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将纳米碳化硅填加到硅橡胶中,可以获得具有非线性电导特性的纳米碳化硅/硅橡胶复合物. 本文研究了质量分数分别为5 wt%,15 wt%,30 wt%,45 wt%的纳米碳化硅/硅橡胶复合物的非线性电导特性,建立了电导率与场强的函数关系,分析了复合物的非线性电导机理,并测试了复合物的介电谱特性和击穿特性. 为了探讨非线性碳化硅/硅橡胶复合物应用于电缆终端和复合绝缘子以均匀其电场分布的可能性,应用COMSOL Multiphysics软件,对电缆终端和复合绝缘子中的电场分布进行了仿真分析. 仿真结果表明,将纳米碳化硅/硅橡胶复合物应用于电缆终端应力锥的绝缘部分,以及应用于复合绝缘子的端部,可以有效地降低其最大场强.
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关键词:
- 纳米碳化硅/硅橡胶复合物 /
- 非线性电导特性 /
- 电场仿真
Nano-silicon carbide/silicone rubber composites with nonlinear conductivity characteristics have been made by mixing nano-sized silicon carbide (SiC) into silicone rubber. In this paper, the nonlinear conductivity characteristics of composites made by mixing 5 wt%, 15 wt%, 30 wt% and 45 wt% of nano-SiC and silicone rubber are investigated. The relationship between conductivity and electric field strength is obtained by experiments. Nonlinear conductivity mechanisms of the composites are analyzed, and their breakdown properties and dielectric spectröscopy characteristics of composites are studied. In order to know the effect of nonlinear SiC/silicone rubber composites on homogenizing electric field, the electric ströss distribution of cables termination and composite insulators are simulated by the COMSOL Multiphysics software. Results show that the maximum electric field strength at cable termination and the end of the composite insulators decreases efficiently when the nano-SiC/silicone rubber composites are used.-
Keywords:
- nano-SiC/silicone rubber composites /
- nonlinear conductivity characteristics /
- electric field simulation
[1] Lewis T J 1994 IEEE Trans. on DEI. 1 812
[2] Frechette M F, Trudeau M, Alamdari H D, Boily S 2001 Annual Report Conference on Electrical Insulation and Dielectric Phenomena Kitchener, Ontario, Canada, October 14-17, 2001 p92
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[5] Irwin P C, Cao Y, bansal A, Schadler L S 2003 Annual Report Conference on Electrical Insulation and Dielectric Phenomena, Albuquerque, NM, USA, October 19-22, 2003 p120
[6] Castellon J, Nguyen H N, Agnel S, Toureille A, Frechette M, Savoie S, Krivda A, Schmidt L E 2011 IEEE Trans. on DEI 18 651
[7] Yue L, Wu Y, Sun C, Shi Y, Xiao J, and He S 2013 Chin. Phys. B 22 076103
[8] Wang X, Nelson J K, Schadler L S 2010 IEEE Trans. on DEI 17 1687
[9] Vanga-Bouanga C, Frechette M, David E 2013 IEEE Trans. on DEI 20 1453
[10] Bouanga C V, Savoie S, Frechette M F, Couderc H, David E 2012 Conference Record of the 2012 IEEE International Symposium on Electrical Insulation, San Juan, Puerto Rico June 10-13, 2012 p43
[11] Ma K, Li H, Zhang H, Xu X, Gong M, Yang Z 2009 Chin. Phys. B 18 1942
[12] Guo W M 2010 Ph. D. Dissertation (Harbin: Harbin University of Science and Technology) (in Chinese) [郭文敏 2010 博士学位论文(哈尔滨: 哈尔滨理工大学)]
[13] Jože Furlan 2003 J. Appl. Phys. 94 7604
[14] Mizutani T 2006 Annual Report Conference on Electrical Insulation and Dielectric Phenomena, Kansas, MO, USA, October 15-18, 2006 p10
[15] Jing X, Zhao W, Lan L 2000 J. Mater. Sci. Lett. 19 377
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[1] Lewis T J 1994 IEEE Trans. on DEI. 1 812
[2] Frechette M F, Trudeau M, Alamdari H D, Boily S 2001 Annual Report Conference on Electrical Insulation and Dielectric Phenomena Kitchener, Ontario, Canada, October 14-17, 2001 p92
[3] Nelson J K, Fothergill J C, Dissado L A, Peasgood W 2002 Annual Report Conference on Electrical Insulation and Dielectric Phenomena, Cancun, Quintana Roo, Mexico, October 20-24, 2002 p295
[4] Nelson J K, Fothergil J C 2004 Nanotechnology 15 586
[5] Irwin P C, Cao Y, bansal A, Schadler L S 2003 Annual Report Conference on Electrical Insulation and Dielectric Phenomena, Albuquerque, NM, USA, October 19-22, 2003 p120
[6] Castellon J, Nguyen H N, Agnel S, Toureille A, Frechette M, Savoie S, Krivda A, Schmidt L E 2011 IEEE Trans. on DEI 18 651
[7] Yue L, Wu Y, Sun C, Shi Y, Xiao J, and He S 2013 Chin. Phys. B 22 076103
[8] Wang X, Nelson J K, Schadler L S 2010 IEEE Trans. on DEI 17 1687
[9] Vanga-Bouanga C, Frechette M, David E 2013 IEEE Trans. on DEI 20 1453
[10] Bouanga C V, Savoie S, Frechette M F, Couderc H, David E 2012 Conference Record of the 2012 IEEE International Symposium on Electrical Insulation, San Juan, Puerto Rico June 10-13, 2012 p43
[11] Ma K, Li H, Zhang H, Xu X, Gong M, Yang Z 2009 Chin. Phys. B 18 1942
[12] Guo W M 2010 Ph. D. Dissertation (Harbin: Harbin University of Science and Technology) (in Chinese) [郭文敏 2010 博士学位论文(哈尔滨: 哈尔滨理工大学)]
[13] Jože Furlan 2003 J. Appl. Phys. 94 7604
[14] Mizutani T 2006 Annual Report Conference on Electrical Insulation and Dielectric Phenomena, Kansas, MO, USA, October 15-18, 2006 p10
[15] Jing X, Zhao W, Lan L 2000 J. Mater. Sci. Lett. 19 377
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