-
并网逆变器系统作为一个时变非线性系统,具有复杂的动力学行为,而死区非线性的引入使系统的非线性行为更为复杂和难以预测. 本文以考虑死区非线性的L滤波单相并网逆变器为研究对象,首先观察不同死区时间下系统的输出电流波形,发现在控制器参数固定的情况下,随着死区时间的增加,系统会出现分岔现象;其次,根据死区非线性特性及其引起的电流过零钳位现象,分多种情况全面地建立了精确完整的离散迭代模型,并在此基础上对系统的分岔行为进行理论分析. 此外,系统的稳定性判定具有重要的工程指导意义,由于死区非线性的引入,常规解析方法使用困难,而图解法的精度又难以令人满意,因此提出了一种基于等效占空比的稳定性判断方法,可以精确地判定系统的稳定边界,为控制器参数设计和死区时间设计提供了可靠依据.Grid-connected inverter system is recognized as a time-varying nonlinear system, and it has complex nonlinear behaviors in practice. However, the introduction of dead-time nonlinearity can make the nonlinear behaviors of the system more complex and harder to predict. In this paper, the proportional control single-phase grid-connected inverter with L-filter considering dead-time nonlinearity is investigated. The observation of current waveforms under fixed controller parameter and different dead-time parameters shows that the bifurcation phenomenon occurs with the increase of dead-time. According to the features of dead-time nonlinearity and the zero current clamping phenomenon caused by dead-time, an exact and complete discrete-time model is established by comprehensively considering the system from various aspects. And the theoretical analysis of bifurcation behaviors of system is carried out based on the proposed model. Moreover, the stability judgment has engineering significance. However, with the consideration of dead-time nonlinearity, analytical methods are difficult to use and the graphic methods do not have satisfactory accuracy. Therefore, a stability criterion based on equivalent duty ratio is proposed in this paper, which can accurately judge the stability boundary and provide reliable references for the parameter design of controller and dead-time.
-
Keywords:
- grid-connected inverter /
- dead-time nonlinearity /
- discrete-time model /
- bifurcation behavior
[1] Ma X K, Li M, Dai D, Zhang H, Zou J L 2006 Trans. CES 2 1 (in Chinese) [马西奎, 李明, 戴栋, 张浩, 邹建龙 2006 电工技术学报 2 1]
[2] Zhang B, Qu Y 2003 Proc. CSEE 23 99 (in Chinese) [张波, 曲颖 2003 电机工程学报 23 99]
[3] Luo X S, Wang B H, Chen G R, Quan H J, Fang J Q, Zou Y L, Jiang P Q 2003 Acta Phys. Sin. 52 12 (in Chinese) [罗晓曙, 汪秉宏, 陈关荣, 全宏俊, 方锦清, 邹艳丽, 蒋品群 2003 52 12]
[4] Aroudi A, Debbat M, Giral R, Oliver G, Benadero L, Toribio E 2005 Int. J. Bifurc. Chaos 15 1549
[5] Liu W Z, Zhang H, Ma X K 2005 Proc. CSEE 25 43 (in Chinese) [刘伟增, 张浩, 马西奎 2005 电机工程学报 25 43]
[6] Ma X K, Liu W Z, Zhang H 2005 Proc. CSEE 25 61 (in Chinese) [马西奎, 刘伟增, 张浩 2005 电机工程学报 25 61]
[7] Dai D, Zhang B, Li S N, Ma X K 2008 Trans. CES 23 65 (in Chinese) [戴栋, 张波, 李胜男, 马西奎 2008 电工技术学报 23 65]
[8] Iu H H C, Zhou Y, Tse C K 2003 Int. J. Circ. Theor. Appl. 31 611
[9] Robert B, Feki M, Iu H H C 2006 Int. J. Bifurc. Chaos 16 113
[10] Wang X M, Zhang B, Qiu D Y 2009 Acta Phys. Sin. 58 2248 (in Chinese) [王学梅, 张波, 丘东元 2009 58 2248]
[11] Lei B, Xiao G C, Wu X L, Qi Y R 2011 Acta Phys. Sin. 60 090501 (in Chinese) [雷博, 肖国春, 吴旋律, 齐元瑞 2011 60 090501]
[12] Hao X, Xie R L, Yang X, Liu T, Huang L 2013 Acta Phys. Sin. 62 200503 (in Chinese) [郝翔, 谢瑞良, 杨旭, 刘韬, 黄浪 2013 62 200503]
[13] Hao X, Liu T, Yang X, Huang L 2012 Proc. IEEE IPEMC Harbin, China, June 2-5, 2012 p831
[14] Liu T, Hao X Yang X Liu J, Zhang B, Huang L 2012 Proc. IEEE IPEMC Harbin, China, June 2-5, 2012 p626
[15] Liu T, Hao X, Yang X, Zhao M, Huang Q, Huang L 2012 Proc IEEE IPEMC Harbin, China, June 2-5, 2012 p335
[16] Hu J, Shang L, He Y, Zhu Z Q 2011 IEEE Trans. Power Electron. 26 210
[17] Hao X, Yang X, Liu T, Huang L, Chen W 2013 IEEE Trans. Power Electron. 28 793
[18] Yu D C, Wu A G, Yang C P 2005 Chin. Phys. B 14 5
[19] Chen D Y, Liu Y X, Ma X Y, Zhang R F 2011 Chin. Phys. B 20 120506
[20] Mohammad P A, Hassan F 2012 Chin. Phys. B 21 060506
[21] Kukrer O, Komurcugil H, Doganalp A 2009 IEEE Trans. Ind. Electron. 56 3477
[22] Herran M A, Fischer J R, Gonzalez S A, Judewicz M G, Carrica D O 2013 IEEE Trans. Power Electron. 28 2816
[23] Summers T J, Betz R E 2004 IEEE Trans. Ind. Appl. 40 935
[24] Cichowski A, Nieznanski J 2005 IEEE Power Electron. Lett. 3 72
-
[1] Ma X K, Li M, Dai D, Zhang H, Zou J L 2006 Trans. CES 2 1 (in Chinese) [马西奎, 李明, 戴栋, 张浩, 邹建龙 2006 电工技术学报 2 1]
[2] Zhang B, Qu Y 2003 Proc. CSEE 23 99 (in Chinese) [张波, 曲颖 2003 电机工程学报 23 99]
[3] Luo X S, Wang B H, Chen G R, Quan H J, Fang J Q, Zou Y L, Jiang P Q 2003 Acta Phys. Sin. 52 12 (in Chinese) [罗晓曙, 汪秉宏, 陈关荣, 全宏俊, 方锦清, 邹艳丽, 蒋品群 2003 52 12]
[4] Aroudi A, Debbat M, Giral R, Oliver G, Benadero L, Toribio E 2005 Int. J. Bifurc. Chaos 15 1549
[5] Liu W Z, Zhang H, Ma X K 2005 Proc. CSEE 25 43 (in Chinese) [刘伟增, 张浩, 马西奎 2005 电机工程学报 25 43]
[6] Ma X K, Liu W Z, Zhang H 2005 Proc. CSEE 25 61 (in Chinese) [马西奎, 刘伟增, 张浩 2005 电机工程学报 25 61]
[7] Dai D, Zhang B, Li S N, Ma X K 2008 Trans. CES 23 65 (in Chinese) [戴栋, 张波, 李胜男, 马西奎 2008 电工技术学报 23 65]
[8] Iu H H C, Zhou Y, Tse C K 2003 Int. J. Circ. Theor. Appl. 31 611
[9] Robert B, Feki M, Iu H H C 2006 Int. J. Bifurc. Chaos 16 113
[10] Wang X M, Zhang B, Qiu D Y 2009 Acta Phys. Sin. 58 2248 (in Chinese) [王学梅, 张波, 丘东元 2009 58 2248]
[11] Lei B, Xiao G C, Wu X L, Qi Y R 2011 Acta Phys. Sin. 60 090501 (in Chinese) [雷博, 肖国春, 吴旋律, 齐元瑞 2011 60 090501]
[12] Hao X, Xie R L, Yang X, Liu T, Huang L 2013 Acta Phys. Sin. 62 200503 (in Chinese) [郝翔, 谢瑞良, 杨旭, 刘韬, 黄浪 2013 62 200503]
[13] Hao X, Liu T, Yang X, Huang L 2012 Proc. IEEE IPEMC Harbin, China, June 2-5, 2012 p831
[14] Liu T, Hao X Yang X Liu J, Zhang B, Huang L 2012 Proc. IEEE IPEMC Harbin, China, June 2-5, 2012 p626
[15] Liu T, Hao X, Yang X, Zhao M, Huang Q, Huang L 2012 Proc IEEE IPEMC Harbin, China, June 2-5, 2012 p335
[16] Hu J, Shang L, He Y, Zhu Z Q 2011 IEEE Trans. Power Electron. 26 210
[17] Hao X, Yang X, Liu T, Huang L, Chen W 2013 IEEE Trans. Power Electron. 28 793
[18] Yu D C, Wu A G, Yang C P 2005 Chin. Phys. B 14 5
[19] Chen D Y, Liu Y X, Ma X Y, Zhang R F 2011 Chin. Phys. B 20 120506
[20] Mohammad P A, Hassan F 2012 Chin. Phys. B 21 060506
[21] Kukrer O, Komurcugil H, Doganalp A 2009 IEEE Trans. Ind. Electron. 56 3477
[22] Herran M A, Fischer J R, Gonzalez S A, Judewicz M G, Carrica D O 2013 IEEE Trans. Power Electron. 28 2816
[23] Summers T J, Betz R E 2004 IEEE Trans. Ind. Appl. 40 935
[24] Cichowski A, Nieznanski J 2005 IEEE Power Electron. Lett. 3 72
计量
- 文章访问数: 5857
- PDF下载量: 459
- 被引次数: 0