jiao Z K 1999 Thin Solid Films 34 230
[25] Tao X M, Lao Y F, Ye Q L, Jin J S, Jiao Z K, Ye G X 2001 Acta Phys. Sin. 50 1991 (in Chinese)[陶向明, 劳燕锋, 叶全林, 金进生, 焦正宽, 叶高翔 2001 50 1991]
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[1] Zhong M J, Guo G L, Yang J Y, Ma N H, Ye G, Guo X D, Li R X, Ma H L 2008 Chin. Phys. B 17 1223
[2] Jiang Y H, Liu L W, Yang K, Xiao W D, Gao H J 2011 Chin. Phys. B 20 096401
[3] Zhang C H, L N, Zhang X F, Saida A, Xia A G, Ye G X 2011 Chin. Phys. B 20 066103
[4] Bowden N, Brittain S, Evans A G, Hutchinson J W, Whitesides G M 1998 Nature 393 146
[5] Efimenko K, Rackaitis M, Manias E, Vaziri A, Mahadevan L, Genzer J 2005 Nat. Mater. 4 293
[6] Wang F, Xue M, Cao T 2009 Adv. Mater. 21 2211
[7] Colin J, Coupeau C, J Grilhé 2007 Phys. Rev. Lett. 99 046101
[8] Faou J Y, Parry G, Grachev S, Barthel E 2012 Phys. Rev. Lett. 108 116102
[9] Yu S J, Xiao X F, Chen M G, Zhou H, Chen J, Si P Z, Jiao Z W 2014 Acta Mater. 64 41
[10] Cai P G, Yu S J, Ye Q L, Jin J S, Ye G X 2003 Phys. Lett. A 312 119
[11] Yu S J, Zhang Y J, Ye Q L, Cai P G, Tang X W, Ye G X 2003 Phys. Rev. B 68 193403
[12] Zhang Y J, Yu S J 2005 Acta Phys. Sin. 54 4867 (in Chinese)[张永炬, 余森江 2005 54 4867]
[13] Xia A G, Yang B, Jin J S, Zhang Y W, Tang F, Ye G X 2005 Acta Phys. Sin. 54 302
[14] Liu X, Wuttig M 2006 Phys. Rev. B 73 033405
[15] Zhang Y J, Yu S J, Ge H L, Wu L N, Cui Y J 2006 Acta Phys. Sin. 55 5444 (in Chinese)[张永炬, 余森江, 葛洪良, 邬良能, 崔玉建 2006 55 5444]
[16] Pocivavsek L, Dellsy R, Kern A, Johnson S, Lin B, Lee K Y C, Cerda E 2008 Science 320 912
[17] Huang J, Davidovitch B, Santangelo C D, Russell T P, Menon N 2010 Phys. Rev. Lett. 105 038302
[18] Kim P, Abkarian M, Stone H A 2011 Nat. Mater. 10 952
[19] Vandeparre H, Pineirua M, Brau F, Roman B, Bico J, Gay C, Bao W, Lau C N, Reis P M, Damman P 2011 Phys. Rev. Lett. 106 224301
[20] Bao W, Miao F, Chen Z, Zhang H, Jang W, Dames C, Lau C N 2009 Nat. Nanotech. 4 562
[21] Yu S J, Zhou H, Zhang Y J, Chen M G, Jiao Z W, Si P Z 2012 Thin Solid Films 520 5683
[22] Yu S J, Zhang Y J, Zhou H, Chen M G, Zhang X F, Jiao Z W, Si P Z 2013 Phys. Rev. E 88 042401
[23] Al-Shareef A, Neogi P, Bai B 2013 Chem. Eng. Sci. 99 113
[24] Feng C M, Ge H L, Tong M R, Ye G X, Jiao Z K 1999 Thin Solid Films 34 230
[25] Tao X M, Lao Y F, Ye Q L, Jin J S, Jiao Z K, Ye G X 2001 Acta Phys. Sin. 50 1991 (in Chinese)[陶向明, 劳燕锋, 叶全林, 金进生, 焦正宽, 叶高翔 2001 50 1991]
[26] Cerda E, Mahadevan L 2003 Phys. Rev. Lett. 90 074302
[27] Chua D B H, Ng H T, Li S F Y 2000 Appl. Phys. Lett. 76 721
[28] Genzer J, Groenewold J 2006 Soft Matter 2 310
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