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采用磁控溅射法在单晶Si 基底上沉积金属钒(V)薄膜,在高纯氧环境下快速热处理制备具有相变特性的氧化钒(VOx)薄膜.利用X射线衍射仪、X射线光电子能谱和扫描电子显微镜对薄膜结晶结构、薄膜中V的价态与组分及表面微观形貌进行分析, 应用四探针测试方法和太赫兹时域频谱技术对样品的电学和光学特性进行测试. 结果表明:在一定范围的快速热处理保温温度和保温时间下, 都可以制备出具有热致相变特性的氧化钒薄膜, 相变前后薄膜的方块电阻变化超过两个数量级, 薄膜成分主要由V2O5和VO2混合组成, 薄膜中V整体价态不因热处理条件改变而不同.在快速热处理条件范围内, 500 ℃ 25 s左右条件下(中温区)制备出的氧化钒薄膜相变特性最佳,并且对THz波有一定的调制作用.Vanadium thin films are deposited by magnetron sputter. Then VOx thin films are fabricated by a series of rapid thermal processes (RTPs) in pure oxygen environment. X-ray diffraction, X-ray photoelectron spectroscopy and scanning electron microscope are employed to analyze crystalline structure of the thin film, phase composition and surface morphology. Electrical and optical properties of VOx thin film are measured by the four-point probe method and THz time-domain spectroscopy technology, respectively. The results reveale that the VOx thin film which is composed mainly of V2O5 and VO2 has the properties of phase transition to a certain extent within the RTP condition of heat preservation temperature and time, and the overall valence of vanadium remains unchanged, no matter whether the RTP condition is the same. The best performance VOx thin film can be obtained under the moderate RTP condition, such as 500 ℃ 25 s, and this film can also modulate the THz wave.
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Keywords:
- vanadium oxide thin films /
- phase transition /
- rapid thermal process /
- THz modulation
[1] Morin F J 1959 Phys. Rev. Lett. 3 34
[2] Zylbersztejn A, Mott N F 1975 Phys. Rev. B 11 4383
[3] Chen C H, Yi X J, Zhao X R, Xiong B F 2001 Sens. Actuators. A 90 212
[4] Chen Z, Gao Y F, Kang L T, Jing D, Zhang Z T, Luo H J, Miao H Y, Tan G Q 2011 Sol. Energy Mater. Sol. Cells 95 2677
[5] Ben-Messaoud T, Landry G, Gariepy J P, Ramamoorthy B, Ashrit P V, Hache A 2008 Opt. Commun. 281 6024
[6] Lee J S, Ortolani M, Schade U 2007 Appl. Phys. Lett. 91 133509
[7] Jepsen P U, Fischer B M, Thoman A, Helm H, Suh J Y, Lopez R, Haglund R F 2006 Phys. Rev. B 74 205103
[8] Aikuhaili M F, Khawaja E E, Ingram D C, Durrani S M A 2004 Thin Solid Films 460 30
[9] L Y Q, Hu M, Wu M, Liu Z G 2007 Surf. Coat. Technol. 201 4969
[10] Kumar R T R, Karunagaran B, Mangalaraj D, Narayandass S K, Manoravi P, Joseph M, Gopal V 2003 Sens. Actuators. A 107 62
[11] Yin D C, Xu N K, Zhang J Y, Zheng X L 1996 Mater. Res. Bull. 31 335
[12] Hou S B, Hu M, L Z J, Liang J R, Chen T 2012 Chin. J. Lasers 39 0107002 (in Chinese) [后顺保, 胡明, 吕志军, 梁继然, 陈涛 2012 中国激光 39 0107002 ]
[13] L Z J, Hu M, Chen T, Hou S B, Liang J R 2012 Micronanoelectron. Technol. 49 27 (in Chinese) [吕志军, 胡明, 陈涛, 后顺保, 梁继然 2012 微纳电子技术 49 27]
[14] Brassard D, Fourmaux S, Jean-Jacques M, Kieffer J C, El Khakani M A 2005 Appl. Phys. Lett. 87 051910
[15] Alov N, Kutsko D, Spirovova I, Bastl Z 2006 Surf. Sci. 600 1628
[16] Liang J R, Hu M, Wang X D, Li G K, Ji A, Yang F H, Liu J, Wu N J, Chen H D 2009 Acta Phys.-Chim. Sin. 25 1523 (in Chinese) [梁继然, 胡明, 王晓东, 李贵柯, 季安, 杨富华, 刘剑, 吴南健, 陈弘达 2009 物理化学学报 25 1523]
[17] Rozen J, Lopez R, Haglund R F, Feldman L C 2006 Appl. Phys. Lett. 88 081902
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[1] Morin F J 1959 Phys. Rev. Lett. 3 34
[2] Zylbersztejn A, Mott N F 1975 Phys. Rev. B 11 4383
[3] Chen C H, Yi X J, Zhao X R, Xiong B F 2001 Sens. Actuators. A 90 212
[4] Chen Z, Gao Y F, Kang L T, Jing D, Zhang Z T, Luo H J, Miao H Y, Tan G Q 2011 Sol. Energy Mater. Sol. Cells 95 2677
[5] Ben-Messaoud T, Landry G, Gariepy J P, Ramamoorthy B, Ashrit P V, Hache A 2008 Opt. Commun. 281 6024
[6] Lee J S, Ortolani M, Schade U 2007 Appl. Phys. Lett. 91 133509
[7] Jepsen P U, Fischer B M, Thoman A, Helm H, Suh J Y, Lopez R, Haglund R F 2006 Phys. Rev. B 74 205103
[8] Aikuhaili M F, Khawaja E E, Ingram D C, Durrani S M A 2004 Thin Solid Films 460 30
[9] L Y Q, Hu M, Wu M, Liu Z G 2007 Surf. Coat. Technol. 201 4969
[10] Kumar R T R, Karunagaran B, Mangalaraj D, Narayandass S K, Manoravi P, Joseph M, Gopal V 2003 Sens. Actuators. A 107 62
[11] Yin D C, Xu N K, Zhang J Y, Zheng X L 1996 Mater. Res. Bull. 31 335
[12] Hou S B, Hu M, L Z J, Liang J R, Chen T 2012 Chin. J. Lasers 39 0107002 (in Chinese) [后顺保, 胡明, 吕志军, 梁继然, 陈涛 2012 中国激光 39 0107002 ]
[13] L Z J, Hu M, Chen T, Hou S B, Liang J R 2012 Micronanoelectron. Technol. 49 27 (in Chinese) [吕志军, 胡明, 陈涛, 后顺保, 梁继然 2012 微纳电子技术 49 27]
[14] Brassard D, Fourmaux S, Jean-Jacques M, Kieffer J C, El Khakani M A 2005 Appl. Phys. Lett. 87 051910
[15] Alov N, Kutsko D, Spirovova I, Bastl Z 2006 Surf. Sci. 600 1628
[16] Liang J R, Hu M, Wang X D, Li G K, Ji A, Yang F H, Liu J, Wu N J, Chen H D 2009 Acta Phys.-Chim. Sin. 25 1523 (in Chinese) [梁继然, 胡明, 王晓东, 李贵柯, 季安, 杨富华, 刘剑, 吴南健, 陈弘达 2009 物理化学学报 25 1523]
[17] Rozen J, Lopez R, Haglund R F, Feldman L C 2006 Appl. Phys. Lett. 88 081902
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