Detection of subsurface defects in silicon carbide bulk materials with photothermal radiometry

Liu Yuan-Feng; Li Bin-Cheng; Zhao Bin-Xing; Liu Hong

doi:10.7498/aps.72.20221303

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Liu Yuan-Feng, Li Bin-Cheng, Zhao Bin-Xing, Liu Hong. Detection of subsurface defects in silicon carbide bulk materials with photothermal radiometryJ. Acta Physica Sinica, 2023, 72(2): 024208. DOI: 10.7498/aps.72.20221303

Citation:

Liu Yuan-Feng, Li Bin-Cheng, Zhao Bin-Xing, Liu Hong. Detection of subsurface defects in silicon carbide bulk materials with photothermal radiometryJ. Acta Physica Sinica, 2023, 72(2): 024208. DOI: 10.7498/aps.72.20221303

Citation:

Liu Yuan-Feng, Li Bin-Cheng, Zhao Bin-Xing, Liu Hong. Detection of subsurface defects in silicon carbide bulk materials with photothermal radiometryJ. Acta Physica Sinica, 2023, 72(2): 024208. DOI: 10.7498/aps.72.20221303