Analysis and evaluation on the noise of novel polarization interference imaging spectrometer

Zhang Chun-Min; Huang Wei-Jian; Zhao Bao-Chang

doi:10.7498/aps.59.5479

Abstract

The principle of home-designed novel polarization interference imaging spectrometer is discussed. The noise of novel polarization interference imaging spectrometer is analyzed, and the expression of total noise related to system throughput is deduced. The noise induced by imaging spectrometer system and CCD image sensor is extracted from spectrometer image. The signal-to-noise ratio of novel polarization interference imaging spectrometer based on such noise analyses is discussed, which proves that though luminous throughput of imaging spectrometer system has a crucial effect on the total noise, it does not affect the trend of variation in signal-to-noise ratio. A new practical guidance is thereby provided for the accurate calculation of the signal-to-noise ratio of imaging interference and the application of denoising method effectively.

Keywords:

polarization interference imaging spectrometer /
CCD image sensor /
noises /
signal-to-noise ratio

Authors and contacts

1.
School of Science, Xi'an Jiaotong University, Non-equilibrium Condensed Matter and Quantum Engineering Laboratory, Xi'an 710049, China

References

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[9]	Zhang C M, Xiangli B, Zhao B C 2004 J. Opt. A: Pure Appl. Opt. 6 815
[10]	Zhang C M, Zhao B C, Xiangli B 2004 Appl.Opt. 43 6090
[11]	Zhang C M, Zhao B C, Yuan Yan, He J 2006 Proc. SPIE 6032 T320
[12]	Zhang C M, Zhao B C, Xiangli B, Li Y C ,Peng Z H 2006 Proc.SPIE 6150 15001
[13]	Wu L, Zhang C M, Zhao B C 2007 Opt. Commun. 273 67
[14]	Zhan C M, Jian X H 2010 Opt. Lett. 35 366
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[16]	Zhang C M, Zhao B C, Li Y C, Ye J Y 2007 Proc. SPIE 6279 D2791
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[22]	Zhang C M, Zhu L Y, Zhao B C 2010 Acta Phys. Sin. 59 989 (in Chinese)[张淳民、朱兰艳、赵葆常 2010 59 989]
[23]	Jian X H, Zhang C M, Zhao B C, Zhu B H 2008 Opt. Commun. 281 2424
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[28]	Mu T K, Zhang C M, Zhao B C 2009 Appl.Opt. 48 2333
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[33]	Li Z J, Xiong Y S, Liu Z L, Yao K L 1997 Chin. Phys. 6 731
[34]	Xiao J B, Sun X H 2006 Chin. Phys.15 1824
[35]	Wang Y H, Guo L X, Wu Q 2006 Chin. Phys.15 1754
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[37]	Wang S H, Hu M F, Chen Z P 2007 Semi. Opto. 28 731(in Chinese)[王书宏、胡谋法、陈曾平 2007 半导体光电 28 731]
[38]	Hilda F, James M 2006 IEEE Transactions on Image Processing 15 2676
[39]	Ma J T, Li Y J, Hao X J 2001 J. of North China Inst. of Tech. 22 83(in Chinese)[马俊婷、李仰军、郝晓剑 2001 华北工学院学报 22 83]
[40]	Tong S F, Ruan J, Hao Z H 2000 Opt. Prec. Eng. 8 140(in Chinese)[佟首峰、阮锦、郝志航 2000 光学精密工程 8 140]
[41]	Irie K, Mckinnon A E, Unsworth K, Woodhead I M 2008 Meas. Sci. Technol. 19 045207
[42]	Janesick J R 2001 Scientific Charge-Coupled Devices. (Bellingham, WA:SPIE)
[43]	Kostowski H J 1997 Reliable Spectroradiometry p276
[44]	Junttila M L, Kauppinen J, Ikonen E 1991 J .Opt .Soc. Am. A 8 1457
[45]	Zhang C M, Ren W Y, Ting K M 2010 Chin. Phys. B 19 024202
[46]	Masiero J, Hodapp K, Harrington D, Lin H 2007 The Publications of the Astronomical Society of the Pacific 119 1126
[47]	Eklum L R 1995 Int . Remote Sensing 15 2955

Cited By

[1]	Justice, C O, Vermote, E, Townshenel J R G, Defries R, Roy D P, Hall D K 1998 Geoscience and Remote Sensing 36 1228
[2]	Rast M, Bezy J L 1999 Inter. J. Remote Sens. 20 1681
[3]	Cutter, Mike A, Johns, Lisa S, Lobb, Dan R, Williams T L, Settle J J 2004 Imaging Spec. IX. , Proc. SPIE 5159 392
[4]	Zhang C M, He J 2006 Optics Express 14 12561
[5]	Zhang C M, Zhao B C, Xiangli B 2006 OPTIK 117 265
[6]	Zhang C M, Xiangli B, Zhao B C 2000 Proc. SPIE 4087 957
[7]	Zhang C M, Xiangli B, Zhao B C, Yuan X J 2002 Opt. Commun 203 21
[8]	Zhang C M, Zhao B C, Xiangli B 2003 Opt. Commun. 227 221
[9]	Zhang C M, Xiangli B, Zhao B C 2004 J. Opt. A: Pure Appl. Opt. 6 815
[10]	Zhang C M, Zhao B C, Xiangli B 2004 Appl.Opt. 43 6090
[11]	Zhang C M, Zhao B C, Yuan Yan, He J 2006 Proc. SPIE 6032 T320
[12]	Zhang C M, Zhao B C, Xiangli B, Li Y C ,Peng Z H 2006 Proc.SPIE 6150 15001
[13]	Wu L, Zhang C M, Zhao B C 2007 Opt. Commun. 273 67
[14]	Zhan C M, Jian X H 2010 Opt. Lett. 35 366
[15]	Zhang C M, Yuan Z L, Sun M Z, Wu J F, Gao P 2010 Appl. Opt. 49 281
[16]	Zhang C M, Zhao B C, Li Y C, Ye J Y 2007 Proc. SPIE 6279 D2791
[17]	Zhang C M, Zhao B C, Yuan Z L, Huang W J 2009 J. Opt. A: Pure Appl. Opt. 11 085401
[18]	Ren W Y, Zhang C M, Mu T K 2009 Chin. Phys. Lett. 26 084209
[19]	Zhang C M, Sun M Z, Yuan Z L, Song X P 2009 Acta Phys. Sin. 58 1758(in Chinese)[张淳民、孙明昭、袁志林、宋晓平 2009 58 1758]
[20]	Zhang C M, Yan X G, Zhao B C 2008 Opt. Commun. 281 2050
[21]	Zhang C M, Liu N, Wu F Q 2010 Acta Phys. Sin. 59 949 (in Chinese)[张淳民、刘宁、吴福全 2010 59 949]
[22]	Zhang C M, Zhu L Y, Zhao B C 2010 Acta Phys. Sin. 59 989 (in Chinese)[张淳民、朱兰艳、赵葆常 2010 59 989]
[23]	Jian X H, Zhang C M, Zhao B C, Zhu B H 2008 Opt. Commun. 281 2424
[24]	Jian X H, Zhang C M, Zhu B H, Zhao B C, Du J 2008 Acta Phys. Sin. 57 7565(in Chinese) [简小华、张淳民、祝宝辉 2008 57 7565]
[25]	Du J, Zhang C M, Zhao B C, Sun Y 2008 Acta Phys. Sin. 57 6311(in Chinese)[杜娟、张淳民、赵葆常、孙尧 2008 57 6311]
[26]	Wu H Y, Zhang C M, Zhao B C 2008 Acta Phys. Sin. 57 3499(in Chinese) [吴海英、张淳民、赵葆常2008 57 3499]
[27]	Mu T K, Zhang C M, Zhao B C 2009 Acta Phys. Sin. 58 3877(in Chinese) [穆廷魁、张淳民、赵葆常2009 58 3877]
[28]	Mu T K, Zhang C M, Zhao B C 2009 Appl.Opt. 48 2333
[29]	Mu T K, Zhang C M, Zhao B C 2009 Opt. Commun. 282 1984
[30]	Mu T K, Zhang C M, Zhao B C 2009 Opt. Commun. 282 1699
[31]	Rafert J B, Sellar R G, Blatt J H 1995 A ppl. Opt. 34 7228
[32]	Li Y Z, Shi Q F, Wang Q 2006 Acta Phys. Sin. 55 1119( in Chinese) [李运周、史庆藩、王琪 2006 55 1119]
[33]	Li Z J, Xiong Y S, Liu Z L, Yao K L 1997 Chin. Phys. 6 731
[34]	Xiao J B, Sun X H 2006 Chin. Phys.15 1824
[35]	Wang Y H, Guo L X, Wu Q 2006 Chin. Phys.15 1754
[36]	Jens N, Michael S, Andreas N 1999 Appl. Opt . 38 5191
[37]	Wang S H, Hu M F, Chen Z P 2007 Semi. Opto. 28 731(in Chinese)[王书宏、胡谋法、陈曾平 2007 半导体光电 28 731]
[38]	Hilda F, James M 2006 IEEE Transactions on Image Processing 15 2676
[39]	Ma J T, Li Y J, Hao X J 2001 J. of North China Inst. of Tech. 22 83(in Chinese)[马俊婷、李仰军、郝晓剑 2001 华北工学院学报 22 83]
[40]	Tong S F, Ruan J, Hao Z H 2000 Opt. Prec. Eng. 8 140(in Chinese)[佟首峰、阮锦、郝志航 2000 光学精密工程 8 140]
[41]	Irie K, Mckinnon A E, Unsworth K, Woodhead I M 2008 Meas. Sci. Technol. 19 045207
[42]	Janesick J R 2001 Scientific Charge-Coupled Devices. (Bellingham, WA:SPIE)
[43]	Kostowski H J 1997 Reliable Spectroradiometry p276
[44]	Junttila M L, Kauppinen J, Ikonen E 1991 J .Opt .Soc. Am. A 8 1457
[45]	Zhang C M, Ren W Y, Ting K M 2010 Chin. Phys. B 19 024202
[46]	Masiero J, Hodapp K, Harrington D, Lin H 2007 The Publications of the Astronomical Society of the Pacific 119 1126
[47]	Eklum L R 1995 Int . Remote Sensing 15 2955

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Vol. 59, Issue 8 - 2010-04-20

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