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The modes in a double-layer of single-negative material have been investigated. The conditions for the existence of different modes have been analyzed. The relations between different modes and material parameters are considered. Tunneling mode appears when the general zero average permittivity and permeability conditions are satisfied. When the wave guide condition is satisfied, electromagnetic wave is evanescent outside the material, and the field is mainly localized at the interface of the two single-negative layers.
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Keywords:
- single-negative material /
- propagation mode /
- tunneling mode /
- guided mode
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[4] [4]Jiang H T, Chen H, Zhu S Y 2004 Phys. Rev. E 73 046601
[5] [5]Chen Y H, Dong J W, Wang H Z 2006 Appl. Phys. Lett. 89 141101
[6] [6]Alu A, Engheta N 2003 IEEE Trans. Microwave Antenn. Propag. 51 2558
[7] [7]Eleftheriades G V, Iyer A K, Kremer P C 2002 IEEE Trans. Microwave Theor. Technol. 50 2702
[8] [8]Xu J P, Yang Y P, Liu N H, Zhu S Y 2007 Eur. Phys. J. D 41 403
[9] [9]Guan G S, Jiang H T, Li H Q, Zhang Y W, Chen H, Zhu S Y 2006 Appl. Phys. Lett. 88 21112
[10] ]Ruppin R 2000 Phys. Lett. A 277 61
[11] ]Ruppin R 2001 J. Phys. D: Condens. Matter. 13 1811
[12] ]Wu B L, Grzegorczyk T M, Zhang Y, Kong J A 2003 J. Appl. Phys. 93 9386
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[1] [1]Fredkin D R, Ron A 2002 Appl. Phys. Lett. 81 1753
[2] [2]Alu A, Engheta N 2004 IEEE Trans. Microwave Theor. Technol. 52 199
[3] [3]Wang L G, Chen H, Zhu S Y 2004 Phys. Rev. B 70 245102
[4] [4]Jiang H T, Chen H, Zhu S Y 2004 Phys. Rev. E 73 046601
[5] [5]Chen Y H, Dong J W, Wang H Z 2006 Appl. Phys. Lett. 89 141101
[6] [6]Alu A, Engheta N 2003 IEEE Trans. Microwave Antenn. Propag. 51 2558
[7] [7]Eleftheriades G V, Iyer A K, Kremer P C 2002 IEEE Trans. Microwave Theor. Technol. 50 2702
[8] [8]Xu J P, Yang Y P, Liu N H, Zhu S Y 2007 Eur. Phys. J. D 41 403
[9] [9]Guan G S, Jiang H T, Li H Q, Zhang Y W, Chen H, Zhu S Y 2006 Appl. Phys. Lett. 88 21112
[10] ]Ruppin R 2000 Phys. Lett. A 277 61
[11] ]Ruppin R 2001 J. Phys. D: Condens. Matter. 13 1811
[12] ]Wu B L, Grzegorczyk T M, Zhang Y, Kong J A 2003 J. Appl. Phys. 93 9386
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