-
为解决小孔点衍射干涉仪构建中,显微物镜汇聚光斑与衍射小孔之间对准误差对波前误差、衍射强度、干涉条纹对比度产生影响,而导致实际测量精度降低的问题,本文提出一种衍射小孔可视对准方法,借助CCD和分光棱镜在小孔衍射前端搭建辅助对准光路,通过对小孔衍射板反射图像进行采集及处理来监测小孔对准状态并计算对准误差。文中设计了可视精密对准光路方案,仿真分析了平移、倾斜以及离焦三种典型对准偏差下对准图像的视觉表现,构建了对准图像与对准误差之间物像关系数学模型,研究了对准图像处理算法。经原理性验证实验表明,本文所提辅助光路对准方法和对准图像处理算法可行,对准精度可达到0.05μm。研究成果有利于提高点衍射干涉仪的对准效率和精度,可为实用点衍射干涉仪开发奠定一定的技术基础。In the construction of the pinhole point diffraction interferometer, the alignment error between the convergent spot of the microscopic objective lens and the diffraction hole in the front end of the pinhole diffraction will lead to problems such as diffraction wavefront error, diffraction intensity reduction, and interference fringe contrast reduction, which will affect the actual measurement accuracy. In order to solve the problem of inaccurate alignment between the convergent spot of the microscopic objective lens and the diffraction hole, this paper proposes a diffraction hole visual alignment method based on the auxiliary optical path. An auxiliary alignment optical path is built at the front end of the pinhole diffraction, and the beam reflected by the pinhole diffraction plate is mainly reflected by the beam splitter prism, and then received by the CCD. By collecting and processing the spot image reflected by the small hole diffraction plate, the alignment state of the small hole is monitored and the alignment error is calculated.In this paper, a visual precision alignment optical path scheme is designed, and the visual performance of the alignment image under three typical alignment deviations of translation, tilt and defocus is simulated and analyzed. The mathematical model of the object-image relationship between the alignment image and the alignment error is constructed, and the alignment image error measurement and processing algorithm is studied. The experimental results show that the auxiliary optical path alignment method and the alignment image processing algorithm proposed in this paper are feasible, and the alignment accuracy can reach 0.05μm. The research results are helpful to improve the alignment efficiency and accuracy of point diffraction interferometer, and can lay a certain technical foundation for the development of practical point diffraction interferometer.
-
Keywords:
- Point diffraction interferometer /
- Diffraction pinhole /
- Visual alignment /
- Alignment error
-
[1] Patrick P N, Kenneth A G, Sang H L 1999Appl. Opt. 38 7252
[2] Wang T M, Gao F, Li B 2024Opt. Precision Eng. 32 208(in Chinese) [王同盟, 高芬, 李兵2024光学精密工程32 208]
[3] Zhang J P, Gao F, Li B 2022Acta Photonica Sin. 51 256(in Chinese) [张金鹏, 高芬, 李兵2022光子学报51 256]
[4] Shan M G, Yin Z Y, Zhong Z, Liu B, Yu L, Liu L 2024Phys. Scripta 99 065118
[5] Zheng D H, Ma Z Y, Zhang Z, Hu C H 2023Appl. Opt. 62 745
[6] Yang X, Guo R H, Tang X, Yin Zhiyao, Liu C X, Li J X 2021Appl. Opt. 60 10988
[7] Mao S S, Li Y Q, Liu K, Liu L H, Zheng M, Yan X 2019Infrared Laser Eng. 48 178(in Chinese) [毛姗姗, 李艳秋, 刘克, 刘丽辉, 郑猛, 闫旭2019红外与激光工程48 178]
[8] Zhang Y, Jin C S, Ma D M, Wang L P 2012Infrared Laser Eng. 41 3384(in Chinese) [张宇, 金春水, 马冬梅, 王丽萍2012红外与激光工程41 3384]
[9] Feng P, Tang F, Wang X Z, Lu Y J, Xu J H, Guo F D, Zhang G X 2020Appl. Opt. 59 3093
[10] Zheng D H, Li J P, Chen L, Zhu W H, Han Z G, Wulan T Y, Guo R H 2016Acta Phys. Sin. 65128(in Chinese) [郑东晖, 李金鹏, 陈磊, 朱文华, 韩志刚, 乌兰图雅, 郭仁慧2016 65 128]
[11] Nicolás D, Ali N B, Marc D, M R M 2022Appl. Opt. 61 4160
[12] Lu J S, Li B, Zhao Z, Geng L Q 2022Opt. Lett. 474877
[13] Smartt R N, Steel W H 1985Appl. Opt. 24 1402
[14] Otaki K, Yamamoto T, Fukud Y, Ota K, Nishiyama I, Okazaki S 2002J. Vac. Sci. Technol. B 20 295
[15] Lu Y W, Luo Y J, Liu W, Kong M, Wang D D 2023Infrared Laser Eng. 52 258(in Chinese) [卢毅伟, 骆永洁, 刘维, 孔明, 王道档2023红外与激光工程52 258]
[16] Sun Y, Shen H, Li X, Li J, Gao J M, Zhu R H 2019Appl. Opt. 58 1253
[17] Feng P, Li Z L, Wang X C, Bu Y, Lu Y J, Guo D F, Li S K 2022Chin. Opt. Lett. 49 90(in Chinese) [冯鹏, 李中梁, 王向朝, 步扬, 卢云君, 郭福东, 李思坤2022中国激光49 90]
[18] Gao F, Jiang Z D, Zhao Z, Li B 2015 Opt. Eng. 54 014102
[19] Geng L Q, Li B, Zhao Z, Lu J S 2024Opt. Laser Eng. 178108198
[20] Ota K, Yamamoto T, Fukuda Y, Otaki K, Nishiyama I, Okazaki S 2001ASET(Japan) 43 543
[21] Zhao Z, Li B, Kang X Q, Chen L, Wei X 2019Appl. Opt. 58 3703
[22] Gao F, Jiang Z D, Li B 2014Acta Opt. Sin. 34173(in Chinese) [高芬, 蒋庄德, 李兵2014光学学报34 173]
计量
- 文章访问数: 74
- PDF下载量: 7
- 被引次数: 0