Robustness of integrated gate commutated thyristor in switching self-clamping mode

YANG Wuhua; SHEN Sihao; JIA Liping; ZHANG Chao; ZHANG Ruliang; WANG Cailin

doi:10.7498/aps.74.20250120

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YANG Wuhua, SHEN Sihao, JIA Liping, ZHANG Chao, ZHANG Ruliang, WANG Cailin. Robustness of integrated gate commutated thyristor in switching self-clamping modeJ. Acta Physica Sinica, 2025, 74(11): 118501. DOI: 10.7498/aps.74.20250120

Citation:

YANG Wuhua, SHEN Sihao, JIA Liping, ZHANG Chao, ZHANG Ruliang, WANG Cailin. Robustness of integrated gate commutated thyristor in switching self-clamping modeJ. Acta Physica Sinica, 2025, 74(11): 118501. DOI: 10.7498/aps.74.20250120

Citation:

YANG Wuhua, SHEN Sihao, JIA Liping, ZHANG Chao, ZHANG Ruliang, WANG Cailin. Robustness of integrated gate commutated thyristor in switching self-clamping modeJ. Acta Physica Sinica, 2025, 74(11): 118501. DOI: 10.7498/aps.74.20250120