LI Hongde, ZHANG Hong, JIAO Yang, LEI Zhifeng, YANG Weikun, LI Hui, LU Guoguang, ZHANG Zhangang. Characteristics and mechanisms of single event upset induced by atmospheric neutrons in charge trap 3D NAND flash memoryJ. Acta Physica Sinica, 2026, 75(3): 030817. DOI: 10.7498/aps.75.20251123