Wang Song-Wen, Guo Hong-Xia, Ma Teng, Lei Zhi-Feng, Ma Wu-Ying, Zhong Xiang-Li, Zhang Hong, Lu Xiao-Jie, Li Ji-Fang, Fang Jun-Lin, Zeng Tian-Xiang. Electrical stress reliability of graphene field effect transistor under different bias voltagesJ. Acta Physica Sinica, 2024, 73(23): 238501. DOI: 10.7498/aps.73.20241365