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The transmission and absorption spectra of the Te/TeO2-SiO2 thin film were obtained by using a spectrophotometer, with the surface plasmon rensoance (SPR) observed at 480 nm. While the dependence of the third-order nonlinear susceptibility of composite films on the Te particle was investigated by Z-scan technique with renosant wavelength (532 nm) and non-renosant wavelength (1064 nm). Optical properties of these films was analyzed using the effective medium theory, and the relationship was investigated to obtain Te particle size and nonlinear optical properties of Te/TeO2-SiO2 films. The results show that the Te particle size was smaller, the number of particles was increased, and the particle distribution tends to be uniform. The surface plasmon resonance peak was red-shifted, and the absorption intensity was enhanced; and the third-order nonlinear optical effects was enhanced, χ(3) was increased by 5.12×10-7 esu at 1064 nm to 8.11×10-7 esu at 532 nm with preparation potential increased.
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Keywords:
- tellurium /
- teO2 /
- composite films /
- nonlinear optics
[1] Ricard D, Roussignol P, Flytzanis C 1985 Opt. Lett. 10 511
[2] Zhu B H, Wang F F, Zhang K 2007 Acta Phys. Sin. 56 4024 (in Chinese) [朱宝华, 王芳芳, 张琨 2007 56 4024]
[3] Yang G, Chen Z H 2007 Acta Phys. Sin. 56 1182 (in Chinese) [杨光, 陈正豪 2007 56 1182]
[4] Cotter D, Burt M G, Manning R J 1992 Phys. Rev. Lett. 68 1200
[5] Kim S H, Yoko T, Sakka S 1993 J. Am. Ceram. Soc. 76 2486
[6] Jeansannetas B, Blanchandin S, Thomas P 1999 Journal of Solid State Chemistry 146 329
[7] Franco D'Amore, Massimo Di Giulio 2003 J. Appl. Phys. 94 1654
[8] Li Q, Gu M, Du Y G 2012 Acta Chim. Sin. 70 572 (in Chinese) [李强, 辜敏, 杜云贵, 鲜晓东 2012 化学学报 70 572]
[9] Gan P, Gu M, Li Q, Xian X D 2011 Journal of Inorganic Materials 26 295 (in Chinese) [甘平, 辜敏, 李强, 鲜晓东 2011 无机材料学报 26 295]
[10] Sun Z Q, Sun D M 2002 Chin. Phys. Lett. 19 1365
[11] Yang G, Chen Z H 2006 Acta Phys. Sin. 55 4342 (in Chinese) [杨光, 陈正豪 2006 55 4342]
[12] Kresin V V 1995 Phys. Rev. B 51 1844
[13] Chen W, Cai W P, Wang G Z, Zhang L D 2001 Appl. Surf. Sci. 174 51
[14] Newport Corporation. Application Note 34: Z-Scan for the Characterization of Transparent Optical Materials 2007
[15] Li Q 2011 Ph. D. Dissertation (Chongqing: Chongqing University) (in Chinese) [李强 2011 博士学位论文 (重庆: 重庆大学)]
[16] Hal D K 1976 J. Mater. Sci. 11 2105
[17] Swanepoel R 1983 J. Phys. E: Sci. Instrum. 16 1214
[18] Marquez E, Ramirez-Malo J B, Villares P, Jimenez-Garay R 1995 Thin Solid Films 254 83
[19] Weast R C, Lide D R, Astle M J, Beyer W H 2000 CRC Handbook of Chemistry and Physics (Florida: CRC Press) Section 12 150
[20] Sheik-Bahae M, Said A A, Wei T H 1990 Journal of Quantum Electronics 26 760
[21] Yin M, Li H P, Ji W 2000 Appl. Phys. B 70 587
[22] Zhu B H, Wang F F, Zhang K 2008 Acta Phys. Sin. 57 3085 (in Chinese) [朱宝华, 王芳芳, 张琨 2008 57 3085]
[23] Hache F, Ricard D, Flytzanis C 1986 J. Opt. Sot. Am. B 3 1647
[24] Fukumi K, Chayahara A, Kadono K, Sakaguchi T, Horino Y, Miya M, Fujii K, Hayakawa J, Satou M 1994 J. Appl. Phys. 75 3075
[25] Maxwell Garnett J C, Philos 1904 Trans. R. Soc. (London) 203 385
[26] Hosoya Y, Suga T, Yanagawa T, Kurokawa Y 1997 J. Appl. Phys. 81 1475
[27] Zhang Y, Zhang B P, Jiao L S 2006 Acta Phys. Sin. 55 2078 (in Chinese) [张芸, 张波萍, 焦力实 2006 55 2078]
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[1] Ricard D, Roussignol P, Flytzanis C 1985 Opt. Lett. 10 511
[2] Zhu B H, Wang F F, Zhang K 2007 Acta Phys. Sin. 56 4024 (in Chinese) [朱宝华, 王芳芳, 张琨 2007 56 4024]
[3] Yang G, Chen Z H 2007 Acta Phys. Sin. 56 1182 (in Chinese) [杨光, 陈正豪 2007 56 1182]
[4] Cotter D, Burt M G, Manning R J 1992 Phys. Rev. Lett. 68 1200
[5] Kim S H, Yoko T, Sakka S 1993 J. Am. Ceram. Soc. 76 2486
[6] Jeansannetas B, Blanchandin S, Thomas P 1999 Journal of Solid State Chemistry 146 329
[7] Franco D'Amore, Massimo Di Giulio 2003 J. Appl. Phys. 94 1654
[8] Li Q, Gu M, Du Y G 2012 Acta Chim. Sin. 70 572 (in Chinese) [李强, 辜敏, 杜云贵, 鲜晓东 2012 化学学报 70 572]
[9] Gan P, Gu M, Li Q, Xian X D 2011 Journal of Inorganic Materials 26 295 (in Chinese) [甘平, 辜敏, 李强, 鲜晓东 2011 无机材料学报 26 295]
[10] Sun Z Q, Sun D M 2002 Chin. Phys. Lett. 19 1365
[11] Yang G, Chen Z H 2006 Acta Phys. Sin. 55 4342 (in Chinese) [杨光, 陈正豪 2006 55 4342]
[12] Kresin V V 1995 Phys. Rev. B 51 1844
[13] Chen W, Cai W P, Wang G Z, Zhang L D 2001 Appl. Surf. Sci. 174 51
[14] Newport Corporation. Application Note 34: Z-Scan for the Characterization of Transparent Optical Materials 2007
[15] Li Q 2011 Ph. D. Dissertation (Chongqing: Chongqing University) (in Chinese) [李强 2011 博士学位论文 (重庆: 重庆大学)]
[16] Hal D K 1976 J. Mater. Sci. 11 2105
[17] Swanepoel R 1983 J. Phys. E: Sci. Instrum. 16 1214
[18] Marquez E, Ramirez-Malo J B, Villares P, Jimenez-Garay R 1995 Thin Solid Films 254 83
[19] Weast R C, Lide D R, Astle M J, Beyer W H 2000 CRC Handbook of Chemistry and Physics (Florida: CRC Press) Section 12 150
[20] Sheik-Bahae M, Said A A, Wei T H 1990 Journal of Quantum Electronics 26 760
[21] Yin M, Li H P, Ji W 2000 Appl. Phys. B 70 587
[22] Zhu B H, Wang F F, Zhang K 2008 Acta Phys. Sin. 57 3085 (in Chinese) [朱宝华, 王芳芳, 张琨 2008 57 3085]
[23] Hache F, Ricard D, Flytzanis C 1986 J. Opt. Sot. Am. B 3 1647
[24] Fukumi K, Chayahara A, Kadono K, Sakaguchi T, Horino Y, Miya M, Fujii K, Hayakawa J, Satou M 1994 J. Appl. Phys. 75 3075
[25] Maxwell Garnett J C, Philos 1904 Trans. R. Soc. (London) 203 385
[26] Hosoya Y, Suga T, Yanagawa T, Kurokawa Y 1997 J. Appl. Phys. 81 1475
[27] Zhang Y, Zhang B P, Jiao L S 2006 Acta Phys. Sin. 55 2078 (in Chinese) [张芸, 张波萍, 焦力实 2006 55 2078]
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