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Choosing the current of the front inductor of SEPIC converter as controlled object, the resonant parametric perturbation is applied to control the chaos in SEPIC converter. Through the small perturbations of circuit parameter, chaos control of SEPIC converter is realized, and the results are analyzed by the time domain waveform, power spectrum, and bifurcation diagram. Finally, the results of the circuit experiment demonstrate that chaos control of SEPIC converter can be realized by the resonant parametric perturbation method.
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Keywords:
- SEPIC converter /
- chaos /
- chaos control /
- resonant parametric perturbation
[1] Zhou Y F, Chen J N, Xie Z G, Ke D M, Shi L X, Sun W F 2004 Acta Phys. Sin. 53 3676 (in Chinese) [周宇飞, 陈军宁, 谢智刚, 柯导明, 时龙兴, 孙伟锋 2004 53 3676]
[2] Tse C K, Lai Y M, Chow M H L 2000 IEEE conference on Industrial Electronics Society 4 2413
[3] Poddar G, Chakrabarty K, Banerjee S, 1998 IEEE Transactions on Circuits and Systems–I: Fundamental Theory and Applications 45 672
[4] Lu W G, Zhou L w, Lou Q M 2007 Acta Phys. Sin. 56 5648 (in Chinese) [卢伟国, 周雒维, 罗全明 2007 56 5648]
[5] Wang M, Zhou Y F, Jiang W, Chen J N 2009 Electrical Measurement & Instrumentation 46 32 (in Chinese) [汪敏, 周宇飞, 江伟, 陈军宁 2009 电测与仪表 2009 46 32]
[6] Debbat M B, EI Aroudi A, Grial R, Martinez-Salamero L 2002 IEEE International Conference on industrial Technology 2 1055
[7] Liu F, Zhang H 2008 Trans. China Electrotech. Soc. 23 54 (in Chinese) [刘芳, 张浩 2008 电工技术学报 23 54]
[8] Liu F 2008 Chin. Phys. B 17 2394
[9] Wang S B, Zhou Y F, Chen J N, Jiang X D 2008 Proc the CSEE 28 26 (in Chinese) [王诗兵, 周宇飞, 陈军宁, 姜学东 2008 中国电机工程学报 28 26]
[10] Li G L, Li C Y, Chen X Y, Mou X M 2012 Acta Phys. Sinl 61 170506 (in Chinese) [李冠林, 李春阳, 陈希有, 牟宪民 2012 61 170506]
[11] Kavitha A, Indira G, Uma G 2008 IEEE Industry Applications Society Annual Meeting 1–6
[12] Kavitha A, Uma G 2010 International Journal of Control, Automation and Systems 8 1320
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[1] Zhou Y F, Chen J N, Xie Z G, Ke D M, Shi L X, Sun W F 2004 Acta Phys. Sin. 53 3676 (in Chinese) [周宇飞, 陈军宁, 谢智刚, 柯导明, 时龙兴, 孙伟锋 2004 53 3676]
[2] Tse C K, Lai Y M, Chow M H L 2000 IEEE conference on Industrial Electronics Society 4 2413
[3] Poddar G, Chakrabarty K, Banerjee S, 1998 IEEE Transactions on Circuits and Systems–I: Fundamental Theory and Applications 45 672
[4] Lu W G, Zhou L w, Lou Q M 2007 Acta Phys. Sin. 56 5648 (in Chinese) [卢伟国, 周雒维, 罗全明 2007 56 5648]
[5] Wang M, Zhou Y F, Jiang W, Chen J N 2009 Electrical Measurement & Instrumentation 46 32 (in Chinese) [汪敏, 周宇飞, 江伟, 陈军宁 2009 电测与仪表 2009 46 32]
[6] Debbat M B, EI Aroudi A, Grial R, Martinez-Salamero L 2002 IEEE International Conference on industrial Technology 2 1055
[7] Liu F, Zhang H 2008 Trans. China Electrotech. Soc. 23 54 (in Chinese) [刘芳, 张浩 2008 电工技术学报 23 54]
[8] Liu F 2008 Chin. Phys. B 17 2394
[9] Wang S B, Zhou Y F, Chen J N, Jiang X D 2008 Proc the CSEE 28 26 (in Chinese) [王诗兵, 周宇飞, 陈军宁, 姜学东 2008 中国电机工程学报 28 26]
[10] Li G L, Li C Y, Chen X Y, Mou X M 2012 Acta Phys. Sinl 61 170506 (in Chinese) [李冠林, 李春阳, 陈希有, 牟宪民 2012 61 170506]
[11] Kavitha A, Indira G, Uma G 2008 IEEE Industry Applications Society Annual Meeting 1–6
[12] Kavitha A, Uma G 2010 International Journal of Control, Automation and Systems 8 1320
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