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The free-space method is a analysis method applicable for measuring electromagnetic parameters of materials, owing to its non-contact and non-destructibility. Base on the resonance property of reflectivity under sweep frequency mode, a novel free-space method is presented. For the study of constructive interference or destructive interference, the method is used to measure the real component of complex dielectric constant through the thickness of material and the interference frequency. The method can also measure the imaginary component of complex dielectric content by the positions of peaks and valleys of waveform or/and their correlation. The study also demonstrates the higher precision obtained by using the valley-to-valley ratio than by using the standing waveform ratio (peak-to-valley ratio).
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Keywords:
- free-space method /
- resonance /
- electromagnetic parameters /
- interference
[1] Cullen A L, 1987 Ratio Science 22 1168
[2] Ghoduaonkar D K, Varadan V V, Varadan V K 1989 IEEE Trans. M-37 (2) 789
[3] Umari M H, Ghoduaonkar D K,Varadan V V 1991 IEEE Trans. M-40 (1) 19
[4] Munoz J, Rojo M, Parrefio A 1996 IEEE Trans. MT-2(2) 957
[5] Munoz J, Rojo M, Parrefio A 1998 IEEE Trans. M-47(4) 886
[6] Tamyis N, Ramli A, Ghoduaonkar D K 2002 Research and Development, 2002. SCOReD 2002. Student Conference on. July 16-17 2002 p394
[7] W B, Ge D B 2005 Acta Phys. Sin. 54 648 (in Chinese) [魏兵, 葛德彪 2005 54 648]
[8] Wei B, Ge D B 2003 Journal of Microwaves, 19 6 (in Chinese) [魏兵,葛德彪 2003 微波学报 19 6]
[9] Wei B, Ge D B 2002 Journal of Xidian University 29 607 (in Chinese) [魏兵,葛德彪 2002 西安电子科技大学学报(自然科学版) 29 607]
[10] Zhang W, Su D L 2007 Acta Material compositae finica 24 141 (in Chinese) [张伟, 苏东林 2007 复合材料学报 24 141]
[11] Lu Z Y, Tang Z X, Zhang B 2006 Journal of aeronautical materials 26 62 (in Chinese) [卢子焱,唐宗熙,张彪 2006 航空材料学报 26 62]
[12] Zhang N, Wang L C, Zhang G H 2006 Journal of Astronautic Metrology and Measurement 26 22 (in Chinese) [张娜,王立春,张国华 2006 宇航计测技术 26 22]
[13] Tang Z X, Zhang B 2006 Acta Electronic Snica 34 189 (in Chinese) [唐宗熙, 张彪 2006 电子学报 34 189]
[14] Ghod Gaonkap D K, Varand V V, Varand V K 1990 IEEE Trans. M-39(2) 387
[15] Varand V V, Varand V K, Ghod Gaonkap D K 1991 IEEE Trans. M-40(5) 842
[16] Varand V V, Josep K A, Varand V K 2000 IEEE Trans. MTT-48(3) 388
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[1] Cullen A L, 1987 Ratio Science 22 1168
[2] Ghoduaonkar D K, Varadan V V, Varadan V K 1989 IEEE Trans. M-37 (2) 789
[3] Umari M H, Ghoduaonkar D K,Varadan V V 1991 IEEE Trans. M-40 (1) 19
[4] Munoz J, Rojo M, Parrefio A 1996 IEEE Trans. MT-2(2) 957
[5] Munoz J, Rojo M, Parrefio A 1998 IEEE Trans. M-47(4) 886
[6] Tamyis N, Ramli A, Ghoduaonkar D K 2002 Research and Development, 2002. SCOReD 2002. Student Conference on. July 16-17 2002 p394
[7] W B, Ge D B 2005 Acta Phys. Sin. 54 648 (in Chinese) [魏兵, 葛德彪 2005 54 648]
[8] Wei B, Ge D B 2003 Journal of Microwaves, 19 6 (in Chinese) [魏兵,葛德彪 2003 微波学报 19 6]
[9] Wei B, Ge D B 2002 Journal of Xidian University 29 607 (in Chinese) [魏兵,葛德彪 2002 西安电子科技大学学报(自然科学版) 29 607]
[10] Zhang W, Su D L 2007 Acta Material compositae finica 24 141 (in Chinese) [张伟, 苏东林 2007 复合材料学报 24 141]
[11] Lu Z Y, Tang Z X, Zhang B 2006 Journal of aeronautical materials 26 62 (in Chinese) [卢子焱,唐宗熙,张彪 2006 航空材料学报 26 62]
[12] Zhang N, Wang L C, Zhang G H 2006 Journal of Astronautic Metrology and Measurement 26 22 (in Chinese) [张娜,王立春,张国华 2006 宇航计测技术 26 22]
[13] Tang Z X, Zhang B 2006 Acta Electronic Snica 34 189 (in Chinese) [唐宗熙, 张彪 2006 电子学报 34 189]
[14] Ghod Gaonkap D K, Varand V V, Varand V K 1990 IEEE Trans. M-39(2) 387
[15] Varand V V, Varand V K, Ghod Gaonkap D K 1991 IEEE Trans. M-40(5) 842
[16] Varand V V, Josep K A, Varand V K 2000 IEEE Trans. MTT-48(3) 388
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