Local work function measurement on Cu(111)-Au and Cu(111)-Pd surfaces

Jia Jin-Feng; Dong Guo-Cai; Wang Li-Li; Ma Xu-Cun; Xue Qi-Kun; Y. Hasegawa T. Sakurai

doi:10.7498/aps.54.1513

Abstract
In this paper, we report the local work function measurements on the Cu(111)-Au, and Cu(111)-Pd surfaces with scanning tunneling microscopy (STM). We successfully observed the local work function difference between the Au/Pd overlayer and the Cu substrate, the decreased work function at the step edges. We also found that the work function of the Pd film is larger than that of the bulk Pd(111). T he lower work function at step edges can be explained by the dipole moment forma tion. It is demonstrated that the local work function measurement by STM is a po werful way to identify different elements with nanometer resolution.

Keywords:
scanning tunneling microscope /

local work function /

step
Authors and contacts
Jia Jin-Feng²,

Dong Guo-Cai²,

Wang Li-Li²,

Ma Xu-Cun²,

Xue Qi-Kun²,

Y. Hasegawa T. Sakurai¹

(1)Institute for Materials Research,Tohoku University,Sendai 980-8577,Japan; (2)中国科学院物理研究所，北京 100080
References

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Vol. 54, Issue 4 - 2005-02-20

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Local work function measurement on Cu(111)-Au and Cu(111)-Pd surfaces

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