2004, 53(6): 1617-1622.
DOI: 10.7498/aps.53.1617
CSTR: 32037.14.aps.53.1617
2004, 53(6): 1623-1628.
DOI: 10.7498/aps.53.1623
CSTR: 32037.14.aps.53.1623
2004, 53(6): 1629-1634.
DOI: 10.7498/aps.53.1629
CSTR: 32037.14.aps.53.1629
2004, 53(6): 1635-1638.
DOI: 10.7498/aps.53.1635
CSTR: 32037.14.aps.53.1635
2004, 53(6): 1639-1642.
DOI: 10.7498/aps.53.1639
CSTR: 32037.14.aps.53.1639
2004, 53(6): 1643-1646.
DOI: 10.7498/aps.53.1643
CSTR: 32037.14.aps.53.1643
2004, 53(6): 1647-1651.
DOI: 10.7498/aps.53.1647
CSTR: 32037.14.aps.53.1647
2004, 53(6): 1652-1656.
DOI: 10.7498/aps.53.1652
CSTR: 32037.14.aps.53.1652
2004, 53(6): 1657-1661.
DOI: 10.7498/aps.53.1657
CSTR: 32037.14.aps.53.1657
2004, 53(6): 1662-1664.
DOI: 10.7498/aps.53.1662
CSTR: 32037.14.aps.53.1662
2004, 53(6): 1665-1668.
DOI: 10.7498/aps.53.1665
CSTR: 32037.14.aps.53.1665
2004, 53(6): 1669-1674.
DOI: 10.7498/aps.53.1669
CSTR: 32037.14.aps.53.1669
2004, 53(6): 1682-1686.
DOI: 10.7498/aps.53.1682
CSTR: 32037.14.aps.53.1682
2004, 53(6): 1687-1693.
DOI: 10.7498/aps.53.1687
CSTR: 32037.14.aps.53.1687
2004, 53(6): 1694-1698.
DOI: 10.7498/aps.53.1694
CSTR: 32037.14.aps.53.1694
2004, 53(6): 1699-1703.
DOI: 10.7498/aps.53.1699
CSTR: 32037.14.aps.53.1699
2004, 53(6): 1704-1709.
DOI: 10.7498/aps.53.1704
CSTR: 32037.14.aps.53.1704
2004, 53(6): 1710-1715.
DOI: 10.7498/aps.53.1710
CSTR: 32037.14.aps.53.1710
Generation of steady and jitter-free ultra-fast electrical pulses with GaAs photoconductive switches
2004, 53(6): 1716-1720.
DOI: 10.7498/aps.53.1716
CSTR: 32037.14.aps.53.1716
2004, 53(6): 1721-1726.
DOI: 10.7498/aps.53.1721
CSTR: 32037.14.aps.53.1721
2004, 53(6): 1727-1730.
DOI: 10.7498/aps.53.1727
CSTR: 32037.14.aps.53.1727
2004, 53(6): 1731-1734.
DOI: 10.7498/aps.53.1731
CSTR: 32037.14.aps.53.1731
2004, 53(6): 1735-1741.
DOI: 10.7498/aps.53.1735
CSTR: 32037.14.aps.53.1735
2004, 53(6): 1742-1748.
DOI: 10.7498/aps.53.1742
CSTR: 32037.14.aps.53.1742
2004, 53(6): 1749-1752.
DOI: 10.7498/aps.53.1749
CSTR: 32037.14.aps.53.1749
2004, 53(6): 1753-1758.
DOI: 10.7498/aps.53.1753
CSTR: 32037.14.aps.53.1753
2004, 53(6): 1759-1765.
DOI: 10.7498/aps.53.1759
CSTR: 32037.14.aps.53.1759
2004, 53(6): 1766-1771.
DOI: 10.7498/aps.53.1766
CSTR: 32037.14.aps.53.1766
2004, 53(6): 1772-1776.
DOI: 10.7498/aps.53.1772
CSTR: 32037.14.aps.53.1772
2004, 53(6): 1777-1781.
DOI: 10.7498/aps.53.1777
CSTR: 32037.14.aps.53.1777
2004, 53(6): 1782-1787.
DOI: 10.7498/aps.53.1782
CSTR: 32037.14.aps.53.1782
2004, 53(6): 1788-1792.
DOI: 10.7498/aps.53.1788
CSTR: 32037.14.aps.53.1788
2004, 53(6): 1793-1798.
DOI: 10.7498/aps.53.1793
CSTR: 32037.14.aps.53.1793
2004, 53(6): 1799-1803.
DOI: 10.7498/aps.53.1799
CSTR: 32037.14.aps.53.1799
2004, 53(6): 1804-1809.
DOI: 10.7498/aps.53.1804
CSTR: 32037.14.aps.53.1804
2004, 53(6): 1810-1814.
DOI: 10.7498/aps.53.1810
CSTR: 32037.14.aps.53.1810
2004, 53(6): 1815-1819.
DOI: 10.7498/aps.53.1815
CSTR: 32037.14.aps.53.1815
2004, 53(6): 1820-1825.
DOI: 10.7498/aps.53.1820
CSTR: 32037.14.aps.53.1820
2004, 53(6): 1826-1830.
DOI: 10.7498/aps.53.1826
CSTR: 32037.14.aps.53.1826
2004, 53(6): 1831-1835.
DOI: 10.7498/aps.53.1831
CSTR: 32037.14.aps.53.1831
2004, 53(6): 1836-1839.
DOI: 10.7498/aps.53.1836
CSTR: 32037.14.aps.53.1836
2004, 53(6): 1840-1844.
DOI: 10.7498/aps.53.1840
CSTR: 32037.14.aps.53.1840
2004, 53(6): 1845-1849.
DOI: 10.7498/aps.53.1845
CSTR: 32037.14.aps.53.1845
2004, 53(6): 1850-1855.
DOI: 10.7498/aps.53.1850
CSTR: 32037.14.aps.53.1850
2004, 53(6): 1856-1861.
DOI: 10.7498/aps.53.1856
CSTR: 32037.14.aps.53.1856
2004, 53(6): 1862-1867.
DOI: 10.7498/aps.53.1862
CSTR: 32037.14.aps.53.1862
2004, 53(6): 1873-1879.
DOI: 10.7498/aps.53.1873
CSTR: 32037.14.aps.53.1873
2004, 53(6): 1880-1886.
DOI: 10.7498/aps.53.1880
CSTR: 32037.14.aps.53.1880
2004, 53(6): 1887-1894.
DOI: 10.7498/aps.53.1887
CSTR: 32037.14.aps.53.1887
2004, 53(6): 1895-1899.
DOI: 10.7498/aps.53.1895
CSTR: 32037.14.aps.53.1895
2004, 53(6): 1900-1902.
DOI: 10.7498/aps.53.1900
CSTR: 32037.14.aps.53.1900
2004, 53(6): 1903-1908.
DOI: 10.7498/aps.53.1903
CSTR: 32037.14.aps.53.1903
2004, 53(6): 1909-1915.
DOI: 10.7498/aps.53.1909
CSTR: 32037.14.aps.53.1909
2004, 53(6): 1916-1922.
DOI: 10.7498/aps.53.1916
CSTR: 32037.14.aps.53.1916
2004, 53(6): 1923-1929.
DOI: 10.7498/aps.53.1923
CSTR: 32037.14.aps.53.1923
2004, 53(6): 1930-1934.
DOI: 10.7498/aps.53.1930
CSTR: 32037.14.aps.53.1930
2004, 53(6): 1935-1939.
DOI: 10.7498/aps.53.1935
CSTR: 32037.14.aps.53.1935
2004, 53(6): 1940-1945.
DOI: 10.7498/aps.53.1940
CSTR: 32037.14.aps.53.1940
2004, 53(6): 1946-1951.
DOI: 10.7498/aps.53.1946
CSTR: 32037.14.aps.53.1946
2004, 53(6): 1952-1955.
DOI: 10.7498/aps.53.1952
CSTR: 32037.14.aps.53.1952
2004, 53(6): 1956-1960.
DOI: 10.7498/aps.53.1956
CSTR: 32037.14.aps.53.1956
2004, 53(6): 1961-1966.
DOI: 10.7498/aps.53.1961
CSTR: 32037.14.aps.53.1961
2004, 53(6): 1967-1971.
DOI: 10.7498/aps.53.1967
CSTR: 32037.14.aps.53.1967
2004, 53(6): 1972-1976.
DOI: 10.7498/aps.53.1972
CSTR: 32037.14.aps.53.1972
2004, 53(6): 1977-1980.
DOI: 10.7498/aps.53.1977
CSTR: 32037.14.aps.53.1977
2004, 53(6): 1981-1988.
DOI: 10.7498/aps.53.1981
CSTR: 32037.14.aps.53.1981
2004, 53(6): 1989-1993.
DOI: 10.7498/aps.53.1989
CSTR: 32037.14.aps.53.1989
Investigation of the model of the discharge properties of the unbalanced magnetron sputtering system
2004, 53(6): 1994-1999.
DOI: 10.7498/aps.53.1994
CSTR: 32037.14.aps.53.1994
2004, 53(6): 2000-2004.
DOI: 10.7498/aps.53.2000
CSTR: 32037.14.aps.53.2000
2004, 53(6): 2005-2008.
DOI: 10.7498/aps.53.2005
CSTR: 32037.14.aps.53.2005
2004, 53(6): 2009-2013.
DOI: 10.7498/aps.53.2009
CSTR: 32037.14.aps.53.2009
2004, 53(6): 2014-2018.
DOI: 10.7498/aps.53.2014
CSTR: 32037.14.aps.53.2014
2004, 53(6): 2019-2023.
DOI: 10.7498/aps.53.2019
CSTR: 32037.14.aps.53.2019
2004, 53(6): 2024-2028.
DOI: 10.7498/aps.53.2024
CSTR: 32037.14.aps.53.2024


