Simulation research on single event effect of N-well resistor

Ju An-An; Guo Hong-Xia; Zhang Feng-Qi; Liu Ye; Zhong Xiang-Li; Ouyang Xiao-Ping; Ding Li-Li; Lu Chao; Zhang Hong; Feng Ya-Hui

doi:10.7498/aps.72.20220125

Search

x

Ju An-An, Guo Hong-Xia, Zhang Feng-Qi, Liu Ye, Zhong Xiang-Li, Ouyang Xiao-Ping, Ding Li-Li, Lu Chao, Zhang Hong, Feng Ya-Hui. Simulation research on single event effect of N-well resistorJ. Acta Physica Sinica, 2023, 72(2): 026102. DOI: 10.7498/aps.72.20220125

Citation:

Ju An-An, Guo Hong-Xia, Zhang Feng-Qi, Liu Ye, Zhong Xiang-Li, Ouyang Xiao-Ping, Ding Li-Li, Lu Chao, Zhang Hong, Feng Ya-Hui. Simulation research on single event effect of N-well resistorJ. Acta Physica Sinica, 2023, 72(2): 026102. DOI: 10.7498/aps.72.20220125

Citation:

Ju An-An, Guo Hong-Xia, Zhang Feng-Qi, Liu Ye, Zhong Xiang-Li, Ouyang Xiao-Ping, Ding Li-Li, Lu Chao, Zhang Hong, Feng Ya-Hui. Simulation research on single event effect of N-well resistorJ. Acta Physica Sinica, 2023, 72(2): 026102. DOI: 10.7498/aps.72.20220125