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Hole storage characteristics in Ge/Si hetero-nanocrystal-based memories

Yang Hong-Guan Shi Yi Lü Jin Pu Lin Zhang Rong Zheng You-Dou

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Hole storage characteristics in Ge/Si hetero-nanocrystal-based memories

Yang Hong-Guan, Shi Yi, Lü Jin, Pu Lin, Zhang Rong, Zheng You-Dou
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  • Abstract views:  7386
  • PDF Downloads:  1024
  • Cited By: 0
Publishing process
  • Received Date:  24 June 2003
  • Accepted Date:  22 July 2003
  • Published Online:  05 February 2004

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