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为在能量天平动圈位移测量中实现大范围纳米精度法-珀干涉绝对距离测量, 提出了声光移频器双通道配置, 实现了调谐范围为200 MHz的可调谐频差. 通过分析声光移频器调制带宽与衍射效率的平衡与入射光束聚焦透镜的关系, 确定透镜的最佳焦距范围; 利用零级光斑分布特点准确定位入射光束, 保证一级衍射光束质量. 声光移频器在调制带宽内的实验单通道和双通道峰值衍射效率分别为79.54%, 61.41%; 声光移频器双通道配置输出的一级衍射光束与入射本征光束的拍频范围为440-640 MHz, 是单通道调制带宽输出220-320 MHz的两倍, 信噪比好. 理论分析表明, 声光移频器双通道配置方法实现的可调谐频差可测量腔长变化范围约为53 mm的折叠法-珀腔.In order to realize nanometer-scale absolute distance measurements based on Fabry-Pérot interferometry for long-range displacement measurement of the moving coil in Joule balance, the acousto-optic frequency shifter (AOFS) in double-pass configuration is presented, and a tunable frequency difference in a range of 200 MHz is achieved. The focus length of the lens is determined by analyzing the relationship of the tradeoff between the AOFS modulation bandwidth and its diffraction efficiencies; the beam spot of the first-order diffraction beam is guaranteed by accurately positioning the focused beam according to the distribution of the zero-order diffraction beam spot. The experimental single-pass and double-pass peak diffraction efficiency of the AOFS are 79.54% and 61.41%, respectively; the tunable frequency difference of 440-640 MHz, which is twice the single-pass modulation bandwidth output of 220-320 MHz, is obtained by the beat note between the incident beam and the first-order diffraction beam of the double-pass AOFS, and has a good signal-to-noise ratio. Theoretical analysis shows that a folded Fabry-Pérot cavity length displacement of about 53 mm can be measured through the tunable frequency difference achieved by means of double-pass AOFS.
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Keywords:
- Fabry-Pérot interferometry /
- acousto-optic frequency shifter /
- double-pass configuration /
- tunable frequency difference
[1] Wang X H, Hou J D, Chen X Z, Yang D H, Wang Y Q 2000 Acta Opt. Sin. 20 1441 (in Chinese) [王晓辉, 侯继东, 陈徐宗, 杨东海, 王义遒 2000 光学学报 20 1441]
[2] Wang X H, Chen X Z, Hou J D, Yang D H, Wang Y Q 2000 Acta Phys. Sin. 49 85 (in Chinese) [王晓辉, 陈徐宗, 侯继东, 杨东海, 王义遒 2000 49 85]
[3] Donley E A, Heavner T P, Levi F, Tataw M O, Jefferts S R 2005 Rev. Sci. Instrum. 76 063112
[4] Wei D, Chen H X, Xiong D Z, Zhang J 2006 Acta Phys. Sin.55 6342 (in Chinese) [卫栋, 陈海霞, 熊德智, 张靖 2006 55 6342]
[5] Cornelussen R A, Huussen T N, Spreeuw R J C, van Linden, van den Heuvell H B 2004 Appl. Phys. B 78 19
[6] Gunawardena M, Hess P W, Strait J, Majumder P K 2008 Rev. Sci. Instrum. 79 103110
[7] Park Y, Cho K 2011 Opt. Lett. 36 331
[8] Pan Z W, Mi B, Zhang B 1999 Piezoelectrics & Acousto Optics 21 337 (in Chinese) [潘珍吾, 米斌, 张斌 1999 压电与声光 21 337]
[9] Xiong Z Y, Yao Z W, Wang L, Li R B, Wang J, Zhan M S 2011 Acta Phys. Sin.60 113201 (in Chinese) [熊宗元, 姚战伟, 王玲, 李润兵, 王谨, 詹明生 2011 60 113201]
[10] Haitjema H, Schellekens P H J, Wetzels S F C L 2000 Metrologia 37 25
[11] Cheng X H, Zhao Y, Li D C 1999 Laser Technology 23 134 (in Chinese) [程晓辉, 赵洋, 李达成 1999 激光技术 23 134]
[12] Yu Z Q, Xu Y X, Xu Y, Xu J 2000 Optical Technique 26 199 (in Chinese) [余载泉, 徐毓娴, 徐毅, 许婕 2000 光学技术 26 199]
[13] Ma J C, Li Y, Sun W K, Xu J 2008 Acta Opt. Sin. 28 1296 (in Chinese) [马骥驰, 李岩, 孙文科, 许婕 2008 光学学报 28 1296]
[14] Bay Z 1971 Natl. Bur. Stand. (U.S.) Spec. Publ. 343 59
[15] Dunn T J, Lee T M, Jain K 1996 J. Vac. Sci. Technol. B 14 3960
[16] Lawall J R 2005 J. Opt. Soc. Am. A 22 2786
[17] Han B, Zhang Z H, He Q, Li Z K, Li C 2010 Chinese Journal of Scientific Instrument 31 1435 (in Chinese) [韩冰, 张钟华, 贺青, 李正坤, 李辰 2010 仪器仪表学报 31 1435]
[18] Zhang L Q, Li Y, Liu Z 2010 Proceeding of IEEE Conference on Precision Electromagnetic Measurements, Dajeon, Korea, June 13-18, 2010 p10
[19] Yariv A, Yeh P (Translated by Yu R J, Jin F) 1991 Optical Waves in Crystals: Propagation and Control of Laser Radiation (Beijing: Science Press) pp321-330 (in Chinese) 亚里夫, 叶著 于荣金, 金锋译 1991 晶体中的光波: 激光的控制与传播 (北京: 科学出版社) 第321-330页
[20] Chang I C 1976 IEEE Transactions on Sonics and Ultrasonics January 1976 23 p2
[21] Eddie H Y, J R, Yao S K 1981 Proc. IEEE January 1981 69 p54
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[1] Wang X H, Hou J D, Chen X Z, Yang D H, Wang Y Q 2000 Acta Opt. Sin. 20 1441 (in Chinese) [王晓辉, 侯继东, 陈徐宗, 杨东海, 王义遒 2000 光学学报 20 1441]
[2] Wang X H, Chen X Z, Hou J D, Yang D H, Wang Y Q 2000 Acta Phys. Sin. 49 85 (in Chinese) [王晓辉, 陈徐宗, 侯继东, 杨东海, 王义遒 2000 49 85]
[3] Donley E A, Heavner T P, Levi F, Tataw M O, Jefferts S R 2005 Rev. Sci. Instrum. 76 063112
[4] Wei D, Chen H X, Xiong D Z, Zhang J 2006 Acta Phys. Sin.55 6342 (in Chinese) [卫栋, 陈海霞, 熊德智, 张靖 2006 55 6342]
[5] Cornelussen R A, Huussen T N, Spreeuw R J C, van Linden, van den Heuvell H B 2004 Appl. Phys. B 78 19
[6] Gunawardena M, Hess P W, Strait J, Majumder P K 2008 Rev. Sci. Instrum. 79 103110
[7] Park Y, Cho K 2011 Opt. Lett. 36 331
[8] Pan Z W, Mi B, Zhang B 1999 Piezoelectrics & Acousto Optics 21 337 (in Chinese) [潘珍吾, 米斌, 张斌 1999 压电与声光 21 337]
[9] Xiong Z Y, Yao Z W, Wang L, Li R B, Wang J, Zhan M S 2011 Acta Phys. Sin.60 113201 (in Chinese) [熊宗元, 姚战伟, 王玲, 李润兵, 王谨, 詹明生 2011 60 113201]
[10] Haitjema H, Schellekens P H J, Wetzels S F C L 2000 Metrologia 37 25
[11] Cheng X H, Zhao Y, Li D C 1999 Laser Technology 23 134 (in Chinese) [程晓辉, 赵洋, 李达成 1999 激光技术 23 134]
[12] Yu Z Q, Xu Y X, Xu Y, Xu J 2000 Optical Technique 26 199 (in Chinese) [余载泉, 徐毓娴, 徐毅, 许婕 2000 光学技术 26 199]
[13] Ma J C, Li Y, Sun W K, Xu J 2008 Acta Opt. Sin. 28 1296 (in Chinese) [马骥驰, 李岩, 孙文科, 许婕 2008 光学学报 28 1296]
[14] Bay Z 1971 Natl. Bur. Stand. (U.S.) Spec. Publ. 343 59
[15] Dunn T J, Lee T M, Jain K 1996 J. Vac. Sci. Technol. B 14 3960
[16] Lawall J R 2005 J. Opt. Soc. Am. A 22 2786
[17] Han B, Zhang Z H, He Q, Li Z K, Li C 2010 Chinese Journal of Scientific Instrument 31 1435 (in Chinese) [韩冰, 张钟华, 贺青, 李正坤, 李辰 2010 仪器仪表学报 31 1435]
[18] Zhang L Q, Li Y, Liu Z 2010 Proceeding of IEEE Conference on Precision Electromagnetic Measurements, Dajeon, Korea, June 13-18, 2010 p10
[19] Yariv A, Yeh P (Translated by Yu R J, Jin F) 1991 Optical Waves in Crystals: Propagation and Control of Laser Radiation (Beijing: Science Press) pp321-330 (in Chinese) 亚里夫, 叶著 于荣金, 金锋译 1991 晶体中的光波: 激光的控制与传播 (北京: 科学出版社) 第321-330页
[20] Chang I C 1976 IEEE Transactions on Sonics and Ultrasonics January 1976 23 p2
[21] Eddie H Y, J R, Yao S K 1981 Proc. IEEE January 1981 69 p54
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