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在反馈控制电路中引入适当的斜坡补偿电流, 既可以有效拓宽电流控制开关DC-DC变换器稳定工作范围, 实现混沌镇定控制, 又可以使其工作模式从断续导电模式转移至连续导电模式, 实现工作模式转移. 以电流控制Buck-Boost变换器为例, 通过建立含斜坡补偿的具有两个电感电流边界的二维离散时间模型和相应的Jacobi矩阵, 深入研究了开关DC-DC变换器斜坡补偿的动力学机理. 通过分析稳定性失稳和边界碰撞分岔的条件, 讨论了斜坡补偿对开关DC-DC变换器稳定周期振荡和工作模式转移的影响, 分别给出了相应的稳定性分界线和模式转移分界线. 制作了实验电路, 由实验结果说明了斜坡补偿对开关DC-DC变换器混沌镇定控制和工作模式转移的物理意义, 并验证了理论分析的正确性.
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关键词:
- Buck-Boost变换器 /
- 斜坡补偿 /
- 模式转移 /
- 镇定控制
By introducing ramp compensation current into the feedback control circuit of current controlled switching DC-DC converter it can not only effectively extend the stable operation range of the switching DC-DC converter to realize chaotic stability control, but also shift its operation mode from discontinuous conduction mode to continuous conduction mode to realize operation mode shift. Taking current-controlled buck-boost converter as example by establishing the two-dimensional discrete-time model and the corresponding Jacobian matrix of current-controlled buck-boost converter with ramp compensation and two inductor current borders, the dynamical mechanism of ramp compensation for switching DC-DC converter is investigated. By analyzing the conditions of the instability and border collision bifurcation, the effects of the ramp compensation on the stable period oscillation and operation mode shift of switching DC-DC converter are discussed, and the corresponding stability boundary and mode shift boundary are obtained. Finally, an experimental circuit is built and the results are observed, from which the physical significance of the ramp compensation for chaotic stability control and operation mode shift of switching DC-DC converter is illustrated and the correctness of theoretical analysis is verified.-
Keywords:
- buck-boost converter /
- ramp compensation /
- mode shift /
- stability control
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[4] Tse C K, Bernardo M D 2002 Proc. IEEE 90 768
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[11] Bao B C, Xu J P, Liu Z 2009 Chin. Phys. B 18 4742
[12] Bao B C, Xu J P, Liu Z 2009 Acta Electron. Sin. 37 2787 [包伯成, 许建平, 刘中 2009 电子学报 37 2787]
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[14] Bi Y C, Wang X F, Liu L S 2010 J. Harbin Univ. Sci. Technol. of China 15 77 (in Chinese) [毕玉春, 汪小峰, 刘立生 2010 哈尔滨理工大学学报 15 77]
[15] Bao B C, Zhou G H, Xu J P, Liu Z 2011 IEEE Trans. Power Electron. 26 1968
[16] Liu F 2010 Chin. Phys. B 19 080511
[17] Xu J P, Zhou G H, He M Z 2009 IEEE Trans. Ind. Electron. 56 3222
[18] Elaydi S N 2008 Discrete Chaos with Applications in Science and Engineering (Boca Raton: Chapman & Hall/CRC)
[19] Chen Y F, Tse C K, Qiu S S, Lindenmller L, Schwarz W 2008 IEEE Trans. Circuits Syst. I 55 3335
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[1] Leyva-Ramos J, Ortiz-Lopez M G, Diaz-Saldierna L H, Morales-Saldana J A 2009 IET Power Electron. 2 605
[2] Chen J H, Chau K T, Chan C C 2000 IEEE Trans. Ind. Electron. 47 67
[3] Deane J H B, Hamill D C 1990 IEEE Trans. Power Electron. 5 260
[4] Tse C K, Bernardo M D 2002 Proc. IEEE 90 768
[5] Zhao Y B, Zhang D Y, Zhang C J 2007 Chin. Phys. 16 933
[6] Dai D, Ma X K, Li X F 2003 Acta Phys. Sin. 52 2729 (in Chinese) [戴栋, 马西奎, 李小峰 2003 52 2729]
[7] Zhou Y F, Chen J N, Ke D M 2005 Acta Electron. Sin. 33 915 (in Chinese) [周宇飞, 陈军宁, 柯导明 2005 电子学报 33 915]
[8] Bao B C, Zhou G H, Xu J P, Liu Z 2010 Acta Phys. Sin. 59 3699 (in Chinese) [包伯成, 周国华, 许建平, 刘中 2010 59 3699]
[9] Bao B C, Xu J P, Liu Z 2008 J. Univ. Electron. Sci. Technol. of China 37 397 (in Chinese) [包伯成, 许建平, 刘中2008 电子科技大学学报 37 397]
[10] Bao B C, Xu J P, Liu Z 2009 Acta Phys. Sin. 58 2949 (in Chinese) [包伯成, 许建平, 刘中 2009 58 2949]
[11] Bao B C, Xu J P, Liu Z 2009 Chin. Phys. B 18 4742
[12] Bao B C, Xu J P, Liu Z 2009 Acta Electron. Sin. 37 2787 [包伯成, 许建平, 刘中 2009 电子学报 37 2787]
[13] Zhou G H, Xu J P, Bao B C, Jin Y Y 2010 Chin. Phys. B 19 060508
[14] Bi Y C, Wang X F, Liu L S 2010 J. Harbin Univ. Sci. Technol. of China 15 77 (in Chinese) [毕玉春, 汪小峰, 刘立生 2010 哈尔滨理工大学学报 15 77]
[15] Bao B C, Zhou G H, Xu J P, Liu Z 2011 IEEE Trans. Power Electron. 26 1968
[16] Liu F 2010 Chin. Phys. B 19 080511
[17] Xu J P, Zhou G H, He M Z 2009 IEEE Trans. Ind. Electron. 56 3222
[18] Elaydi S N 2008 Discrete Chaos with Applications in Science and Engineering (Boca Raton: Chapman & Hall/CRC)
[19] Chen Y F, Tse C K, Qiu S S, Lindenmller L, Schwarz W 2008 IEEE Trans. Circuits Syst. I 55 3335
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