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In surface roughening of the growth process, the shadowing effect generated by non-normal incidence of particles is a kind of long-range interaction. It is found that the surface morphology and the bulk property in non-normal incidence are nontrivially affected by shadowing effect. In this paper, the effects of the oblique-incidence angle on scaling exponent, skewness and kurtosis in surface statistics and bulk porosity are investigated by simulating the oblique-incidence ballistic deposition model. The results illustrate that there are a non-monotonic relation between scaling exponents and oblique-incidence angle, and the finite size effects of skewness and kurtosis depend on oblique-incidence angle. The simulation results are also analyzed qualitatively in the paper.
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Keywords:
- shadowing effect /
- ballistic deposition model /
- dynamic scaling
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[2] Barabasi A L, Stanley H E 1995 Fractal Concepts in Surface Growth (Cambridge: Cambridge University Press)
[3] Family F, Vicsek T 1991 Dynamics of Fractal Surfaces(Singapore: World Scientific Press)
[4] Family F, Vicsek T 1985 J. Phys. A 18 L75
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[6] Kardar M, Parisi G, Zhang Y C 1986 Phys. Rev. Lett. 56 889
[7] L′opez J M, Rodriguez M A, Cuerno R 1997 Phys. Rev. E 56 3993
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[9] Pang N N, Tzeng W J 2004 Phys. Rev. E 70 036115
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[11] Aar?ao Reis F D A 2004 Phys. Rev. E 70 031607
[12] Hao D P, Tang G, Xia H, Han K, Xun Z P 2011 Acta Phys. Sin. 60 038102 (in Chinese) [郝大鹏, 唐刚, 夏辉, 韩奎, 寻之朋 2011 60 038102]
[13] Katzav E, Edwards S F, Schwartz M 2006 Europhys. Lett. 75 29
[14] Yu J, Amar J G 2002 Phys. Rev. E 65 060601
[15] Silveira F A, Aar?ao Reis F D A 2007 Phys. Rev. E 75 061608
[16] Shim Y, Borovikov V, Amar J G 2008 Phys. Rev. B 77 235423
[17] Forgerini F L, Figueiredo W 2009 Phys. Rev. E 79 041602
[18] Yu J G, Amar J G 2002 Phys. Rev. E 66 021603
[19] Datta D P, Chini T K 2007 Phys. Rev. B 76 075323
[20] Kim J, Dohnalek Z, Kay B D 2005 Surface Science 586 137
[21] Asgharizadeh S, Sutton M 2009 Phys. Rev. B 79 125405
[22] Dolatshahi-Pirouz A, Hovgaard M B, Rechendorff K, Chevallier J, Foss M, Besenbacher F 2008 Phys. Rev. B 77 115427
[23] Rabbering FW, Stoian G, Gastel R V,Wormeester H, Poelsema B 2010 Phys. Rev. B 81 115425
[24] Shim Y, Amar J G 2007 Phys. Rev. Lett. 98 046103
[25] Shim Y, Mills M E, Borovikov V, Amar J G 2009 Phys. Rev. E 79 051604
[26] Hu B, Tang G 2002 Phys. Rev. E 66 026105
[27] Tang G, Ma B K 2002 Acta Phys. Sin. 51 994(in Chinese) [唐刚, 马本堃 2002 51 994]
[28] Tang G, Ma B K 2001 Acta Phys. Sin. 50 851 (in Chinese) [唐刚, 马本堃 2001 50 851]
[29] Hao D P, Tang G, Xia H, Chen H, Zhang L M, Xun Z P 2007 Acta Phys. Sin. 56 2018 (in Chinese) [郝大鹏, 唐刚, 夏辉, 陈华, 张雷明, 寻之朋 2007 56 2018]
[30] Pelliccione M, Lu T M 2008 Evolution of Thin Film Morphology (London: Springer-Verlag)
[31] Aar?ao Reis F D A 2001 Phys. Rev. E 63 056116
[32] Ramasco J J, L′opez J M, Rodr′?guez M A 2000 Phys. Rev. Lett. 84 2199
[33] L′opez J M, Castro M, Gallego R 2005 Phys. Rev. Lett. 94 166103
[34] Asgharizadeh S, Sutton M, Robbie K, Brown T 2009 Phys. Rev. B 79 125405
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[1] Meakin P 1998 Fractal, Scaling and Growth far from Equilibrium (Cambridge: Cambridge University Press)
[2] Barabasi A L, Stanley H E 1995 Fractal Concepts in Surface Growth (Cambridge: Cambridge University Press)
[3] Family F, Vicsek T 1991 Dynamics of Fractal Surfaces(Singapore: World Scientific Press)
[4] Family F, Vicsek T 1985 J. Phys. A 18 L75
[5] Edwards S F,Wilkinson D R 1982 Proc. R. Soc. London A 381 17
[6] Kardar M, Parisi G, Zhang Y C 1986 Phys. Rev. Lett. 56 889
[7] L′opez J M, Rodriguez M A, Cuerno R 1997 Phys. Rev. E 56 3993
[8] L′opez J M, Rodriguez M A, Cuerno R 1997 Physica A 246 329
[9] Pang N N, Tzeng W J 2004 Phys. Rev. E 70 036115
[10] Chin C S, Nijs M D 1999 Phys. Rev. E 59 2633
[11] Aar?ao Reis F D A 2004 Phys. Rev. E 70 031607
[12] Hao D P, Tang G, Xia H, Han K, Xun Z P 2011 Acta Phys. Sin. 60 038102 (in Chinese) [郝大鹏, 唐刚, 夏辉, 韩奎, 寻之朋 2011 60 038102]
[13] Katzav E, Edwards S F, Schwartz M 2006 Europhys. Lett. 75 29
[14] Yu J, Amar J G 2002 Phys. Rev. E 65 060601
[15] Silveira F A, Aar?ao Reis F D A 2007 Phys. Rev. E 75 061608
[16] Shim Y, Borovikov V, Amar J G 2008 Phys. Rev. B 77 235423
[17] Forgerini F L, Figueiredo W 2009 Phys. Rev. E 79 041602
[18] Yu J G, Amar J G 2002 Phys. Rev. E 66 021603
[19] Datta D P, Chini T K 2007 Phys. Rev. B 76 075323
[20] Kim J, Dohnalek Z, Kay B D 2005 Surface Science 586 137
[21] Asgharizadeh S, Sutton M 2009 Phys. Rev. B 79 125405
[22] Dolatshahi-Pirouz A, Hovgaard M B, Rechendorff K, Chevallier J, Foss M, Besenbacher F 2008 Phys. Rev. B 77 115427
[23] Rabbering FW, Stoian G, Gastel R V,Wormeester H, Poelsema B 2010 Phys. Rev. B 81 115425
[24] Shim Y, Amar J G 2007 Phys. Rev. Lett. 98 046103
[25] Shim Y, Mills M E, Borovikov V, Amar J G 2009 Phys. Rev. E 79 051604
[26] Hu B, Tang G 2002 Phys. Rev. E 66 026105
[27] Tang G, Ma B K 2002 Acta Phys. Sin. 51 994(in Chinese) [唐刚, 马本堃 2002 51 994]
[28] Tang G, Ma B K 2001 Acta Phys. Sin. 50 851 (in Chinese) [唐刚, 马本堃 2001 50 851]
[29] Hao D P, Tang G, Xia H, Chen H, Zhang L M, Xun Z P 2007 Acta Phys. Sin. 56 2018 (in Chinese) [郝大鹏, 唐刚, 夏辉, 陈华, 张雷明, 寻之朋 2007 56 2018]
[30] Pelliccione M, Lu T M 2008 Evolution of Thin Film Morphology (London: Springer-Verlag)
[31] Aar?ao Reis F D A 2001 Phys. Rev. E 63 056116
[32] Ramasco J J, L′opez J M, Rodr′?guez M A 2000 Phys. Rev. Lett. 84 2199
[33] L′opez J M, Castro M, Gallego R 2005 Phys. Rev. Lett. 94 166103
[34] Asgharizadeh S, Sutton M, Robbie K, Brown T 2009 Phys. Rev. B 79 125405
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