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The single event effect sensitivity of static random access memory(SRAM) under different cumulative dose were carried out using 60Co source and heavy ions. The trend of sensitivity was obtained and the radiation damage mechanism was analyzed theoretically. This investigation shows that the variation in single event upset cross section with increasing accumulated dose appears to be consistent with the radiation-induced leakage current originating in the memory cells that affects the parameters such as low-level hold voltage and high-level fall time and induces con-imprint effect. Results obtained support the reliability analysis of the aerospace devices in space radiation environment.
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Keywords:
- total dose /
- single event upset /
- SRAM /
- con-imprint effect
[1] Zhang K Y, Zhang F Q, Luo Y H, Guo H X 2013 Chin. Phys. B 22 028501
[2] Liu F Y, Liu H Z, Liu B W, Liang B, Chen J J 2011 Acta Phys. Sin. 60 046106 (in Chinese) [刘凡宇, 刘衡竹, 刘必慰, 梁斌, 陈建军 2011 60 046106]
[3] Stassinopoulos E G, Brucker G J, Gunten O V, Kim H S 1989 IEEE Trans. Nucl. Sci. 36 2330
[4] He B P, Ding L L, Yao Z B, Xiao Z G, Huang S Y, Wang Z J 2011 Acta Phys. Sin. 60 056105 (in Chinese) [何宝平, 丁李利, 姚志斌, 肖志刚, 黄绍燕, 王祖军 2011 60 056105]
[5] Campbell A B, Stapor W J 1984 IEEE Trans.Nucl. Sci. 30 4085
[6] Matsukawa T, Kishida A, Tanii T, Koh M, Horita K, Hara K, Shigeta B, Goto M, Matsuda S, Kuboyama S, Ohdomari I 1994IEEE Trans. Nucl. Sci. 41 2071
[7] Schwank J R, Shaneyfelt M R, Felix J A, Doss P E, Baggio J, Ferlet-Cavrois V, Paillet P, Hash G L, Flores R S, Massengill L W, Blackmore E 2006IEEE Trans. Nucl. Sci. 53 1772
[8] Schwank J R, Dodd P E, Shaneyfelt M R, Felix J A, Hash G L, Ferlet-Cavrois V, Paillet P, Baggio J, Tangyunyong P, Blackmore E 2004 IEEE Trans. Nucl. Sci. 51 3692
[9] Koga R, Yu P, Crawford K, George J, Zakrzewski M 2009IEEE Trans. Nucl. Sci. 56 127
[10] Sukhaseum N, Samaras A, Du D L, Vandevelde B, Chatry N, Bezerra F 2012 RADECS Proceedings Data Workshop.
[11] Dodd P E, Schwank J R, Shaneyfelt M R, Ferlet-Cavrois V, Paillet P, Baggio J, Hash G L, Felix J A, Hirose K, Saito H 2007 IEEE Trans. Nucl. Sci. 54 889
[12] Buchner S, Sibley M, Eaton P, Mavis D, McMorrow D 2010 IEEE Trans. Nucl. Sci. 57 1805
[13] Shaneyfelt M R, Schwank J R, Dodd P E, Hash G L, Paillet P, Felix J A, Baggio J, Ferlet-Cavrois V 2006IEEE Trans. Nucl. Sci. 53 3132
[14] Giot D, Roche P, Gasiot G, Autran J L, Harboe-Sørensen R 2008 IEEE Trans. Nucl. Sci. 55 2048
[15] Wang C, Quan S, Ma X H, Hao Y, Zhang J C, Mao W 2010 Acta Phys. Sin. 59 7333 (in Chinese) [王冲, 全思, 马晓华, 郝跃, 张进城, 毛维 2010 59 7333]
[16] Zhang K Y, Guo H X, Luo Y H, He B P, Yao Z B, Zhang F Q, Wang Y M 2009 Acta Phys. Sin. 58 8651 (in Chinese) [张科营, 郭红霞, 罗尹虹, 何宝平, 姚志斌, 张凤祁, 王园明 2009 58 8651]
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[1] Zhang K Y, Zhang F Q, Luo Y H, Guo H X 2013 Chin. Phys. B 22 028501
[2] Liu F Y, Liu H Z, Liu B W, Liang B, Chen J J 2011 Acta Phys. Sin. 60 046106 (in Chinese) [刘凡宇, 刘衡竹, 刘必慰, 梁斌, 陈建军 2011 60 046106]
[3] Stassinopoulos E G, Brucker G J, Gunten O V, Kim H S 1989 IEEE Trans. Nucl. Sci. 36 2330
[4] He B P, Ding L L, Yao Z B, Xiao Z G, Huang S Y, Wang Z J 2011 Acta Phys. Sin. 60 056105 (in Chinese) [何宝平, 丁李利, 姚志斌, 肖志刚, 黄绍燕, 王祖军 2011 60 056105]
[5] Campbell A B, Stapor W J 1984 IEEE Trans.Nucl. Sci. 30 4085
[6] Matsukawa T, Kishida A, Tanii T, Koh M, Horita K, Hara K, Shigeta B, Goto M, Matsuda S, Kuboyama S, Ohdomari I 1994IEEE Trans. Nucl. Sci. 41 2071
[7] Schwank J R, Shaneyfelt M R, Felix J A, Doss P E, Baggio J, Ferlet-Cavrois V, Paillet P, Hash G L, Flores R S, Massengill L W, Blackmore E 2006IEEE Trans. Nucl. Sci. 53 1772
[8] Schwank J R, Dodd P E, Shaneyfelt M R, Felix J A, Hash G L, Ferlet-Cavrois V, Paillet P, Baggio J, Tangyunyong P, Blackmore E 2004 IEEE Trans. Nucl. Sci. 51 3692
[9] Koga R, Yu P, Crawford K, George J, Zakrzewski M 2009IEEE Trans. Nucl. Sci. 56 127
[10] Sukhaseum N, Samaras A, Du D L, Vandevelde B, Chatry N, Bezerra F 2012 RADECS Proceedings Data Workshop.
[11] Dodd P E, Schwank J R, Shaneyfelt M R, Ferlet-Cavrois V, Paillet P, Baggio J, Hash G L, Felix J A, Hirose K, Saito H 2007 IEEE Trans. Nucl. Sci. 54 889
[12] Buchner S, Sibley M, Eaton P, Mavis D, McMorrow D 2010 IEEE Trans. Nucl. Sci. 57 1805
[13] Shaneyfelt M R, Schwank J R, Dodd P E, Hash G L, Paillet P, Felix J A, Baggio J, Ferlet-Cavrois V 2006IEEE Trans. Nucl. Sci. 53 3132
[14] Giot D, Roche P, Gasiot G, Autran J L, Harboe-Sørensen R 2008 IEEE Trans. Nucl. Sci. 55 2048
[15] Wang C, Quan S, Ma X H, Hao Y, Zhang J C, Mao W 2010 Acta Phys. Sin. 59 7333 (in Chinese) [王冲, 全思, 马晓华, 郝跃, 张进城, 毛维 2010 59 7333]
[16] Zhang K Y, Guo H X, Luo Y H, He B P, Yao Z B, Zhang F Q, Wang Y M 2009 Acta Phys. Sin. 58 8651 (in Chinese) [张科营, 郭红霞, 罗尹虹, 何宝平, 姚志斌, 张凤祁, 王园明 2009 58 8651]
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