Ultrasonic detection of white etching defect based on convolution neural network

Zhu Qi; Xu Duo; Zhang Yuan-Jun; Li Yu-Juan; Wang Wen; Zhang Hai-Yan

doi:10.7498/aps.71.20221504

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Zhu Qi, Xu Duo, Zhang Yuan-Jun, Li Yu-Juan, Wang Wen, Zhang Hai-Yan. Ultrasonic detection of white etching defect based on convolution neural networkJ. Acta Physica Sinica, 2022, 71(24): 244301. DOI: 10.7498/aps.71.20221504

Citation:

Zhu Qi, Xu Duo, Zhang Yuan-Jun, Li Yu-Juan, Wang Wen, Zhang Hai-Yan. Ultrasonic detection of white etching defect based on convolution neural networkJ. Acta Physica Sinica, 2022, 71(24): 244301. DOI: 10.7498/aps.71.20221504

Citation:

Zhu Qi, Xu Duo, Zhang Yuan-Jun, Li Yu-Juan, Wang Wen, Zhang Hai-Yan. Ultrasonic detection of white etching defect based on convolution neural networkJ. Acta Physica Sinica, 2022, 71(24): 244301. DOI: 10.7498/aps.71.20221504