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Kerr effect is defined as an electro-optical physical phenomenon, in which the testing laser can change its polarization state as passing through a Kerr medium stressed by applied field. In this work, an on-line measurement system based on Kerr effect is established to investigate the surface electric field of insulator stressed by nanosecond HV pulse in vacuum which include a HV pulse source, YAG laser, synchronous controlling apparatus, Kerr cell & insulator sample, optical phase shift detecting subsystem. According to comparison experiments, the distortion of insulator surface electric field caused by surface charging is observed. And a time-resolution measurement on this field distortion is also performed.
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Keywords:
- vacuum insulator /
- surface field /
- on-line measurement /
- Kerr effect
[1] Miller H C 1989 IEEE Trans. Electrical Insulation 24 765
[2] Stern J E, Mercy K R 1971 IEEE Trans. Electrical Insulation EI-6 90
[3] Vlieks A E, Allen M A, Callin R S, Fowkes W R, Hoyt E W, Lebacqz J V, Lee T G 1989 IEEE Trans. Electrical Insulation 24 1023
[4] Wetzer J M 1997 IEEE Trans. Dielectrics and Electrical Insulation 4 349
[5] Li S T, Huang Q F, Sun J, Zhang T, Li J Y 2010 Acta Phys. Sin. 59 422 (in Chinese) [李盛涛, 黄奇峰, 孙健, 张拓, 李建英 2010 59 422]
[6] Zhang G J, Zhao W B, Zheng N, Yu K K, Ma X P, Yan Z 2007 High Voltage Engineering 33 30 (in Chinese) [张冠军, 赵文彬, 郑楠, 于开坤, 马新沛, 严璋2007 高电压技术 33 30]
[7] Anderson R A 1974 Appl. Phys. Lett. 24 54
[8] Blaise G, Gressus C L 1991 J. Appl. Phys. 69 6334
[9] Tumiran, Maeyama M, Imada H, Kobayashi S, Saito Y 1997 IEEE Trans. Dielectrics and Electrical Insulation 4 400
[10] Chalmers I D, Lei J H, Yang B, Siew W H 1995 IEEE Trans. Dielectrics and Electrical Insulation 2 225
[11] Faircloth D C, Allen N L 2003 IEEE Trans. Dielectrics and Electrical Insulation 10 285
[12] Sone M, Toriyama K, Toriyama Y 1974 Appl. Phys. Lett. 24 115
[13] Zahn M 1994 IEEE Trans. Electrical Insulation 1 235
[14] Zhu H L, Liu W L, Zou X B, Wang X X 2011 High Voltage Engineering 37 717 (in Chinse) [朱宏林, 刘微粒, 邹晓兵, 王新新 2011高电压技术 37 717]
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[1] Miller H C 1989 IEEE Trans. Electrical Insulation 24 765
[2] Stern J E, Mercy K R 1971 IEEE Trans. Electrical Insulation EI-6 90
[3] Vlieks A E, Allen M A, Callin R S, Fowkes W R, Hoyt E W, Lebacqz J V, Lee T G 1989 IEEE Trans. Electrical Insulation 24 1023
[4] Wetzer J M 1997 IEEE Trans. Dielectrics and Electrical Insulation 4 349
[5] Li S T, Huang Q F, Sun J, Zhang T, Li J Y 2010 Acta Phys. Sin. 59 422 (in Chinese) [李盛涛, 黄奇峰, 孙健, 张拓, 李建英 2010 59 422]
[6] Zhang G J, Zhao W B, Zheng N, Yu K K, Ma X P, Yan Z 2007 High Voltage Engineering 33 30 (in Chinese) [张冠军, 赵文彬, 郑楠, 于开坤, 马新沛, 严璋2007 高电压技术 33 30]
[7] Anderson R A 1974 Appl. Phys. Lett. 24 54
[8] Blaise G, Gressus C L 1991 J. Appl. Phys. 69 6334
[9] Tumiran, Maeyama M, Imada H, Kobayashi S, Saito Y 1997 IEEE Trans. Dielectrics and Electrical Insulation 4 400
[10] Chalmers I D, Lei J H, Yang B, Siew W H 1995 IEEE Trans. Dielectrics and Electrical Insulation 2 225
[11] Faircloth D C, Allen N L 2003 IEEE Trans. Dielectrics and Electrical Insulation 10 285
[12] Sone M, Toriyama K, Toriyama Y 1974 Appl. Phys. Lett. 24 115
[13] Zahn M 1994 IEEE Trans. Electrical Insulation 1 235
[14] Zhu H L, Liu W L, Zou X B, Wang X X 2011 High Voltage Engineering 37 717 (in Chinse) [朱宏林, 刘微粒, 邹晓兵, 王新新 2011高电压技术 37 717]
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