| [1] |
Zhang Guan-Jie, Yang Hao, Zhang Nan. Research progress of the investigation of intrinsic and extrinsic origin of piezoelectric materials by X-ray diffraction. Acta Physica Sinica,
2020, 69(12): 127711.
doi: 10.7498/aps.69.20200301
|
| [2] |
Huang Hao, Zhang Kan, Wu Ming, Li Hu, Wang Min-Juan, Zhang Shu-Ming, Chen Jian-Hong, Wen Mao. Comparison between axial residual stresses measured by Raman spectroscopy and X-ray diffraction in SiC fiber reinforced titanium matrix composite. Acta Physica Sinica,
2018, 67(19): 197203.
doi: 10.7498/aps.67.20181157
|
| [3] |
Li Jia, Fang Qi, Luo Bing-Chi, Zhou Min-Jie, Li Kai, Wu Wei-Dong. Residual stress analysis by grazing-incidence X-ray diffraction on beryllium films. Acta Physica Sinica,
2013, 62(14): 140701.
doi: 10.7498/aps.62.140701
|
| [4] |
Pan Hui-Ping, Cheng Feng-Feng, Li Lin, Horng Ray-Hua, Yao Shu-De. Structrual analyses of Ga2+xO3-x thin films grown on sapphire substrates. Acta Physica Sinica,
2013, 62(4): 048801.
doi: 10.7498/aps.62.048801
|
| [5] |
Xu Xiao-Ming, Miao Wei, Tao Kun. Direct method of determining the lattice parameters of a phase from X-ray diffraction pattern of multi-phase. Acta Physica Sinica,
2011, 60(8): 086101.
doi: 10.7498/aps.60.086101
|
| [6] |
Wu Zhong-Hua, Sun Guang-Ai, Liu Yi, Chen Bo, Yan Guan-Yun, Wang Jie, Huang Chao-Qiang, Wu Er-Dong, Li Wu-Hui. Small angle X-ray scattering study of the microstructure and interface characteristics of single crystal superalloys during creep process. Acta Physica Sinica,
2011, 60(1): 016102.
doi: 10.7498/aps.60.016102
|
| [7] |
Wu Xue-Wei, Wu Da-Jian, Liu Xiao-Jun. Effects of B(N, F) doping on optical properties of TiO2 nanoparticles. Acta Physica Sinica,
2010, 59(7): 4788-4793.
doi: 10.7498/aps.59.4788
|
| [8] |
Li Yong-Hua, Liu Chang-Sheng, Meng Fan-Ling, Wang Yu-Ming, Zheng Wei-Tao. X-ray photoelectron spectroscopy analysis of the effect of thickness on the transformation temperature of NiTi alloy thin films. Acta Physica Sinica,
2009, 58(4): 2742-2745.
doi: 10.7498/aps.58.2742
|
| [9] |
Li Hong-Tao, Luo Yi, Xi Guang-Yi, Wang Lai, Jiang Yang, Zhao Wei, Han Yan-Jun, Hao Zhi-Biao, Sun Chang-Zheng. Thickness measurement of GaN films by X-ray diffraction. Acta Physica Sinica,
2008, 57(11): 7119-7125.
doi: 10.7498/aps.57.7119
|
| [10] |
Ming Bao-Quan, Wang Jin-Feng, Zang Guo-Zhong, Wang Chun-Ming, Gai Zhi-Gang, Du Juan, Zheng Li-Mei. X-ray diffraction and phase transition analysis for (K, Na)NbO3-based lead-free piezoelectric ceramics. Acta Physica Sinica,
2008, 57(9): 5962-5967.
doi: 10.7498/aps.57.5962
|
| [11] |
Lü Hui-Min, Chen Guang-De, Yan Guo-Jun, Ye Hong-Gang. The growth mechanism of monocrystal aluminum nitride nanowires at low temperature. Acta Physica Sinica,
2007, 56(5): 2808-2812.
doi: 10.7498/aps.56.2808
|
| [12] |
. Properties of Co nano-films deposited on monocrystalline silicon surface by ion beam sputtering. Acta Physica Sinica,
2007, 56(12): 7158-7164.
doi: 10.7498/aps.56.7158
|
| [13] |
Wang Hui, Liu Jin-Fang, He Yan, Chen Wei, Wang Ying, Gerward L., Jiang Jian-Zhong. Size-induced enhancement of bulk modulus and transition pressure of nanocrystalline Ge. Acta Physica Sinica,
2007, 56(11): 6521-6525.
doi: 10.7498/aps.56.6521
|
| [14] |
Tan Guo-Tai, Chen Zheng-Hao. XRD analysis on lattice structure of La1-xTexMnO3. Acta Physica Sinica,
2007, 56(3): 1702-1706.
doi: 10.7498/aps.56.1702
|
| [15] |
Wang Rui-Min, Chen Guang-De, Zhu You-Zhang. Micro-Raman scattering study of hexagonal InGaN epitaxial layer. Acta Physica Sinica,
2006, 55(2): 914-919.
doi: 10.7498/aps.55.914
|
| [16] |
Qin Pei, Lou Yu-Wan, Yang Chuan-Zheng, Xia Bao-Jia. New computing methods and programs for separating multipe-broadening effects of X-ray diffraction lines. Acta Physica Sinica,
2006, 55(3): 1325-1335.
doi: 10.7498/aps.55.1325
|
| [17] |
Zhou Bing-Qing, Liu Feng-Zhen, Zhu Mei-Fang, Gu Jin-Hua, Zhou Yu-Qin, Liu Jin-Long, Dong Bao-Zhong, Li Guo-Hua, Ding Kun. The microstructure of hydrogenated microcrystalline silicon thin films studied by small-angle x-ray scattering. Acta Physica Sinica,
2005, 54(5): 2172-2175.
doi: 10.7498/aps.54.2172
|
| [18] |
Du Xiao-Song, S. Hak, O. C. Rogojanu, T. Hibma. X-ray study of chromium oxide films epitaxially grown on MgO. Acta Physica Sinica,
2004, 53(10): 3510-3514.
doi: 10.7498/aps.53.3510
|
| [19] |
Hao Yan-Ming, Zhao Wei, Gao Yan. Structure and Curie temperature of Y2(Fe1-x-y,Coy,Crx)17 compounds. Acta Physica Sinica,
2003, 52(10): 2612-2615.
doi: 10.7498/aps.52.2612
|
| [20] |
LI QI, PAN HAI-BIN, ZHU CHUAN-GANG, XU PENG-SHOU, ZHOU YANG-XUE, ZHANG XIN-YI. XRD AND XPS STUDIES OF Bi2Sr2CaCu2-xSnxO8+δ SYSTEM. Acta Physica Sinica,
2000, 49(10): 2055-2058.
doi: 10.7498/aps.49.2055
|
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