Shot noise measurement methods in electronic devices

Zhuang Yi-Qi; Bao Jun-Lin; Sun Peng; Wang Ting-Lan; Chen Wen-Hao; Du Lei; He Liang; Chen Hua

doi:10.7498/aps.60.050704

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Zhuang Yi-Qi, Bao Jun-Lin, Sun Peng, Wang Ting-Lan, Chen Wen-Hao, Du Lei, He Liang, Chen Hua. Shot noise measurement methods in electronic devicesJ. Acta Physica Sinica, 2011, 60(5): 050704. DOI: 10.7498/aps.60.050704

Citation:

Zhuang Yi-Qi, Bao Jun-Lin, Sun Peng, Wang Ting-Lan, Chen Wen-Hao, Du Lei, He Liang, Chen Hua. Shot noise measurement methods in electronic devicesJ. Acta Physica Sinica, 2011, 60(5): 050704. DOI: 10.7498/aps.60.050704

Citation:

Zhuang Yi-Qi, Bao Jun-Lin, Sun Peng, Wang Ting-Lan, Chen Wen-Hao, Du Lei, He Liang, Chen Hua. Shot noise measurement methods in electronic devicesJ. Acta Physica Sinica, 2011, 60(5): 050704. DOI: 10.7498/aps.60.050704