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中国物理学会期刊
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Guo Wen-Hao, Xiao Hui, Men Chuan-Ling. Effects of protons within SiO2 solid-state electrolyte on performances of oxide electric-double-layer thin film transistorJ. Acta Physica Sinica, 2015, 64(7): 077302. DOI: 10.7498/aps.64.077302
Citation: Guo Wen-Hao, Xiao Hui, Men Chuan-Ling. Effects of protons within SiO2 solid-state electrolyte on performances of oxide electric-double-layer thin film transistorJ. Acta Physica Sinica, 2015, 64(7): 077302. DOI: 10.7498/aps.64.077302
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Effects of protons within SiO2 solid-state electrolyte on performances of oxide electric-double-layer thin film transistor

Acta Phys. Sin., 2015, 64(7): 077302.
DOI: 10.7498/aps.64.077302
CSTR: 32037.14.aps.64.077302
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