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为了进一步深入了解超高功率光纤激光深熔焊接过程中等离子体特征,试验拍摄了深熔小孔内外等离子体形态,并采用光谱仪检测分析了光纤激光致等离子体光谱信号. 利用检测得到的等离子体光谱信号,计算研究了等离子体的电子温度、电子密度、电离度以及等离子体压力特征,并分析了在小孔内不同深度处及孔外等离子体的变化规律. 结果表明,孔内等离子体呈现不均匀分布特征,孔外金属蒸气远多于等离子体. 等离子体光谱分析显示,光纤激光致等离子体辐射出的谱线较少,即电离程度较低. 进一步的计算结果同样证实了光纤激光致等离子体处于弱电离状态,但等离子体电子密度仍然处于较高水平,且等离子体瞬态压力可达到数百个大气压.In order to understand in depth plasma behavior during ultra-high power fiber laser deep penetration welding, the plasma inside and outside the keyhole is observed, and the spectrum of fiber laser-induced plasma is measured and analyzed. Based on the measured data of plasma, the electron temperature and electron density, ionization degree and pressure are calculated, and the characteristics of plasma parameters at different values of keyhole depth and outside the keyhole are investigated. The results indicate that the distribution of plasma inside the keyhole is uneven, and the vapor plume is much bigger outside the keyhole. The spectrum of plasma show that the fiber laser-induced plasma is weakly ionized and radiates a few spectral lines. The further calculation results also confirm that the plasma induced by fiber laser is in a weakly ionized state. However, the electron density of plasma still stays in a high level, and the transient pressure of plasma is up to hundreds of times as large as atmospheric pressure.
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Keywords:
- fiber laser /
- deep penetration welding /
- plasma /
- pressure
[1] Tang X H, Zhu H H, Zhu G F, Li S M 2000 China Mech. Eng. 11 741 (in Chinese) [唐霞辉, 朱海红, 朱国富, 李适民 2000 中国机械工程 11 741]
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[7] Kawahito Y, Matsumoto N, Mizutani M, Katayama S 2008 Sci. Technol. Weld. Joining 13 744
[8] Kulish M, Fertman A, Golubev A, Tauschwitz A, Turtikov V 2011 Rev. Sci. Instrum. 72 2294
[9] Bedenko D V, Kovalev O B, Krivtsun I V 2010 J. Phys. D: Appl. Phys. 43 105501
[10] Fuerschbach P W, Norris J T, He X, DebRoy T 2003 Understanding Metal Vaporization from Laser Welding (Albuquerque: Sandia National Laboratories) p69
[11] Griem H R 1964 Plasma Spectroscopy (New York: McGraw-Hill) p580
[12] Lacroix D, Jeandel G, Boudot C 1997 J. Appl. Phys. 81 6599
[13] Ribic B, Burgardt P, DebRoy T 2011 J. Appl. Phys. 109 083301
[14] Konjević N, Dimitrijević M S, Wiese W L 1984 J. Phys. Chem. Ref. Data 13 619
[15] Jin X Z 2002 Ph. D. Dissertation (Changsha: Hunan University) (in Chinese) [金湘中 2002 博士学位论文 (长沙: 湖南大学)]
[16] Sibillano T, Rizzi D, Ancona A, Saludes-Rodil S, Nieto J R, Chmelíčková H, Šebestová H 2012 J. Mater. Process. Technol. 212 910
[17] Rizzi D, Sibillano T, Calabrese P P, Ancona A, Lugará P M 2011 Opt. Laser Eng. 49 892
[18] National Institute of Standards and Technology 2013 Atomic Spectra Database Lines Form (Gaithersberg: National Institute of Standards and Technology)
[19] Lu J Y, Wang J, Ma Y G, Chen B 2004 Opt. Precis. Eng. 12 550 (in Chinese) [鲁建业, 王军, 马玉刚, 陈波 2004 光学精密工程 12 550]
[20] Li S X, Bai Z C, Huang Z, Zhang X, Qin S J, Mao W X 2012 Acta Phys. Sin. 61 115201 (in Chinese) [李世雄, 白忠臣, 黄政, 张欣, 秦水介, 毛文雪 2012 61 115201]
[21] Wang Y N, Liu Y, Zheng S, Lin G Q 2012 Chin. Phys. B 21 075202
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[1] Tang X H, Zhu H H, Zhu G F, Li S M 2000 China Mech. Eng. 11 741 (in Chinese) [唐霞辉, 朱海红, 朱国富, 李适民 2000 中国机械工程 11 741]
[2] Su Y D 2000 China Mech. Eng. 11 1389 (in Chinese) [苏彦东 2000 中国机械工程 11 1389]
[3] Zhang Y, Chen G Y, Li L J 2008 Manuf. Technol. Machine Tool 3 98 (in Chinese)[张屹, 陈根余, 李力钧 2008 制造技术与机床 3 98]
[4] Zhao Q, Wu Q B, Wang W 2006 Infrared Laser Eng. 35(S3) 70 (in Chinese) [赵强, 吴清彬, 王伟 2006 红外与激光工程 35(S3) 70]
[5] Zhang Y, Li L J, Zhang G 2005 J. Phys. D: Appl. Phys. 38 703
[6] Greses J, Hilton P A, Barlow C Y, Steen W M 2003 Proceedings International Congress on Applications of Lasers and Electro-Optics (Orlando: Laser Institute of America) p546
[7] Kawahito Y, Matsumoto N, Mizutani M, Katayama S 2008 Sci. Technol. Weld. Joining 13 744
[8] Kulish M, Fertman A, Golubev A, Tauschwitz A, Turtikov V 2011 Rev. Sci. Instrum. 72 2294
[9] Bedenko D V, Kovalev O B, Krivtsun I V 2010 J. Phys. D: Appl. Phys. 43 105501
[10] Fuerschbach P W, Norris J T, He X, DebRoy T 2003 Understanding Metal Vaporization from Laser Welding (Albuquerque: Sandia National Laboratories) p69
[11] Griem H R 1964 Plasma Spectroscopy (New York: McGraw-Hill) p580
[12] Lacroix D, Jeandel G, Boudot C 1997 J. Appl. Phys. 81 6599
[13] Ribic B, Burgardt P, DebRoy T 2011 J. Appl. Phys. 109 083301
[14] Konjević N, Dimitrijević M S, Wiese W L 1984 J. Phys. Chem. Ref. Data 13 619
[15] Jin X Z 2002 Ph. D. Dissertation (Changsha: Hunan University) (in Chinese) [金湘中 2002 博士学位论文 (长沙: 湖南大学)]
[16] Sibillano T, Rizzi D, Ancona A, Saludes-Rodil S, Nieto J R, Chmelíčková H, Šebestová H 2012 J. Mater. Process. Technol. 212 910
[17] Rizzi D, Sibillano T, Calabrese P P, Ancona A, Lugará P M 2011 Opt. Laser Eng. 49 892
[18] National Institute of Standards and Technology 2013 Atomic Spectra Database Lines Form (Gaithersberg: National Institute of Standards and Technology)
[19] Lu J Y, Wang J, Ma Y G, Chen B 2004 Opt. Precis. Eng. 12 550 (in Chinese) [鲁建业, 王军, 马玉刚, 陈波 2004 光学精密工程 12 550]
[20] Li S X, Bai Z C, Huang Z, Zhang X, Qin S J, Mao W X 2012 Acta Phys. Sin. 61 115201 (in Chinese) [李世雄, 白忠臣, 黄政, 张欣, 秦水介, 毛文雪 2012 61 115201]
[21] Wang Y N, Liu Y, Zheng S, Lin G Q 2012 Chin. Phys. B 21 075202
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