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Chaotic detection method can be used to pick out the weak sinusoidal signal submerged in noise. Three types of detection properties of this method are proposed in this paper, i.e., sharp change ability of phase diagram, maintenance zone of chaos, and the sufferance with noise of the chaos critical point. After analyzing the factors influencing these three properties, two different chaotic systems are compared according to the three properties.
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Keywords:
- chaotic detection /
- weak signal detection /
- duffing equation /
- detection property
[1] Feng Q 1994 J. Tongji Univ. 22 69 (in Chinese) [冯奇 1994 同济大学学报 22 69]
[2] Wang G Y, Tao G L, Chen X, Lin J Y 1997 Chin. J. Sci. Instrum. 18 209 (in Chinese) [王冠宇, 陶国良, 陈 行, 林建亚 1997 仪器仪表学报 18 209]
[3] Li Y, Yang B J, Shi Y W 2003 Acta Phys. Sin. 52 526 (in Chinese) [李月, 杨宝俊, 石要武 2003 52 526]
[4] Li Y, Shi Y W, Ma H T, Yang B J 2004 Acta Electron. Sin. 32 87 (in Chinese) [李月, 石要武, 马海涛, 杨宝俊 2004 电子学报 32 87]
[5] Gandino E, Marchesiello S 2010 MPE 2010 695025
[6] Nie C Y 2009 The Weak Signal Detection and Chaotic System (Beijing: Tsinghua University Press) pp89-103 (in Chinese) [聂春燕 2009 混沌系统与弱信号检测 (北京: 清华大学出版社) 第89–103 页]
[7] Li X L 2005 Chin. J. Appl. Mech. 22 628 (in Chinese) [李香莲 2005 应用力学学报 22 628]
[8] Wang Y S, Xiao Z C, Sun J, Fan H D 2008 J. Circuits Syst. 13 132 (in Chinese) [王永生, 肖子才, 孙瑾, 范洪达 2008 电路与系统学报 13 132]
[9] Zhang R B, Chu F H, Ran L, Guo J G 2011 The 19th International Conference on Computers in Education, ICCE 2011 Chiang Mai, Thailand, November 28-December 2, 2011 p417
[10] Hu W J, Liu Z Z, Li Z H 2011 Electronics and Signal Processing (Berlin: Springer-Verlag) p831
[11] Zhao W L, Huang Z Q, Zhao J X 2011 J. Circuits Syst. 16 120 (in Chinese) [赵文礼, 黄振强, 赵景晓 2011 电路与系统学报 16 120]
[12] Lu T X, Zhang J Q 2010 Introduction to Nonlinear Physics (Hefei: University of Science and Technology of China Press) pp109-136 (in Chinese) [陆同兴, 张季谦 2010 非线性物理概论 (合肥: 中国科学技术大学出版社) 第109–136页]
[13] Li Y, Yang B J 2004 The Detecting Theory of Chaotic Oscillators (Shanghai: The Electronics Industry Publishing House) pp64-68 (in Chinese) [李月, 杨宝俊 2004 混沌振子检测引论 (上海: 电子工业出版社) 第64–68页]
[14] Wang Y S, Jiang W Z, Zhao J J, Fan H D 2008 Acta Phys. Sin. 57 2053 (in Chinese) [王永生, 姜文志, 赵建军, 范洪达 2008 57 2053]
[15] Xie T, Wei X Y 2008 Chin. J. Sci. Instrum. 29 1265 (in Chinese) [谢涛, 魏学业 2008 仪器仪表学报 29 1265]
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[1] Feng Q 1994 J. Tongji Univ. 22 69 (in Chinese) [冯奇 1994 同济大学学报 22 69]
[2] Wang G Y, Tao G L, Chen X, Lin J Y 1997 Chin. J. Sci. Instrum. 18 209 (in Chinese) [王冠宇, 陶国良, 陈 行, 林建亚 1997 仪器仪表学报 18 209]
[3] Li Y, Yang B J, Shi Y W 2003 Acta Phys. Sin. 52 526 (in Chinese) [李月, 杨宝俊, 石要武 2003 52 526]
[4] Li Y, Shi Y W, Ma H T, Yang B J 2004 Acta Electron. Sin. 32 87 (in Chinese) [李月, 石要武, 马海涛, 杨宝俊 2004 电子学报 32 87]
[5] Gandino E, Marchesiello S 2010 MPE 2010 695025
[6] Nie C Y 2009 The Weak Signal Detection and Chaotic System (Beijing: Tsinghua University Press) pp89-103 (in Chinese) [聂春燕 2009 混沌系统与弱信号检测 (北京: 清华大学出版社) 第89–103 页]
[7] Li X L 2005 Chin. J. Appl. Mech. 22 628 (in Chinese) [李香莲 2005 应用力学学报 22 628]
[8] Wang Y S, Xiao Z C, Sun J, Fan H D 2008 J. Circuits Syst. 13 132 (in Chinese) [王永生, 肖子才, 孙瑾, 范洪达 2008 电路与系统学报 13 132]
[9] Zhang R B, Chu F H, Ran L, Guo J G 2011 The 19th International Conference on Computers in Education, ICCE 2011 Chiang Mai, Thailand, November 28-December 2, 2011 p417
[10] Hu W J, Liu Z Z, Li Z H 2011 Electronics and Signal Processing (Berlin: Springer-Verlag) p831
[11] Zhao W L, Huang Z Q, Zhao J X 2011 J. Circuits Syst. 16 120 (in Chinese) [赵文礼, 黄振强, 赵景晓 2011 电路与系统学报 16 120]
[12] Lu T X, Zhang J Q 2010 Introduction to Nonlinear Physics (Hefei: University of Science and Technology of China Press) pp109-136 (in Chinese) [陆同兴, 张季谦 2010 非线性物理概论 (合肥: 中国科学技术大学出版社) 第109–136页]
[13] Li Y, Yang B J 2004 The Detecting Theory of Chaotic Oscillators (Shanghai: The Electronics Industry Publishing House) pp64-68 (in Chinese) [李月, 杨宝俊 2004 混沌振子检测引论 (上海: 电子工业出版社) 第64–68页]
[14] Wang Y S, Jiang W Z, Zhao J J, Fan H D 2008 Acta Phys. Sin. 57 2053 (in Chinese) [王永生, 姜文志, 赵建军, 范洪达 2008 57 2053]
[15] Xie T, Wei X Y 2008 Chin. J. Sci. Instrum. 29 1265 (in Chinese) [谢涛, 魏学业 2008 仪器仪表学报 29 1265]
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