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2015, 64(8): 084209.
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Liu Chang, Lu Ji-Wu, Wu Wang-Ran, Tang Xiao-Yu, Zhang Rui, Yu Wen-Jie, Wang Xi, Zhao Yi. Gate length dependence of hot carrier injection degradation in short channel silicon on insulator planar MOSFET. Acta Physica Sinica,
2015, 64(16): 167305.
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2015, 64(12): 127303.
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2014, 63(1): 010701.
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2011, 60(12): 128501.
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2011, 60(6): 067302.
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2008, 57(8): 5205-5211.
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2007, 56(3): 1662-1667.
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2006, 55(11): 6118-6122.
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2005, 54(9): 4340-4344.
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2001, 50(9): 1769-1773.
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FAN HAI-FU, QIAN JIN-ZI. PROCEDURE FOR SOLVING THE PROBLEM OF PHASE DEGENERATION RESULTING FROM DIRECT METHODS. Acta Physica Sinica,
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