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不同成分等离子体鞘层的玻姆判据

赵晓云 刘金远 段萍 倪致祥

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不同成分等离子体鞘层的玻姆判据

赵晓云, 刘金远, 段萍, 倪致祥

The Bohm criterion of plasma sheath with different species

Ni Zhi-Xiang, Zhao Xiao-Yun, Duan Ping, Liu Jin-Yuan
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  • 在一维平板鞘层中采用流体模型分别研究了不同成分无碰撞等离子体鞘层的玻姆判据.通过拟牛顿法数值模拟了含有电子、离子、负离子以及二次电子的等离子体鞘层玻姆判据.结果表明二次电子发射增加了鞘层离子马赫数的临界值,且器壁发射二次电子温度越高,离子马赫数临界值越小.负离子使离子马赫数临界值减小.而在含有二次电子和负离子的等离子体鞘层中,当负离子较少时,二次电子发射对离子马赫数临界值影响较大;当负离子增加时,离子马赫数的临界值则主要受负离子的影响.
    A fluid model has been used to study the Bohm criterion of the plasma sheath with different species. The charge particle includes electrons, ions, negative ions and secondary electrons from the wall striked by the electrons. Numerical calculation results are obtained through quasi-Newton method. It is found that secondary electron emission(SEE) can increase the critical ion Mach number of the plasma sheath. The critical ion Mach number decreases with the increase of the temperature of the electrons emitted. Negative ions reduce this critical number. In addition, it is obvious that the SEE affects the ion Mach number when the density of negative ions is small, but the ion Mach number is mainly affected by negative ions when the density of negative ions is high in the presence of secondary electron emission and negative ions.
    • 基金项目: 国家自然科学基金(批准号:10875024,10975026),辽宁省教育厅高校科研基金(批准号:2009A047) 资助的课题.
    [1]

    Bohm 1949 The Characteristics of Electrical Discharges in Magnetic Fields edited by A. Guthrie and Wakerling (New York: McGraw-Hill) Chap.2

    [2]

    Severn G D 2007 Am. J. Phys. 75 92

    [3]

    Wang D Z, Ma T C 2000 Acta Phys. Sin. 49 2404 (in Chinese)[王德真、马腾才 2008 49 2404]

    [4]

    Chen F F 1974 Introduction to Plasma Physics (New York: Plenum) p156

    [5]

    Amemiya H 1990 Journal of Physics D:Applied Physics 23 999

    [6]

    Amemiya H, Annaratone B M, Allen J E 1998 J. Plasma Physics(UK) 60 81

    [7]

    Mahanta M K, Goswami K S 1999 Physics of Plasmas 6 4781

    [8]

    Keidar M, Boyd I D 2001 Physics of Plasmas 8 5315

    [9]

    Ahedo E, Parra F I 2005 Phys. plasmas 12 073503

    [10]

    Verheest F, Hellberg M A 1997 J. Plasma Phys. 57 465

    [11]

    Gu Y P, Ma T C 2003 Acta Phys. Sin. 52 1196 (in Chinese) [谷云鹏、马腾才 2003 52 1196]

    [12]

    Deutsch R, Rauchle E 1992 Phys. Rev. A 46 3442

    [13]

    Lieberman M A, Lichtenberg A J 1994 Principles of plasma discharges and materials processing (New York:Wiley) p167

    [14]

    Wang Z X, Liu J Y, Zou X, Liu Y, Wang X G 2003 Chin. Phys. Lett. 20 1537

    [15]

    Wang Z X, Liu Y, Ren L W, Liu J Y, Wang X G 2006 Thin Solid Films 506-507 637

    [16]

    Riemann K U 1995 IEEE Trans. Plasma Sci. 23 709

    [17]

    Wang Z X, Liu J Y, Zou X, Liu Y, Wang X G 2004 Acta Phys. Sin. 53 793 (in Chinese) [王正汹、刘金远、邹 秀、刘 悦、王晓钢 2004 53 793]

    [18]

    Lee D, Oksuz L, Hershkowitz N 2007 Appl. Phys. Lett. 91 041505

    [19]

    Yaroshenko V V, Verheest F, Thomas H M, Morfill G E 2009 New Jouranal of Physics 11 073013

    [20]

    Lin C, Lin M M 2009 Commun Nonlinear Sci Numer Simulat 14 2597

    [21]

    Wang D Y, Ma J X, Li Y R, Zhang W G 2009 Acta Phys. Sin. 58 8432 (in Chinese) [王道泳、马锦秀、李毅人、张文贵 2009 58 8432]

    [22]

    Zou X, Jin Y K, Zou B Y 2010 Acta Phys. Sin. 59 1902 (in Chinese)[邹 秀、籍延坤、邹滨雁 2010 59 1902]

    [23]

    Hobbs G D, Wesson J A 1967 Plasma Phys. 9 85

  • [1]

    Bohm 1949 The Characteristics of Electrical Discharges in Magnetic Fields edited by A. Guthrie and Wakerling (New York: McGraw-Hill) Chap.2

    [2]

    Severn G D 2007 Am. J. Phys. 75 92

    [3]

    Wang D Z, Ma T C 2000 Acta Phys. Sin. 49 2404 (in Chinese)[王德真、马腾才 2008 49 2404]

    [4]

    Chen F F 1974 Introduction to Plasma Physics (New York: Plenum) p156

    [5]

    Amemiya H 1990 Journal of Physics D:Applied Physics 23 999

    [6]

    Amemiya H, Annaratone B M, Allen J E 1998 J. Plasma Physics(UK) 60 81

    [7]

    Mahanta M K, Goswami K S 1999 Physics of Plasmas 6 4781

    [8]

    Keidar M, Boyd I D 2001 Physics of Plasmas 8 5315

    [9]

    Ahedo E, Parra F I 2005 Phys. plasmas 12 073503

    [10]

    Verheest F, Hellberg M A 1997 J. Plasma Phys. 57 465

    [11]

    Gu Y P, Ma T C 2003 Acta Phys. Sin. 52 1196 (in Chinese) [谷云鹏、马腾才 2003 52 1196]

    [12]

    Deutsch R, Rauchle E 1992 Phys. Rev. A 46 3442

    [13]

    Lieberman M A, Lichtenberg A J 1994 Principles of plasma discharges and materials processing (New York:Wiley) p167

    [14]

    Wang Z X, Liu J Y, Zou X, Liu Y, Wang X G 2003 Chin. Phys. Lett. 20 1537

    [15]

    Wang Z X, Liu Y, Ren L W, Liu J Y, Wang X G 2006 Thin Solid Films 506-507 637

    [16]

    Riemann K U 1995 IEEE Trans. Plasma Sci. 23 709

    [17]

    Wang Z X, Liu J Y, Zou X, Liu Y, Wang X G 2004 Acta Phys. Sin. 53 793 (in Chinese) [王正汹、刘金远、邹 秀、刘 悦、王晓钢 2004 53 793]

    [18]

    Lee D, Oksuz L, Hershkowitz N 2007 Appl. Phys. Lett. 91 041505

    [19]

    Yaroshenko V V, Verheest F, Thomas H M, Morfill G E 2009 New Jouranal of Physics 11 073013

    [20]

    Lin C, Lin M M 2009 Commun Nonlinear Sci Numer Simulat 14 2597

    [21]

    Wang D Y, Ma J X, Li Y R, Zhang W G 2009 Acta Phys. Sin. 58 8432 (in Chinese) [王道泳、马锦秀、李毅人、张文贵 2009 58 8432]

    [22]

    Zou X, Jin Y K, Zou B Y 2010 Acta Phys. Sin. 59 1902 (in Chinese)[邹 秀、籍延坤、邹滨雁 2010 59 1902]

    [23]

    Hobbs G D, Wesson J A 1967 Plasma Phys. 9 85

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出版历程
  • 收稿日期:  2010-04-27
  • 修回日期:  2010-06-18
  • 刊出日期:  2011-02-05

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