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Around the near-infrared wavelength at which optical fiber gyroscope works, the effects of 120 krad γ-irradiation on single-mode quartz fiber are studied experimentally from the following several aspects: return loss, polarization dependent loss, scattering loss, absorption loss, mode field distribution and guided-mode propagation constants. The gap defect energy level and its increment are estimated from near-infrared spectroscopy and stimulated raman scattering experiment. The medium density change is studied by x-ray diffraction. The photothermal effect of irradiated fiber with γ-ray is observed by a high sensitivity interference circuit. The test data show that the UV anneal has some repairing effect, revealing the possibility that UV annealing method can serve as a mannes of active reinforcement.
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Keywords:
- optoelectronics /
- Quartz fiber /
- optical fiber gyroscope /
- γ-irradiation damage
[1] Friebele E J, Gingerich M E, Griscom D L 1993 Proceeding of SPIE, vol. 1791 , Optical Materials Reliability and Testing: Benign and Adverse Environments, Boston, MA, USA, September 8—9, 1992 p177
[2] Williams G M, Putnam M A, Friebele E J 1996 Proceeding of SPIE, vol. 2811 , Photonics for Space Environments IV, Denver, CO, USA, August 6—7, 1996 p32
[3] Boucher R H, Woodward W F, Lomheim T S, Shima R M, Asman D J, Killian K M, LeGrand J, Goellner G J 1996 Opt. Eng. 35 955
[4] Toh K, Shikama T, Nagata S, Tsuchiya B, Yamauchi M, Nishitani T 2006 Meas. Sci. Technol. 17 955
[5] Brichard B, Borgermans P, Fernandez A, Lammens K, Decréton M 2001 IEEE Trans. NucI. Sci. 48 2069
[6] llenschel H, Khn O, Schmid H U 1992 IEEE RADECS 91:First European Conference on Radiation and its Effects on Devices and Systems, La Grande-Motte, France, September 9—12, 1991 p380
[7] Szafraniec B, Sanders G A 1999 J.Lig. Tech. 17 579
[8] Lu Y H, Zhong S X 2004 Optoelectronic Technology 24 68 (in Chinese)[陆永红、钟生新 2004 光电子技术 24 68]
[9] llenschel H, Khn O, Schmidt H U 1996 IEEE Trans. NucI. Sci. 43 1050
[10] Gao S J, Ouyang S X 2003 Acta Phys. Sin. 52 1292 (in Chinese)[高祀建、欧阳世翕 2003 52 1292]
[11] Jiang X W,Qiu J R,Zhu C S,Ouyang S X,Hirao K,Gan F X 2001 Acta Phys. Sin. 50 871 (in Chinese) [姜雄伟、邱建荣、朱从善、欧阳世翕、Hirao K、干福熹 2001 50 871]
[12] Xiao Z Y, Luo W Y 2007 Acta Phys. Sin. 56 2731 (in Chinese)[肖中银、罗文芸、王廷云 2007 56 2731]
[13] Weeks R A 1956 J. Appl. Phys. 27 1376
[14] Nagasawa H, Hoshi Y, Ohki Y 1987 Jpn. J. Appl. Phys. 26 554
[15] Imai H, Arai K 1988 Phys. Rev. B 38 12772
[16] Nishikawa H, Nakamura R, Tohmon R 1990 Phys. Rev. B 41 7828
[17] Rich T C, Pinnow D A 1972 Appl.Phys.Lett. 20 264
[18] Han Y L, Xiao W, Yi X S, Zhang Y C 2008 Infrared and Laser Engineering 37 128 (in Chinese)[韩艳玲、肖 文、伊小素、张运春 2008 红外与激光工程 37 128]
[19] Gan F X 2002 Infrared and Laser Engineering 21 64 (in Chinese)[干福熹 2002 红外与激光工程 21 64]
[20] He W, Li J Z, Mei J C 2005 Journal of Inorganic Materials 20 210 (in Chinese) [何 伟、李剑芝、梅家纯 2005 无机材料学报 20 210]
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[1] Friebele E J, Gingerich M E, Griscom D L 1993 Proceeding of SPIE, vol. 1791 , Optical Materials Reliability and Testing: Benign and Adverse Environments, Boston, MA, USA, September 8—9, 1992 p177
[2] Williams G M, Putnam M A, Friebele E J 1996 Proceeding of SPIE, vol. 2811 , Photonics for Space Environments IV, Denver, CO, USA, August 6—7, 1996 p32
[3] Boucher R H, Woodward W F, Lomheim T S, Shima R M, Asman D J, Killian K M, LeGrand J, Goellner G J 1996 Opt. Eng. 35 955
[4] Toh K, Shikama T, Nagata S, Tsuchiya B, Yamauchi M, Nishitani T 2006 Meas. Sci. Technol. 17 955
[5] Brichard B, Borgermans P, Fernandez A, Lammens K, Decréton M 2001 IEEE Trans. NucI. Sci. 48 2069
[6] llenschel H, Khn O, Schmid H U 1992 IEEE RADECS 91:First European Conference on Radiation and its Effects on Devices and Systems, La Grande-Motte, France, September 9—12, 1991 p380
[7] Szafraniec B, Sanders G A 1999 J.Lig. Tech. 17 579
[8] Lu Y H, Zhong S X 2004 Optoelectronic Technology 24 68 (in Chinese)[陆永红、钟生新 2004 光电子技术 24 68]
[9] llenschel H, Khn O, Schmidt H U 1996 IEEE Trans. NucI. Sci. 43 1050
[10] Gao S J, Ouyang S X 2003 Acta Phys. Sin. 52 1292 (in Chinese)[高祀建、欧阳世翕 2003 52 1292]
[11] Jiang X W,Qiu J R,Zhu C S,Ouyang S X,Hirao K,Gan F X 2001 Acta Phys. Sin. 50 871 (in Chinese) [姜雄伟、邱建荣、朱从善、欧阳世翕、Hirao K、干福熹 2001 50 871]
[12] Xiao Z Y, Luo W Y 2007 Acta Phys. Sin. 56 2731 (in Chinese)[肖中银、罗文芸、王廷云 2007 56 2731]
[13] Weeks R A 1956 J. Appl. Phys. 27 1376
[14] Nagasawa H, Hoshi Y, Ohki Y 1987 Jpn. J. Appl. Phys. 26 554
[15] Imai H, Arai K 1988 Phys. Rev. B 38 12772
[16] Nishikawa H, Nakamura R, Tohmon R 1990 Phys. Rev. B 41 7828
[17] Rich T C, Pinnow D A 1972 Appl.Phys.Lett. 20 264
[18] Han Y L, Xiao W, Yi X S, Zhang Y C 2008 Infrared and Laser Engineering 37 128 (in Chinese)[韩艳玲、肖 文、伊小素、张运春 2008 红外与激光工程 37 128]
[19] Gan F X 2002 Infrared and Laser Engineering 21 64 (in Chinese)[干福熹 2002 红外与激光工程 21 64]
[20] He W, Li J Z, Mei J C 2005 Journal of Inorganic Materials 20 210 (in Chinese) [何 伟、李剑芝、梅家纯 2005 无机材料学报 20 210]
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