Structure of GexGa8S92–x glasses studied by high-resolution X-ray photoelectron spectroscopy and Raman scattering

Xu Si-Wei; Wang Xun-Si; Shen Xiang

doi:10.7498/aps.72.20221653

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Xu Si-Wei, Wang Xun-Si, Shen Xiang. Structure of GexGa8S92–x glasses studied by high-resolution X-ray photoelectron spectroscopy and Raman scatteringJ. Acta Physica Sinica, 2023, 72(1): 017101. DOI: 10.7498/aps.72.20221653

Citation:

Xu Si-Wei, Wang Xun-Si, Shen Xiang. Structure of GexGa8S92–x glasses studied by high-resolution X-ray photoelectron spectroscopy and Raman scatteringJ. Acta Physica Sinica, 2023, 72(1): 017101. DOI: 10.7498/aps.72.20221653

Citation:

Xu Si-Wei, Wang Xun-Si, Shen Xiang. Structure of GexGa8S92–x glasses studied by high-resolution X-ray photoelectron spectroscopy and Raman scatteringJ. Acta Physica Sinica, 2023, 72(1): 017101. DOI: 10.7498/aps.72.20221653