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In this paper, a new method using reflective pulsed thermography to measure defect depth, thermal wave reflection coefficient and thermal diffusivity is presented. First, a brief description of the pulsed thermography in terms of theoretical background and quantitative measurement is given. One stainless steel 304 structure machined several flat-bottom holes in which it is filled with different materials are used as experimental sample, the measured results of defect depth, thermal diffusivity and reflection coefficients at defect interface under different conditions are given. The agreement between the results obtained by using pulsed thermography and the value presented in the literature or measured by other techniques appears satisfactory within errors of 5%, and possible reasons for affecting the measurement precision are discussed.
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Keywords:
- pulsed thermography /
- quantitative characterization /
- defect depth /
- thermal wave reflection coefficient
[1] Shepard S, Hou Y, Lhota J 2004 CD-ROM proceedings of the 16th world conference on NDT, Aug 30-Sep 3, 2004 791
[2] Chen D P, Zeng Z, Zhang C L, Jin X Y, Zhang Z 2012 Acta Phys. Sin. 61 094207 (in Chinese) [陈大鹏, 曾智, 张存林, 金学元, 张峥 2012 61 094207]
[3] [4] Zeng S Q, Xu H F, Li J Y, Liu X D 1997 Acta Phys. Sin. 46 1338 (in Chinese) [曾绍群, 徐海峰, 李骄阳, 刘贤德 1997 46 1338]
[5] [6] Tao N, Zeng Z, Feng L C, Li Y, Zhang C L 2011 Infrared and Laser Engineering 40 2098 (in Chinese) [陶宁, 曾智, 冯立春, 李越, 张存林 2011 红外与激光工程 40 2098]
[7] [8] [9] Favro L D, Jin H J, Wang Y X, Ahmed T, Wang X 1991 Review of progress in quantitative nondestructive evaluation. Proceedings of the 18th Annual Review, Brunswick, ME, July 28-Aug. 2, 1991 p447
[10] [11] Ringermacher H I, Archacki Jr. R J, Veronesi W A 1998 U. S. Patent No. 5, 711, 603[2008]
[12] [13] Han X Y, Favro L D, Thomas R L 1998 the Second Joint NASA / FAA / DOD Conference on Aging Aircraft, NASA/CP-1999-208982, Part 1, 1998 p265
[14] [15] Shepard S M, Lhota J R, Rubadeux B A, Wang D, Ahmed T 2003 Opt. Eng. 42 1337
[16] [17] Zeng Z, Zhou J, Tao N, Feng L C, Zhang C L 2012 Infrared Physics and Technology 55 200-4
[18] [19] Sun J G 2008 U. S. Patent No. 6,542,849[2003]
[20] [21] Maldague X P, Marinetti S 1996 J. Appl. Phys. 79 2694
[22] Sun J G 2007 Int. J. Appl. Ceram. Technol. 4 75
[23] [24] [25] Parker W J, Jenkins R J, Butler C P, Abbott G L 1961 J. Appl. Phys. 32 1679
[26] [27] Gaal P S, Thermitus M A, Stroe D E 2004 J. Therm. Anal. Calorimet. 78 185
[28] [29] Balageas D L 2010 the 10th International Conference on Quantitative InfraRed Thermography Qubec, Canada July 27-30, 2010
[30] Lau S K, Almond D P, Milne J M 1991 NDT E International 24 195
[31] -
[1] Shepard S, Hou Y, Lhota J 2004 CD-ROM proceedings of the 16th world conference on NDT, Aug 30-Sep 3, 2004 791
[2] Chen D P, Zeng Z, Zhang C L, Jin X Y, Zhang Z 2012 Acta Phys. Sin. 61 094207 (in Chinese) [陈大鹏, 曾智, 张存林, 金学元, 张峥 2012 61 094207]
[3] [4] Zeng S Q, Xu H F, Li J Y, Liu X D 1997 Acta Phys. Sin. 46 1338 (in Chinese) [曾绍群, 徐海峰, 李骄阳, 刘贤德 1997 46 1338]
[5] [6] Tao N, Zeng Z, Feng L C, Li Y, Zhang C L 2011 Infrared and Laser Engineering 40 2098 (in Chinese) [陶宁, 曾智, 冯立春, 李越, 张存林 2011 红外与激光工程 40 2098]
[7] [8] [9] Favro L D, Jin H J, Wang Y X, Ahmed T, Wang X 1991 Review of progress in quantitative nondestructive evaluation. Proceedings of the 18th Annual Review, Brunswick, ME, July 28-Aug. 2, 1991 p447
[10] [11] Ringermacher H I, Archacki Jr. R J, Veronesi W A 1998 U. S. Patent No. 5, 711, 603[2008]
[12] [13] Han X Y, Favro L D, Thomas R L 1998 the Second Joint NASA / FAA / DOD Conference on Aging Aircraft, NASA/CP-1999-208982, Part 1, 1998 p265
[14] [15] Shepard S M, Lhota J R, Rubadeux B A, Wang D, Ahmed T 2003 Opt. Eng. 42 1337
[16] [17] Zeng Z, Zhou J, Tao N, Feng L C, Zhang C L 2012 Infrared Physics and Technology 55 200-4
[18] [19] Sun J G 2008 U. S. Patent No. 6,542,849[2003]
[20] [21] Maldague X P, Marinetti S 1996 J. Appl. Phys. 79 2694
[22] Sun J G 2007 Int. J. Appl. Ceram. Technol. 4 75
[23] [24] [25] Parker W J, Jenkins R J, Butler C P, Abbott G L 1961 J. Appl. Phys. 32 1679
[26] [27] Gaal P S, Thermitus M A, Stroe D E 2004 J. Therm. Anal. Calorimet. 78 185
[28] [29] Balageas D L 2010 the 10th International Conference on Quantitative InfraRed Thermography Qubec, Canada July 27-30, 2010
[30] Lau S K, Almond D P, Milne J M 1991 NDT E International 24 195
[31]
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